scholarly journals Theoretical study of optical properties of optical anti-reflection films

2021 ◽  
Vol 4 (2) ◽  

In this paper, the theoretical calculation of the characteristics of the optical film, including the basic theory of the film, the calculation of the characteristics of the single-layer film, and the calculation of the characteristics of the multilayer film, to achieve a certain degree of understanding of the characteristics of the optical film. And through the optical anti-reflection film The design principle, material selection, and process mastering have a deeper understanding of the anti-reflection film. The transmission spectrum is used to calculate the “envelope method” The refractive index, thickness, absorption coefficient, an extinction coefficient of the film to analyze the optical performance of the film.

2013 ◽  
Vol 28 (6) ◽  
pp. 671-676 ◽  
Author(s):  
Yu-Qing ZHANG ◽  
Li-Li ZHAO ◽  
Shi-Long XU ◽  
Chao ZHANG ◽  
Xiao-Ying CHEN ◽  
...  

1999 ◽  
Vol 576 ◽  
Author(s):  
Wenxiu Que ◽  
Y. Zhou ◽  
Y. L. Lam ◽  
Y. C. Chan ◽  
S. D. Cheng ◽  
...  

ABSTRACTWe report the preparation of sol-gel waveguide films based on a newly developed recipe to incorporate organic molecules into the inorganic sol-gel glass matrix. The film was derived from a sol that has a higher titanium content in an organically modified silane (ORMOSIL), namely, ÿ-Glycidoxypropyltrimethoxysilane. We have shown that using spin-coating and low temperature baking, a single coating layer can have a thickness of more than 1.5 μm. When such a single layer film is deposited on a microscope glass slide or a piece of silicon with a buffercladding layer, it is able to support the guiding of optical waves. We have characterized the film using scanning electron microscopy, atomic force microscopy, X-ray diffractometry, thermal gravimetric analysis. differential thermal analysis and Fourier transform infrared spectroscopy and have studied the properties of the waveguide film, including the microstructural properties. the chemical bonding properties, and the optical properties. Based on these experimental results, we found that a heat-treatment at a temperature slightly below 200°C is necessary to attain a dense pore-free film. It has also been noted that a purely inorganic and crack-free silica-titania film can be obtained after baking the titania-ORMOSIL composite film at 500°C or higher.


2021 ◽  
Author(s):  
Liu Lu ◽  
Tiantian Zhao ◽  
Lei Chen ◽  
Chenyang Wang ◽  
Zhiqiang Zhou ◽  
...  

Abstract We demonstrate the enhancement of both excitation and transmission efficiency of the propagated surface plasmon (SP) of Ag nanowire (Ag NW) in hybrid Ag-MoS2 structure by contrasting the SP propagation of the same Ag NW on different substrates including silicon substrate, monolayer MoS2, or partially overlapping the Ag NW on MoS2 flake. The simulation results indicate that with the assistance of MoS2, the leaky radiation of the hybrid plasmonic modes of the H1 and H2 can be prominently suppressed by the high refractive index dielectric layer of the MoS2, which provides an optical barrier blocking the leaky radiation, resulting in the reduced propagation loss. Our work provides a feasible and effective method to enhance the SP propagation length.


Materials ◽  
2020 ◽  
Vol 13 (13) ◽  
pp. 2981 ◽  
Author(s):  
Dorian Minkov ◽  
George Angelov ◽  
Radi Nestorov ◽  
Aleksey Nezhdanov ◽  
Dmitry Usanov ◽  
...  

Three AsxTe100−x films with different x and dissimilar average thickness d ¯ are characterized mainly from one interference transmittance spectrum T(λ = 300 to 3000 nm) of such film on a substrate based on the advanced optimizing envelope method (AOEM). A simple dual transformation of T(λ) is proposed and used for increasing the accuracy of computation of its envelopes T+(λ) and T−(λ) accounting for the significant glass substrate absorption especially for λ > 2500 nm. The refractive index n(λ) of As40Te60 and As98Te2 films is determined with a relative error <0.30%. As far as we know, the As80Te20 film is the only one with anomalous dispersion and the thickest, with estimated d ¯ = 1.1446 nm, ever characterized by an envelope method. It is also shown and explained why the extinction coefficient k(λ) of any of the three AsxTe100−x films is computed more accurately from the quantity Ti(λ) = [T+(λ)T−(λ)]0.5 compared to its commonly employed computation from T+(λ). The obtained results strengthen our conviction that the AOEM has a capacity for providing most accurate optical characterization of almost every dielectric or semiconductor film with d ¯ > 300 nm on a substrate, compared to all the other methods for characterization of such films only from T(λ).


Pramana ◽  
2014 ◽  
Vol 82 (6) ◽  
pp. 1085-1101 ◽  
Author(s):  
ENAMULLAH ◽  
VIPIN KUMAR ◽  
UPENDRA KUMAR ◽  
GIRISH S SETLUR

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