The Properties of (Pb0.97Ba0.03)[(Zr0.98Ti0.02)1-zSnz]O3 Ceramics with 0 < z < 0.08

Abstract We present the results of obtaining and investigations of (Pb1-x Bax )((Zr1-yTiy) 1-zSnz )O3 (PBZTS) ceramics with x =const =0.03, y =const=0.02, z =0, 0.02, 0.04, 0.06 and 0.08. Investigated compositions are close to rhombohedral-orthorhombic morphotropic phase boundary. Ceramic samples have been obtained by conventional ceramic technology from oxides PbO, ZrO2, TiO2, SnO2 and barium carbonate BaCO3. The calcined powders were crushed and next pressed into discs and sintered free sintering (FS) method. For such obtained samples the following investigations have been done: EDS, XRD, microstructure of fractured samples, dielectric measurements, /’-/^hysteresis loops investigations at various temperatures.

Download Full-text

Technology and Electrophysical Properties of Multiferroic PZT–PFT Ceramics

Archives of Metallurgy and Materials ◽

10.2478/amm-2013-0175 ◽

2013 ◽

Vol 58 (4) ◽

pp. 1361-1364 ◽

Cited By ~ 1

Author(s):

P. Niemiec ◽

R. Skulski ◽

D. Bochenek ◽

P. Wawrzała

Keyword(s):

Dielectric Permittivity ◽

Room Temperature ◽

Ferroelectric Phase ◽

Hysteresis Loops ◽

Wide Distribution ◽

Ceramic Technology ◽

Dielectric Losses ◽

Dielectric Measurements ◽

Ceramic Samples ◽

The Mean

Abstract We present the results of obtaining and investigating ceramic samples of solid solution (1-x)(PbZr0.53Ti0.47O3)- x(PbFe0.5Ta0.5O3) [i.e. (1-x)PZT-xPFT] with x =0.25, 0.35 and 0.45 obtained using conventional ceramic technology. These materials belong to class of materials known as multiferroics. Solid solutions PZT-PFT are the lowest-loss room-temperature multiferroics known, and as a result there are very interesting for magnetoelectric devices. Paper presents the results of termogravimetric investigations, EDS, XRD and main dielectric measurements. It has been stated that with increasing content of PFT decreases the mean diameter of grains and more wide distribution of grain diameters is observed. For x =0.25 sharp phase transition from ferroelectric phase to paraelectric one is observed and high values of dielectric permittivity. Composition PZT-PFT with x =0.45 has the lowest values of dielectric permittivity, and the transition is more diffused. The increase of x leads also to the shift of the temperature of maximum of dielectric permittivity towards lower temperatures. Samples with x =0.25 and x =0.35 exhibit very low values of dielectric losses up to about 100°C. Dielectric losses for samples with x =0.45 are higher. For obtained PZT-PFT samples we have investigated P-E hysteresis loops at room temperature for frequency 1 Hz. For composition x =0.25 it after application the field about 2.5 kV/mm polarization is equal approximately 28 μC/cm2, while for x =0.35, and x =0.45 after application the field about 2.0 kV/mm the polarizations are equal about 25 μC/cm2 and 20 μC/cm2 respectively. Very low values of losses and high values of polarization lead to the conclusion that interesting material PZT-PFT for applications should be composition with x =0.25.

Download Full-text

Technology and Properties of (1-x)PZT-(x)PFW Ceramics with 0.25

Key Engineering Materials ◽

10.4028/www.scientific.net/kem.605.424 ◽

2014 ◽

Vol 605 ◽

pp. 424-427 ◽

Cited By ~ 2

Author(s):

Ryszard Skulski ◽

Ewa Nogas-Cwikiel ◽

Dariusz Bochenek ◽

Przemysław Niemiec ◽

Paweł Wawrzała

Keyword(s):

Solid Solution ◽

Dielectric Properties ◽

Room Temperature ◽

Hysteresis Loops ◽

Ceramic Technology ◽

Ceramic Samples

We present the results of obtaining and investigating ceramic samples of solid solution (1-x)(PbZr0.53Ti0.47O3)-x (PbFe2/3W1/3O3) [i.e. (1-x)PZT-xPFW] with x = 0.25, 0.35, 0.45 and 0.55 obtained from oxides using conventional ceramic technology. In this paper we present the results of investigations of XRD and main dielectric properties. For x = 0.25 and x = 0.35 we investigated also P-E hysteresis loops at room temperature.

Download Full-text

Structure and Physical Properties of PZT-PMnN-PSN Ceramics Near the Morphological Phase Boundary

Advances in Materials Science and Engineering ◽

10.1155/2014/821404 ◽

2014 ◽

Vol 2014 ◽

pp. 1-8 ◽

Cited By ~ 4

Author(s):

Nguyen Dinh Tung Luan ◽

Le Dai Vuong ◽

Truong Van Chuong ◽

Nguyen Truong Tho

Keyword(s):

Physical Properties ◽

Phase Boundary ◽

Morphotropic Phase Boundary ◽

Coercive Field ◽

Phase Structure ◽

Remanent Polarization ◽

Perovskite Phase ◽

Electromechanical Properties ◽

Ceramic Samples ◽

Pure Perovskite Phase

The 0.9Pb(ZrxTi1−x)O3-0.07Pb(Mn1/3Nb2/3)O3-0.03Pb(Sb1/2Nb1/2)O3(PZT-PMnN-PSN) ceramics were prepared by columbite method. The phase structure of the ceramic samples was analyzed. Results show that the pure perovskite phase is in all ceramics specimens. The effect of the Zr/Ti ratio on the region of morphotropic phase boundary for PZT-PMnN-PSN ceramics was studied. Experimental results show that the phase structure of ceramics changes from tetragonal to rhombohedral with the increase of the content of Zr/Ti ratio in the system. The composition of PZT-PMnN-PSN ceramics near the morphotropic phase boundary obtained is the ratio of Zr/Ti: 49/51. At this ratio, the ceramic has the optimal electromechanical properties: thekp=0.61, theεmax=29520, thed31=-236 pC/N, theQm=2400, high remanent polarization (Pr=49.2 μC·cm−2), and low coercive fieldEc=10.28 kV·cm−1.

Download Full-text

Dielectric properties anomaly of (1−x)Pb(Ni1/3Nb2/3)O3−xPbTiO3 ceramics near the morphotropic phase boundary

Journal of Materials Research ◽

10.1557/jmr.2001.0100 ◽

2001 ◽

Vol 16 (3) ◽

pp. 834-836 ◽

Cited By ~ 22

Author(s):

Zhenrong Li ◽

Liangying Zhang ◽

Xi Yao

Keyword(s):

Dielectric Properties ◽

Phase Boundary ◽

Morphotropic Phase Boundary ◽

Composition Range ◽

The Other ◽

Dielectric Measurements ◽

X Ray Diffraction ◽

Structure Defects ◽

X Ray ◽

Dielectric Peak

Dielectric properties and the phase compositions of (1−x)Pb(Ni1/3Nb2/3)O3−xPbTiO3 ceramics were investigated. A morphotropic phase boundary (MPB) in the system between pseudocubic and tetragonal phase regions has been identified to lie in the composition range x = 0.34–0.38 by means of x-ray diffraction and dielectric measurements. The samples of composition lying near the MPB have good dielectric properties, but at the same time, exhibit two dielectric peaks. The possible reasons for the occurrence of dielectric bipeaks are discussed. One dielectric peak is phase transition peak, and the other peak lying in 130–150 °C temperature range is suggested to result from structure defects in the ceramics.

Download Full-text

Dielectric, ferroelectric, and piezoelectric properties of (001) BiScO3–PbTiO3 epitaxial films near the morphotropic phase boundary

Journal of Materials Research ◽

10.1557/jmr.2004.19.2.568 ◽

2004 ◽

Vol 19 (2) ◽

pp. 568-572 ◽

Cited By ~ 30

Author(s):

Juan C. Nino ◽

Susan Trolier-McKinstry

Keyword(s):

Dielectric Constant ◽

Phase Boundary ◽

Morphotropic Phase Boundary ◽

Piezoelectric Properties ◽

Hysteresis Loops ◽

Epitaxial Films ◽

Device Development ◽

Maximum Dielectric Constant ◽

Room Temperature Dielectric Constant ◽

Ferroelectric And Piezoelectric Properties

The dielectric, ferroelectric, and piezoelectric properties of (001) BiScO3–PbTiO3 epitaxial films near the morphotropic phase boundary were investigated. Epitaxial films, 1-μm thick, were grown on (100) SrRuO3/(100) LaAlO3 substrates by pulsed laser deposition from a BiScO3–PbTiO3 (40/60) ceramic target. The films had room temperature dielectric constant of 850, tanδ = 0.08, and maximum dielectric constant of 5530 at 455 °C. Well-saturated hysteresis loops with a remanent polarization of 42 μC/cm2 and a coercive field of 75 kV/cm were observed. The effective transverse piezoelectric coefficient e31,f was −12 C/m2. This result is quite encouraging for sensor and actuator device development because the observed piezoelectric properties are as good as (001) oriented Pb(Zr,Ti)O3 films (e31,f ∼ –12 C/m2) while the transition temperature is 100 °C higher.

Download Full-text