scholarly journals DIFFERENT SCHEMES FOR OBTAINING FRACTAL RELIEF OF NANOSIZED PLATINUM FILMS

2021 ◽  
pp. 156-165
Author(s):  
Дмитрий Викторович Иванов ◽  
Александр Сергеевич Антонов ◽  
Елена Михайловна Семенова ◽  
Александра Ивановна Иванова ◽  
Виталий Александрович Анофриев ◽  
...  
Keyword(s):  
Fractal Dimension ◽  
Magnetron Sputtering ◽  
Scanning Probe ◽  
Alternative Methods ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Air Atmosphere ◽  
Atomic Force ◽  
External Conditions ◽  
Force Mode

В работе исследуется морфология рельефа наноразмерных пленок платины на поверхности слюды с помощью сканирующего зондового (в режиме атомного-силового) и туннельного микроскопов. Пленки платины исследовались непосредственно после их получения на установке магнетронного напыления, а также после отжига в муфельной печи в воздушной атмосфере. Отжиг позволял установить возможные диапазоны изменения фрактальной размерности и высотных параметров, соответствующие деградации нанорельефа. Получены значения фрактальной размерности для пленок разной толщины при двух альтернативных методах исследования на разных исходных масштабах образцов: на основе данных атомносилового микроскопа - D̅=2,17÷2,38 и сканирующего туннельного микроскопа - D̅=2,28÷2,50 в зависимости от последовательности напыления слоев и отжига пленок. Выбор последовательности операций магнетронного напыления и отжига и внешних условий позволяют формулировать рекомендации по развитию технологии «выращивания» структур с заданной морфологией поверхности. The morphology of the relief of nanosized platinum films on the mica surface is investigated using the scanning probe (in the atomic force mode) and tunneling microscopy. Platinum films were investigated immediately after their preparation in a magnetron sputtering facility, as well as after annealing in a muffle furnace in an air atmosphere. Annealing made it possible to establish the possible ranges of variation of the fractal dimension and the altitude parameters corresponding to degradation of the nanorelief. The values of the fractal dimension were obtained for films of different thicknesses using two alternative methods of investigation at different initial scales of samples: based on the data of an atomic force microscope - D̅ = 2,17÷2,38 and a scanning tunneling microscope - D̅ = 2,28÷2,50 depending on the sequence of deposition of layers and annealing of films. For comparison, experimental data of other authors are presented. The choice of the sequence of operations for magnetron sputtering and annealing, and external conditions makes it possible to formulate recommendations for development of the technology for «growing» structures with a given surface morphology.

scholarly journals OBTAINING NANOSIZED PLATINUM FILMS WITH FRACTAL PROPERTIES

2020 ◽  
pp. 73-87
Author(s):  
Дмитрий Викторович Иванов ◽  
Александр Сергеевич Антонов ◽  
Елена Михайловна Семенова ◽  
Александра Ивановна Иванова ◽  
Сергей Андреевич Третьяков ◽  
...  
Keyword(s):  
Scanning Tunneling Microscope ◽  
Scanning Probe ◽  
Alternative Methods ◽  
Scanning Tunneling ◽  
Mica Surface ◽  
Atomic Force ◽  
Fractal Properties ◽  
Force Mode ◽  
Characteristic Features ◽  
Comprehensive Study

Проведено комплексное исследование морфологии рельефа наноразмерных пленок платины на поверхности слюды с помощью сканирующего зондового (в режиме атомного-силового) и туннельного микроскопов, а также оптического интерференционного профилометра. Описаны характерные особенности нанорельефа поверхности пленок платины различной толщины, включая фрактальные свойства. Получены значения фрактальной размерности для пленок разной толщины при двух альтернативных методах исследования на разных исходных масштабах образцов: на основе данных атомного-силового микроскопа - ̅D = 2,28÷2,35 и сканирующего туннельного микроскопа - ̅D = 2,12÷2,26. Для сравнения приведены экспериментальные данные других авторов. Предложены рекомендации по развитию технологии «выращивания» структур с заданной морфологией поверхности. A comprehensive study of the morphology of the relief of nanosized platinum films on the mica surface was carried out using a scanning probe (in the atomic force mode) and tunneling microscopes, as well as an optical interference profilometer. Characteristic features of the surface nanorelief of platinum films of various thicknesses, including fractal properties, are described. The values of the fractal dimension were obtained for films of different thicknesses using two alternative methods of investigation at different initial scales of samples: based on the data of an atomic force microscope - ̅D = 2,28÷2,35 and a scanning tunneling microscope - ̅D = 2,12÷2,26. For comparison, experimental data of other authors are presented. Recommendations for development of the technology for «growing» structures with a given surface morphology are proposed.

Scanning tunneling microscopy and atomic force microscopy: New tools for biology

1989 ◽  
Vol 47 ◽  
pp. 778-779
Author(s):  
CE Bracker ◽  
P. K. Hansma
Keyword(s):  
Physical Property ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Small Scale ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
New Family ◽  
Small Probe ◽  
Atomic Force ◽  
Transmission Electron

A new family of scanning probe microscopes has emerged that is opening new horizons for investigating the fine structure of matter. The earliest and best known of these instruments is the scanning tunneling microscope (STM). First published in 1982, the STM earned the 1986 Nobel Prize in Physics for two of its inventors, G. Binnig and H. Rohrer. They shared the prize with E. Ruska for his work that had led to the development of the transmission electron microscope half a century earlier. It seems appropriate that the award embodied this particular blend of the old and the new because it demonstrated to the world a long overdue respect for the enormous contributions electron microscopy has made to the understanding of matter, and at the same time it signalled the dawn of a new age in microscopy. What we are seeing is a revolution in microscopy and a redefinition of the concept of a microscope.Several kinds of scanning probe microscopes now exist, and the number is increasing. What they share in common is a small probe that is scanned over the surface of a specimen and measures a physical property on a very small scale, at or near the surface. Scanning probes can measure temperature, magnetic fields, tunneling currents, voltage, force, and ion currents, among others.

SCANNING PROBE MICROSCOPY BASED NANOSCALE PATTERNING AND FABRICATION

COSMOS ◽  
2007 ◽  
Vol 03 (01) ◽  
pp. 1-21 ◽  
Author(s):  
XIAN NING XIE ◽  
HONG JING CHUNG ◽  
ANDREW THYE SHEN WEE
Keyword(s):  
Integrated Circuits ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Nanoscale Patterning ◽  
Atomic Force ◽  
Probe Microscope ◽  
Molecular Manipulation

Nanotechnology is vital to the fabrication of integrated circuits, memory devices, display units, biochips and biosensors. Scanning probe microscope (SPM) has emerged to be a unique tool for materials structuring and patterning with atomic and molecular resolution. SPM includes scanning tunneling microscopy (STM) and atomic force microscopy (AFM). In this chapter, we selectively discuss the atomic and molecular manipulation capabilities of STM nanolithography. As for AFM nanolithography, we focus on those nanopatterning techniques involving water and/or air when operated in ambient. The typical methods, mechanisms and applications of selected SPM nanolithographic techniques in nanoscale structuring and fabrication are reviewed.

scholarly journals Исследование пленок диметилдиимида перилентетракарбоновой кислоты методами циклической термодесорбции и сканирующей зондовой микроскопии

2018 ◽  
Vol 60 (2) ◽  
pp. 255
Author(s):  
А.Е. Почтенный ◽  
А.Н. Лаппо ◽  
И.П. Ильюшонок
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Bandgap Width ◽  
Kelvin Probe ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Probe Spectroscopy

AbstractSome results of studying the direct-current (DC) conductivity of perylenetetracarboxylic acid dimethylimide films by cyclic oxygen thermal desorption are presented. The microscopic parameters of hopping electron transport over localized impurity and intrinsic states were determined. The bandgap width and the sign of major current carriers were determined by scanning probe microscopy methods (atomic force microscopy, scanning probe spectroscopy, and photoassisted Kelvin probe force microscopy). The possibility of the application of photoassisted scanning tunneling microscopy for the nanoscale phase analysis of photoconductive films is discussed.

Scanning-probe microscopy of polymers

1993 ◽  
Vol 51 ◽  
pp. 874-875
Author(s):  
Darrell H. Reneker ◽  
Rajkumari Patil ◽  
Seog J. Kim ◽  
Vladimir Tsukruk
Keyword(s):  
Scanning Probe Microscopy ◽  
Domain Boundary ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Lamellar Crystal ◽  
Probe Microscopy ◽  
Atomic Force ◽  
Resolution Observation ◽  
Lamellar Crystals

Scanning probe microscopy techniques, particularly atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are finding a rapidly growing number of applications to both synthetic and biological polymers. Segments of individual polymer molecules can often be observed with atom scale resolution. Observation of polymeric objects as large as 100 microns with nanometer resolution is possible with contemporary AFM, although features caused by the convolution of the shape of the sample and the shape of the tip must be recognized and properly interpreted. The vertical resolution of the atomic force microscope readily provides precise data about the heights of molecules, crystals, and other objects.Lamellar crystals of polyethylene are well characterized objects with many features which can be observed with scanning probe microscopes. Figure 1 shows the fold surface near a fold domain boundary of a lamellar crystal of polyethylene, as observed with an AFM. The folded chain crystal is about 15 nm thick.

COMPARATIVE STUDY OF THIOL FILMS ON C(0001) AND Au(111) SURFACES BY SCANNING PROBE MICROSCOPY

1997 ◽  
Vol 04 (04) ◽  
pp. 637-649 ◽  
Author(s):  
F. TERÁN ARCE ◽  
M. E. VELA ◽  
R. C. SALVAREZZA ◽  
A. J. ARVIA
Keyword(s):  
Pyrolytic Graphite ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Electrochemical Characteristics ◽  
Tunneling Microscopy ◽  
Test Reaction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electron Transfer Processes ◽  
Substrate Nature

The structures resulting from 1-dodecanethiol, 1-butanethiol and 1,9-nonanedithiol films produced on highly oriented pyrolytic graphite (HOPG) and gold(111) have been comparatively studied by scanning probe microscopies. Molecular resolution images resulting from atomic force microscopy (AFM) and scanning tunneling microscopy (STM) of different thiol films show the formation of arrays of molecules parallel to the HOPG surface. The electrochemical response of the ferro-ferricyanide reaction was used to test the characteristics of electron transfer processes in thiol-covered HOPG as compared to the bare substrate. The decrease in the heterogeneous rate constant for the test reaction appears to be directly related to the degree of film thickness uniformity. For comparison, films with the same kind of thiols were produced on Au(111). Although the electrochemical characteristics of these films appear to be the same irrespective of the substrate nature, the structure of the films on Au(111) is different from that produced on HOPG.

Ordering of a Functional Molecules on a Flat Surface as Evidenced by Scanning Probe Microscopies: The Case of a Di-Alkyl Amino Group

1998 ◽  
Vol 4 (S2) ◽  
pp. 304-305
Author(s):  
Christopher Gorman ◽  
Igor Touzov ◽  
Russell Miller
Keyword(s):  
Flat Surface ◽  
Pyrolytic Graphite ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Distinctive Features ◽  
Atomic Force ◽  
Highly Ordered Pyrolytic Graphite ◽  
Organic Functional Groups ◽  
Packing Arrangement

Our group is interested in exploring how functional molecules (e.g. those composed of organic functional groups that do not necessarily lend themselves to an ordered 2D packing arrangement) can form well-ordered adlayers with functional properties. To this end. we have studied the formation of self assembled structures of 5-(N,N-didecyl-amino)-2.4- pentadienal (DAPDA, Figure 1) deposited on a highly ordered pyrolytic graphite (HOPG) surface. This molecule has two distinctive features that should dramatically affect its ordering on a surface. Neither of these have been systematically explored in ordered adlayers. First, the extended conjugation of the molecule gives it a large in-plane dipole moment as well as a high polarizability. Second, it contains two hydrocarbon tails, only one of which can lie coplanar with the conjugated moiety. Both molecularly resolved monolayer and bilayer structures were found using a combination of scanning tunneling microscopy and tapping mode atomic force microscopies.

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