scholarly journals Особенности двумерных бифуркаций при диссипативном туннелировании электронов в массивах Au наночастиц

2020 ◽  
Vol 90 (11) ◽  
pp. 1797
Author(s):  
M.Б. Семенов ◽  
В.Д. Кревчик ◽  
Д.O. Филатов ◽  
A.В. Шорохов ◽  
A.П. Шкуринов ◽  
...  

Abstract. In framework of the 2D - dissipative tunneling theory in approximation of a rarefied gas of the «instanton - antiinstanton pairs» at a finite temperature under the conditions of an external electric field, the features of tunneling transport for planar structures with quantum dots (QDs) from colloidal gold, that have metamaterial properties, have been studied. It was experimentally shown that, depending on the positioning of the cantilever needle of a combined atomic force and scanning tunneling microscope (AFM / STM), either above a single quantum dot or between two neighboring quantum dots, either a single or double effect of 2D tunneling bifurcations have been observed, respectively. It is such a double bifurcation regime, as our theoretical model has shown, that is associated with the manifestation of the metamaterial properties by the structure under study. A convincing qualitative agreement between the experimental I – V characteristics and the field dependence of the 2D - dissipative tunneling probability in the two studied modes, taking into account the observed quantum beats in the vicinity of the 2D bifurcation points, has been obtained.

Author(s):  
Jean-Paul Revel

The last few years have been marked by a series of remarkable developments in microscopy. Perhaps the most amazing of these is the growth of microscopies which use devices where the place of the lens has been taken by probes, which record information about the sample and display it in a spatial from the point of view of the context. From the point of view of the biologist one of the most promising of these microscopies without lenses is the scanned force microscope, aka atomic force microscope.This instrument was invented by Binnig, Quate and Gerber and is a close relative of the scanning tunneling microscope. Today's AFMs consist of a cantilever which bears a sharp point at its end. Often this is a silicon nitride pyramid, but there are many variations, the object of which is to make the tip sharper. A laser beam is directed at the back of the cantilever and is reflected into a split, or quadrant photodiode.


2004 ◽  
Vol 85 (12) ◽  
pp. 2355-2357 ◽  
Author(s):  
H. Z. Song ◽  
M. Kawabe ◽  
Y. Okada ◽  
R. Yoshizaki ◽  
T. Usuki ◽  
...  

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