Fabrication and electrical characterization of ultra thin epitaxial γ-Al/sub 2/O/sub 3/ gate dielectric films on Si[100] by molecular beam epitaxy (MBE)
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2002 ◽
Vol 41
(Part 2, No. 12B)
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pp. L1474-L1477
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2006 ◽
Vol 17
(9)
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pp. 685-688
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1991 ◽
pp. 669-674
1999 ◽
Vol 17
(4)
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pp. 1307-1312
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