Electrical Characterization of Low-Temperature Boron on Silicon Deposition utilizing Molecular Beam Epitaxy
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1991 ◽
pp. 669-674
2013 ◽
Vol 25
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pp. 1523-1526
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1999 ◽
Vol 17
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pp. 1307-1312
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1997 ◽
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pp. 499-503
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