The reason analysis of the resistance degradation of steel gates components

2015 ◽  
Author(s):  
Jiangchuan Liu ◽  
Zhenghui Liu ◽  
Wei Ji
Keyword(s):  
Resistance Degradation

scholarly journals Mechanism Analysis of Dynamic On-State Resistance Degradation for a Commercial GaN HEMT Using Double Pulse Test

Electronics ◽  
2021 ◽  
Vol 10 (10) ◽  
pp. 1202
Author(s):  
Wei Wang ◽  
Yan Liang ◽  
Minghui Zhang ◽  
Fang Lin ◽  
Feng Wen ◽  
...  
Keyword(s):  
Gradual Increase ◽  
Dynamic Resistance ◽  
Mechanism Analysis ◽  
Pulse Test ◽  
Gan Hemt ◽  
Resistance Degradation ◽  
Dielectric Model ◽  
Leaky Dielectric Model ◽  
State Resistance ◽  
Stress Voltage

The dynamic on-resistance (RON) behavior of one commercial GaN HEMT device with p-GaN gate is investigated under hard-switching conditions. The non-monotonic performance of dynamic RON with off-state voltage ranging from 50 to 400 V is ascribed to the “leaky dielectric” model. The highest normalized RON value of 1.22 appears at 150 and 200 V. The gradual increase and following maximum of dynamic RON are found when the device is exposed to a stress voltage for an extended stress time under 100 and 200 V, which is due to a much longer trapping time compared to detrapping time related to deep acceptors and donors. No obvious RON degradation, thanks to the suppressed trapping effect, is observed at higher VDS. From the multi-pulse test, the dynamic RON is seen to be insensitive to the frequency. It is demonstrated that the leakage, especially under source and drain contact, is a key issue in the dynamic resistance degradation.

Mechanism and Modeling of On-Resistance Degradation in n-Type Lateral Diffused Metal–Oxide–Semiconductor Transistors

2009 ◽  
Vol 48 (4) ◽  
pp. 04C040
Author(s):  
Jone F. Chen ◽  
Kuen-Shiuan Tian ◽  
Shiang-Yu Chen ◽  
Kuo-Ming Wu ◽  
C. M. Liu
Keyword(s):  
Metal Oxide ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Resistance Degradation

scholarly journals Behavior of Partially Grouted Concrete Masonry Walls under Quasi-Static Cyclic Lateral Loading

Materials ◽  
2020 ◽  
Vol 13 (10) ◽  
pp. 2424
Author(s):  
Sebastián Calderón ◽  
Laura Vargas ◽  
Cristián Sandoval ◽  
Gerardo Araya-Letelier
Keyword(s):  
Shear Strength ◽  
Aspect Ratio ◽  
Load Capacity ◽  
Masonry Walls ◽  
Lateral Stiffness ◽  
Edge Elements ◽  
Vertical Reinforcement ◽  
Concrete Masonry ◽  
Resistance Degradation ◽  
Concrete Masonry Walls

Eight partially grouted (PG-RM) concrete masonry walls were tested to study the influence of the strength and width of blocks, the wall aspect ratio, the horizontal and vertical reinforcement ratio, and the presence of edge elements (flanges). The results were analyzed in terms of the failure mode, damage progression, shear strength, lateral stiffness degradation, equivalent viscous damping ratio, and displacement ductility. Additionally, the performances of some existing shear expressions were analyzed by comparing the measured and predicted lateral load capacity of the tested walls. Based on the results, a slight increment in the lateral stiffness was achieved when employing stronger blocks, while the shear strength remained constant. Besides, increasing the width of concrete blocks did not have a significant effect on the shear strength nor in the initial tangential stiffness, but it generated a softer post-peak strength degradation. Increasing the wall aspect ratio reduced the brittleness of the response and the shear strength. Reducing the amount of vertical reinforcement lowered the resulting shear strength, although it also slowed down the post-peak resistance degradation. Transversal edge elements provided integrity to the wall response, generated softer resistance degradation, and improved the symmetry of the response, but they did not raise the lateral resistance.

scholarly journals Modification of the Schottky barrier height at the RuO2 cathode during resistance degradation of Fe-doped SrTiO3

2017 ◽  
Vol 100 (10) ◽  
pp. 4590-4601 ◽  
Author(s):  
Ruth Giesecke ◽  
Ramis Hertwig ◽  
Thorsten J. M. Bayer ◽  
Clive A. Randall ◽  
Andreas Klein
Keyword(s):  
Schottky Barrier ◽  
Barrier Height ◽  
Schottky Barrier Height ◽  
Resistance Degradation
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