scholarly journals Single-electron tunneling. [Microwave scanning tunneling microscope]

1993 ◽  
Author(s):  
S.T. Ruggiero
1992 ◽  
Vol 06 (05) ◽  
pp. 273-280 ◽  
Author(s):  
M.D. REEVE ◽  
O.G. SYMKO ◽  
R. LI

Tunneling studies between a Scanning Tunneling Microscope (STM)-controlled fine NbN tip and a NbN thin film show single electron tunneling characteristics at room temperature. The I-V curves display the Coulomb blockade and the Coulomb staircase caused by single electron charging of a series combination of two tunnel junctions. These room temperature observations indicate that it may be possible to operate single-electron-based devices in non-cryogenic regimes.


1997 ◽  
Vol 386 (1-3) ◽  
pp. 311-314 ◽  
Author(s):  
Zhanghua Wu ◽  
Tomonobu Nakayama ◽  
Makoto Sakurai ◽  
Masakazu Aono

2010 ◽  
Vol 2010 ◽  
pp. 1-5
Author(s):  
F. Santandrea

We study the dynamics of transverse oscillations of a suspended carbon nanotube into which electron current is injected from the tip of a scanning tunneling microscope (STM). In this case the correlations between the displacement of the nanotube and its charge state, determined by the position-dependent electron tunneling rate, can lead to a “shuttle-like” instability for the transverse vibrational modes. We find that selective excitation of a specific mode can be achieved by an accurate positioning of the STM tip. This result suggests a feasible way to control the dynamics of this nano-electromechanical system (NEMS) based on the “shuttle instability.”


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