scholarly journals High-resolution microdiffraction study of notch-tip deformation in Mo single crystals using x-ray synchrotron radiation

1989 ◽  
Author(s):  
G. Ice ◽  
A. Habenschuss ◽  
J.C. Bilello ◽  
R. Rebonato
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Single Crystals ◽  
X Ray ◽  
Notch Tip

scholarly journals High-resolution microdiffraction study of notch-tip deformation in Mo single crystals using X-ray synchrotron radiation

1989 ◽  
Vol 60 (5) ◽  
pp. 571-583 ◽  
Author(s):  
R. Rebonato ◽  
G. E. Ice ◽  
A. Habenschuss ◽  
J. C. Bilello
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Single Crystals ◽  
X Ray ◽  
Notch Tip

Applications of High-Resolution Powder X-Ray Diffraction

2007 ◽  
Vol 130 ◽  
pp. 7-14 ◽  
Author(s):  
Andrew N. Fitch
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Powder Diffraction ◽  
X Rays ◽  
X Ray Diffraction ◽  
Crystalline Materials ◽  
X Ray ◽  
Structural Characterisation ◽  
Pdf Analysis

The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.

X-ray topo-tomography studies of linear dislocations in silicon single crystals

2018 ◽  
Vol 51 (6) ◽  
pp. 1616-1622 ◽  
Author(s):  
Victor Asadchikov ◽  
Alexey Buzmakov ◽  
Felix Chukhovskii ◽  
Irina Dyachkova ◽  
Denis Zolotov ◽  
...  
Keyword(s):  
Numerical Analysis ◽  
High Resolution ◽  
Single Crystals ◽  
Complete Characterization ◽  
Reconstruction Technique ◽  
Algebraic Reconstruction Technique ◽  
X Ray ◽  
Laboratory Setup ◽  
Simultaneous Algebraic Reconstruction Technique

This article describes complete characterization of the polygonal dislocation half-loops (PDHLs) introduced by scratching and subsequent bending of an Si(111) crystal. The study is based on the X-ray topo-tomography technique using both a conventional laboratory setup and the high-resolution X-ray image-detecting systems at the synchrotron facilities at KIT (Germany) and ESRF (France). Numerical analysis of PDHL images is performed using the Takagi–Taupin equations and the simultaneous algebraic reconstruction technique (SART) tomographic algorithm.

High Resolution Monochromatic X-Ray Tomography Using Synchrotron Radiation

1989 ◽  
Vol 28 (Part 1, No. 2) ◽  
pp. 263-266 ◽  
Author(s):  
Tatsumi Hirano ◽  
Katsuhisa Usami
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
X Ray

High resolution hard X-ray photoemission using synchrotron radiation as an essential tool for characterization of thin solid films

2006 ◽  
Vol 252 (15) ◽  
pp. 5602-5606 ◽  
Author(s):  
J.J. Kim ◽  
E. Ikenaga ◽  
M. Kobata ◽  
A. Takeuchi ◽  
M. Awaji ◽  
...  
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Thin Solid Films ◽  
X Ray ◽  
Solid Films ◽  
Essential Tool

Basal plane bending of 4H-SiC single crystals grown by sublimation method with different seed attachment methods

CrystEngComm ◽  
2018 ◽  
Vol 20 (43) ◽  
pp. 6957-6962 ◽  
Author(s):  
Xianglong Yang ◽  
Jinying Yu ◽  
Xiufang Chen ◽  
Yan Peng ◽  
Xiaobo Hu ◽  
...  
Keyword(s):  
High Resolution ◽  
Single Crystals ◽  
Basal Plane ◽  
X Ray ◽  
Sublimation Method ◽  
Plane Bending

Basal plane bending of 4H-SiC single crystals grown using the sublimation method on an open or closed backside seed was measured using high-resolution X-ray diffractometry.

A high-resolution Weissenberg camera for X-ray synchrotron radiation

1990 ◽  
Vol 23 (5) ◽  
pp. 351-354
Author(s):  
D. Hohlwein ◽  
J. D. Axe
Keyword(s):  
Phase Transformation ◽  
High Resolution ◽  
Synchrotron Radiation ◽  
Reciprocal Space ◽  
Experimental Results ◽  
Germanium Crystal ◽  
Synchrotron Source ◽  
X Ray ◽  
High Resolution Mapping ◽  
Resolution Mapping

A photographic Weissenberg camera has been constructed which can be mounted on the 2θ arm of a four-circle diffractometer. At a distance of 0.5 m from the sample the 2θ resolution for a 100 μm crystal is 0.2 mrad (0.01°), allowing a high-resolution mapping of reciprocal space at a synchrotron source in an efficient way. As sample experimental results, a study is presented of the streak system around the 111 reflection of a perfect germanium crystal and the detection of a minute phase transformation in a single-powder grain of a high-Tc superconductor.

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