Neutron Imaging Using a Fine-Grained Nuclear Emulsion

A neutron detector using a fine-grained nuclear emulsion has a sub-micron spatial resolution and thus has potential to be applied as high-resolution neutron imaging. In this paper, we present two approaches to applying the emulsion detectors for neutron imaging. One is using a track analysis to derive the reaction points for high resolution. From an image obtained with a 9 μm pitch Gd grating with cold neutrons, periodic peak with a standard deviation of 1.3 μm was observed. The other is an approach without a track analysis for high-density irradiation. An internal structure of a crystal oscillator chip, with a scale of approximately 30 μm, was able to be observed after an image analysis.

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A cold/ultracold neutron detector using fine-grained nuclear emulsion with spatial resolution less than 100 nm

The European Physical Journal C ◽

10.1140/epjc/s10052-018-6395-7 ◽

2018 ◽

Vol 78 (11) ◽

Cited By ~ 5

Author(s):

N. Naganawa ◽

T. Ariga ◽

S. Awano ◽

M. Hino ◽

K. Hirota ◽

...

Keyword(s):

Spatial Resolution ◽

Neutron Detector ◽

Nuclear Emulsion ◽

Ultracold Neutron ◽

Fine Grained

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Development of high spatial resolution cold/ultra- cold neutron detector using fine-grained nuclear emulsion

10.22323/1.294.0077 ◽

2017 ◽

Author(s):

Naotaka Naganawa ◽

Shogo Awano ◽

Masahiro Hino ◽

Masanori Hirose ◽

Katsuya Hirota ◽

...

Keyword(s):

Spatial Resolution ◽

Neutron Detector ◽

Nuclear Emulsion ◽

High Spatial Resolution ◽

Cold Neutron ◽

Fine Grained ◽

Ultra Cold Neutron

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A Cold/Ultracold Neutron Detector which can Realize Spatial Resolution less than 100 nm using Fine-grained Nuclear Emulsion

hamon ◽

10.5611/hamon.29.3_133 ◽

2019 ◽

Vol 29 (3) ◽

pp. 133-137

Author(s):

Naotaka Naganawa

Keyword(s):

Spatial Resolution ◽

Neutron Detector ◽

Nuclear Emulsion ◽

Ultracold Neutron ◽

Fine Grained

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A Neutron Detector with Submicron Spatial Resolution using Fine-grained Nuclear Emulsion

Physics Procedia ◽

10.1016/j.phpro.2017.06.031 ◽

2017 ◽

Vol 88 ◽

pp. 224-230 ◽

Cited By ~ 5

Author(s):

N. Naganawa ◽

S. Awano ◽

M. Hino ◽

M. Hirose ◽

K. Hirota ◽

...

Keyword(s):

Spatial Resolution ◽

Neutron Detector ◽

Nuclear Emulsion ◽

Fine Grained

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Achieving Submicrometer Spatial Resolution for Neutron Imaging With Nuclear Emulsion

10.21203/rs.3.rs-966133/v1 ◽

2021 ◽

Author(s):

Abdul Muneem ◽

Junya Yoshida ◽

Hiroyuki Ekawa ◽

Masahiro Hino ◽

Katsuya Hirota ◽

...

Keyword(s):

Spatial Resolution ◽

Nuclear Emulsion ◽

Test Pattern ◽

High Spatial Resolution ◽

Neutron Imaging ◽

Fine Grained ◽

Wide Range ◽

Potential Applications ◽

Micrometer Scale ◽

Non Destructive

Abstract Neutron imaging is a non-destructive inspection technique with a wide range of potential applications. One of the key technical interests concerning neutron imaging is to achieve micrometer-scale spatial resolution. However, developing a neutron detector with a high spatial resolution is a challenging task. Recent efforts are focused on achieving this milestone or even submicrometer spatial resolution. Herein, we introduce our technique for neutron imaging using a fine-grained nuclear emulsion and evaluate the spatial resolution. We used the fine-grained nuclear emulsion with a gadolinium-based Siemens star test pattern and a grating with a periodic structure of 9 μm. The deduced value of the spatial resolution is less than 1 μm using the developed technique. To the best of our knowledge, the submicrometer spatial resolution that we achieved using our method is the best among all reported neutron imaging devices.

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Algorithms for automated montage synthesis of images from laser-scanning confocal microscopes

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100139627 ◽

1995 ◽

Vol 53 ◽

pp. 650-651

Author(s):

D. E. Becker

Keyword(s):

Image Analysis ◽

High Resolution ◽

Laser Scanning ◽

Cell Counting ◽

Wide Area ◽

Data Set ◽

Computational Synthesis ◽

Automated Cell Counting ◽

Partial View ◽

The Individual

An efficient, robust, and widely-applicable technique is presented for computational synthesis of high-resolution, wide-area images of a specimen from a series of overlapping partial views. This technique can also be used to combine the results of various forms of image analysis, such as segmentation, automated cell counting, deblurring, and neuron tracing, to generate representations that are equivalent to processing the large wide-area image, rather than the individual partial views. This can be a first step towards quantitation of the higher-level tissue architecture. The computational approach overcomes mechanical limitations, such as hysterisis and backlash, of microscope stages. It also automates a procedure that is currently done manually. One application is the high-resolution visualization and/or quantitation of large batches of specimens that are much wider than the field of view of the microscope.The automated montage synthesis begins by computing a concise set of landmark points for each partial view. The type of landmarks used can vary greatly depending on the images of interest. In many cases, image analysis performed on each data set can provide useful landmarks. Even when no such “natural” landmarks are available, image processing can often provide useful landmarks.

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Computer-Controlled Hrem Alignment Using Automated Diffractogram Analysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100181415 ◽

1990 ◽

Vol 48 (1) ◽

pp. 532-533

Author(s):

G.Y. Fan ◽

O.L. Krivanek

Keyword(s):

Electron Microscope ◽

High Resolution ◽

The Other ◽

Full Information ◽

Resolution Electron ◽

Skilled Operator ◽

Automatic Alignment ◽

High Resolution Electron Microscope ◽

Computer Controlled ◽

Recorded Image

Full alignment of a high resolution electron microscope (HREM) requires five parameters to be optimized: the illumination angle (beam tilt) x and y, defocus, and astigmatism magnitude and orientation. Because neither voltage nor current centering lead to the correct illumination angle, all the adjustments must be done on the basis of observing contrast changes in a recorded image. The full alignment can be carried out by a computer which is connected to a suitable image pick-up device and is able to control the microscope, sometimes with greater precision and speed than even a skilled operator can achieve. Two approaches to computer-controlled (automatic) alignment have been investigated. The first is based on measuring the dependence of the overall contrast in the image of a thin amorphous specimen on the relevant parameters, the other on measuring the image shift. Here we report on our progress in developing a new method, which makes use of the full information contained in a computed diffractogram.

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High Resolution Low Loss Microscopy of Crystalline Surfaces

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s1431927600000696 ◽

1980 ◽

Vol 38 ◽

pp. 162-163

Author(s):

William Krakow ◽

Alec N. Broers

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Surface Topography ◽

Secondary Electron ◽

Objective Lens ◽

Surface Imaging ◽

Low Loss ◽

Fine Grained ◽

Scanning Electron ◽

Crystalline Surfaces

Low-loss scanning electron microscopy can be used to investigate the surface topography of solid specimens and provides enhanced image contrast over secondary electron images. A high resolution-condenser objective lens has allowed the low-loss technique to resolve separations of Au nucleii of 50Å and smaller dimensions of 25Å in samples coated with a fine grained carbon-Au-palladium layer. An estimate of the surface topography of fine grained vapor deposited materials (20 - 100Å) and the surface topography of underlying single crystal Si in the 1000 - 2000Å range has also been investigated. Surface imaging has also been performed on single crystals using diffracted electrons scattered through 10−2 rad in a conventional TEM. However, severe tilting of the specimen is required which degrades the resolution 15 to 100 fold due to image forshortening.

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