Highly Fluorescent Au25-xAgx Nanoclusters Protected with Poly(ethylene glycol) - and Zwitterion-Modified Thiolate Ligands

2018 ◽  
Author(s):  
Dinesh Mishra ◽  
Sisi Wang ◽  
Zhicheng Jin ◽  
Eric Lochner ◽  
Hedi Mattoussi
Keyword(s):  
Quantum Yield ◽  
Near Infrared ◽  
Small Diameter ◽  
Binding Energies ◽  
Thiolate Ligands ◽  
Nir Emission ◽  
Thiolate Complexes ◽  
Long Lifetime ◽  
Poly Ethylene

<p>We describe the growth and characterization of highly fluorescing, near-infrared-emitting nanoclusters made of bimetallic Au<sub>25-x</sub>Ag<sub>x</sub> cores, prepared using various monothiol-appended hydrophobic and hydrophilic ligands. The reaction uses well-defined triphenylphosphine-protected Au<sub>11</sub> clusters (as precursors), which are reacted with Ag(I)-thiolate complexes. The prepared nanoclusters are small (diameter < 2nm, as characterized by TEM) with emission peak at 760 nm and long lifetime (~12 µs). The quantum yield measured for these materials was 0.3 - 0.4 depending on the ligand. XPS measurements show the presence of both metal atoms in the core, with measured binding energies that agree with reported values for nanocluster materials. The NIR emission combined with high quantum yield, small size and ease of surface functionalization afforded by the coating, make these materials suitable to implement investigations that address fundamental questions and potentially useful for biological sensing and imaging applications.<br></p>

Highly Fluorescent Au25-xAgx Nanoclusters Protected with Poly(ethylene glycol) - and Zwitterion-Modified Thiolate Ligands

2018 ◽  
Author(s):  
Dinesh Mishra ◽  
Sisi Wang ◽  
Zhicheng Jin ◽  
Eric Lochner ◽  
Hedi Mattoussi
Keyword(s):  
Quantum Yield ◽  
Near Infrared ◽  
Small Diameter ◽  
Binding Energies ◽  
Thiolate Ligands ◽  
Nir Emission ◽  
Thiolate Complexes ◽  
Long Lifetime ◽  
Poly Ethylene

<p>We describe the growth and characterization of highly fluorescing, near-infrared-emitting nanoclusters made of bimetallic Au<sub>25-x</sub>Ag<sub>x</sub> cores, prepared using various monothiol-appended hydrophobic and hydrophilic ligands. The reaction uses well-defined triphenylphosphine-protected Au<sub>11</sub> clusters (as precursors), which are reacted with Ag(I)-thiolate complexes. The prepared nanoclusters are small (diameter < 2nm, as characterized by TEM) with emission peak at 760 nm and long lifetime (~12 µs). The quantum yield measured for these materials was 0.3 - 0.4 depending on the ligand. XPS measurements show the presence of both metal atoms in the core, with measured binding energies that agree with reported values for nanocluster materials. The NIR emission combined with high quantum yield, small size and ease of surface functionalization afforded by the coating, make these materials suitable to implement investigations that address fundamental questions and potentially useful for biological sensing and imaging applications.<br></p>

scholarly journals Highly fluorescent hybrid Au/Ag nanoclusters stabilized with poly(ethylene glycol)- and zwitterion-modified thiolate ligands

2019 ◽  
Vol 21 (38) ◽  
pp. 21317-21328 ◽  
Author(s):  
Dinesh Mishra ◽  
Sisi Wang ◽  
Zhicheng Jin ◽  
Yan Xin ◽  
Eric Lochner ◽  
...  
Keyword(s):  
Ethylene Glycol ◽  
Near Infrared ◽  
Poly Ethylene Glycol ◽  
Thiolate Ligands ◽  
Ag Nanoclusters ◽  
Poly Ethylene

We report the growth, via core transformation, of highly fluorescing, near-infrared-emitting bimetallic Au/Ag nanoclusters, which are capped with hydrophobic or hydrophilic monothiol-terminated ligands.

scholarly journals Detection and characterization of two VLM binaries: LP 1033-31 and LP 877-72

2020 ◽  
Vol 498 (1) ◽  
pp. 737-749
Author(s):  
Subhajeet Karmakar ◽  
A S Rajpurohit ◽  
F Allard ◽  
D Homeier
Keyword(s):  
Adaptive Optics ◽  
Spectral Type ◽  
Near Infrared ◽  
Binding Energies ◽  
Secondary Component ◽  
Large Telescope ◽  
Very Large Telescope ◽  
Adaptive Optics Imaging ◽  
M Dwarf

ABSTRACT Using the high-resolution near-infrared adaptive optics imaging from the NaCo instrument at the Very Large Telescope, we report the discovery of a new binary companion to the M-dwarf LP 1033-31 and also confirm the binarity of LP 877-72. We have characterized both the stellar systems and estimated the properties of their individual components. We have found that LP 1033-31 AB with the spectral type of M4.5+M4.5 has a projected separation of 6.7 ± 1.3 AU. Whereas with the spectral type of M1+M4, the projected separation of LP 877-72 AB is estimated to be 45.8 ± 0.3 AU. The binary companions of LP 1033-31 AB are found to have similar masses, radii, effective temperatures, and log g with the estimated values of 0.20 ± 0.04 $\rm {M}_{\odot }$, 0.22 ± 0.03 $\rm {R}_{\odot }$, and 3200 K, 5.06 ± 0.04. However, the primary of LP 877-72 AB is found to be twice as massive as the secondary with the derived mass of 0.520 ± 0.006 $\rm {M}_{\odot }$. The radius and log g for the primary of LP 877-72 AB are found to be 1.8 and 0.95 times that of the secondary component with the estimated values of 0.492 ± 0.011 $\rm {R}_{\odot }$ and 4.768 ± 0.005, respectively. With an effective temperature of 3750 ± 15 K, the primary of LP 877-72 AB is also estimated to be ∼400 K hotter than the secondary component. We have also estimated the orbital period of LP 1033-31 and LP 877-72 to be ∼28 and ∼349 yr, respectively. The binding energies for both systems are found to be &gt;1043 erg, which signifies that both systems are stable.

Applications of SIMS to electronic materials and devices

1992 ◽  
Vol 50 (2) ◽  
pp. 1682-1683
Author(s):  
S.F. Corcoran
Keyword(s):  
Depth Distribution ◽  
Secondary Ion Mass Spectrometry ◽  
Semiconductor Device ◽  
Electronic Materials ◽  
Profile Analysis ◽  
Semiconductor Industry ◽  
Small Diameter ◽  
Depth Resolution ◽  
Detection Sensitivity

Over the past decade secondary ion mass spectrometry (SIMS) has played an increasingly important role in the characterization of electronic materials and devices. The ability of SIMS to provide part per million detection sensitivity for most elements while maintaining excellent depth resolution has made this technique indispensable in the semiconductor industry. Today SIMS is used extensively in the characterization of dopant profiles, thin film analysis, and trace analysis in bulk materials. The SIMS technique also lends itself to 2-D and 3-D imaging via either the use of stigmatic ion optics or small diameter primary beams.By far the most common application of SIMS is the determination of the depth distribution of dopants (B, As, P) intentionally introduced into semiconductor materials via ion implantation or epitaxial growth. Such measurements are critical since the dopant concentration and depth distribution can seriously affect the performance of a semiconductor device. In a typical depth profile analysis, keV ion sputtering is used to remove successive layers the sample.

Emergence of intense near-infrared photoluminescence by photoactivation of silver nanoclusters

2021 ◽  
Author(s):  
Wataru Ishii ◽  
Shohei Katao ◽  
Yoshiko Nishikawa ◽  
Yasuo Okajima ◽  
Atsuya Hatori ◽  
...  
Keyword(s):  
Quantum Yield ◽  
Near Infrared ◽  
Silver Nanoclusters ◽  
Pyridine Solution

Photoirradiation to a pyridine solution of Ag29 nanoclusters (NCs) with red photoluminescence (PL) at 680 nm activated intense PL in the near infrared (NIR) region, giving a PL quantum yield...

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