scholarly journals Determination of Displacement Fields at the Sub-Nanometric Scale

Materials ◽  
2019 ◽  
Vol 12 (11) ◽  
pp. 1804
Author(s):  
Cesar A. Sciammarella ◽  
Federico M. Sciammarella ◽  
Luciano Lamberti
Keyword(s):  
Electron Microscopy ◽  
Theoretical Models ◽  
The Other ◽  
Nanometer Scale ◽  
Displacement Fields ◽  
Eulerian Description ◽  
Transmission Electron ◽  
Displacement Information ◽  
Crystalline Array

Macroscopic behavior of materials depends on interactions of atoms and molecules at nanometer/sub-nanometer scale. Experimental mechanics (EM) can be used for assessing relationships between the macro world and the atomic realm. Theoretical models developed at nanometric and sub-nanometric scales may be verified using EM techniques with the final goal of deriving comprehensive but manageable models. Recently, the authors have carried out studies on EM determination of displacements and their derivatives at the macro and microscopic scales. Here, these techniques were applied to the analysis of high-resolution transmission electron microscopy patterns of a crystalline array containing dislocations. Utilizing atomic positions as carriers of information and comparing undeformed and deformed configurations of observed area, displacements and their derivatives, as well as stresses, have been obtained in the Eulerian description of deformed crystal. Two approaches are introduced. The first establishes an analogy between the basic crystalline structure and a 120° strain gage rosette. The other relies on the fact that, if displacement information along three directions is available, it is possible to reconstruct the displacement field; all necessary equations are provided in the paper. Remarkably, the validity of the Cauchy-Born conjecture is proven to be correct within the range of observed deformations.

Development of 200 kV Scanning-Transmission Electron Microscope

1974 ◽  
Vol 32 ◽  
pp. 410-411
Author(s):  
H. Koike ◽  
S. Sakurai ◽  
K. Ueno ◽  
M. Watanabe
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Scanning Transmission Electron Microscope ◽  
The Other ◽  
Morphological Observation ◽  
Magnetic Domains ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Backscattered Electron ◽  
Increasing Demand

In recent years, there has been increasing demand for higher voltage SEMs, in the field of surface observation, especially that of magnetic domains, dislocations, and electron channeling patterns by backscattered electron microscopy. On the other hand, the resolution of the CTEM has now reached 1 ∼ 2Å, and several reports have recently been made on the observation of atom images, indicating that the ultimate goal of morphological observation has beem nearly achieved.

Enhanced information from biological materials through technological improvements in cryo-electron microscopy

1992 ◽  
Vol 50 (1) ◽  
pp. 788-789
Author(s):  
Marc J.C. de Jong ◽  
Wim M. Busing ◽  
Max T. Otten
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Biological Materials ◽  
Electron Crystallography ◽  
Cryo Electron Microscopy ◽  
Transmission Electron ◽  
The Many ◽  
Technological Improvements ◽  
Beam Damage

Biological materials damage rapidly in the electron beam, limiting the amount of information that can be obtained in the transmission electron microscope. The discovery that observation at cryo temperatures strongly reduces beam damage (in addition to making it unnecessaiy to use chemical fixatives, dehydration agents and stains, which introduce artefacts) has given an important step forward to preserving the ‘live’ situation and makes it possible to study the relation between function, chemical composition and morphology.Among the many cryo-applications, the most challenging is perhaps the determination of the atomic structure. Henderson and co-workers were able to determine the structure of the purple membrane by electron crystallography, providing an understanding of the membrane's working as a proton pump. As far as understood at present, the main stumbling block in achieving high resolution appears to be a random movement of atoms or molecules in the specimen within a fraction of a second after exposure to the electron beam, which destroys the highest-resolution detail sought.

Use of electron microscopy to characterize the surfaces of flocculent and nonflocculent yeast cells

1989 ◽  
Vol 35 (12) ◽  
pp. 1081-1086 ◽  
Author(s):  
Byron F. Johnson ◽  
L. C. Sowden ◽  
Teena Walker ◽  
Bong Y. Yoo ◽  
Gode B. Calleja
Keyword(s):  
Electron Microscopy ◽  
Fission Yeast ◽  
Budding Yeast ◽  
The Other ◽  
Yeast Cells ◽  
Scanning Electron Micrographs ◽  
Soft Or ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Scanning Electron

The surfaces of flocculent and nonflocculent yeast cells have been examined by electron microscopy. Nonextractive preparative procedures for scanning electron microscopy allow comparison in which sharp or softened images of surface details (scars, etc.) are the criteria for relative abundance of flocculum material. Asexually flocculent budding-yeast cells cannot be distinguished from nonflocculent budding-yeast cells in scanning electron micrographs because the scar details of both are well resolved, being hard and sharp. On the other hand, flocculent fission-yeast cells are readily distinguished from nonflocculent cells because fission scars are mostly soft or obscured on flocculent cells, but sharp on nonflocculent cells. Sexually and asexually flocculent fission-yeast cells cannot be distinguished from one another as both are heavily clad in "mucilaginous" or "hairy" coverings. Examination of lightly extracted and heavily extracted flocculent fission-yeast cells by transmission electron microscopy provides micrographs consistent with the scanning electron micrographs.Key words: flocculation, budding yeast, fission yeast, scanning, transmission.

scholarly journals Determination of the 3-D Magnetic Vector Potential using Lorentz Transmission Electron Microscopy

2009 ◽  
Vol 15 (S2) ◽  
pp. 134-135 ◽  
Author(s):  
C Phatak ◽  
E Humphrey ◽  
M DeGraef ◽  
A Petford-Long
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Vector Potential ◽  
Magnetic Vector Potential ◽  
Magnetic Vector ◽  
Transmission Electron ◽  
Lorentz Transmission Electron Microscopy

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Preparation of yolk–shell structured Ag@Cu particles and their application in high performance electrochemical sensing of p-aminobenzoic acid

2019 ◽  
Vol 97 (2) ◽  
pp. 140-146
Author(s):  
Tian Gan ◽  
Zhikai Wang ◽  
Mengru Chen ◽  
Wanqiu Fu ◽  
Haibo Wang ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Performance ◽  
Electrochemical Impedance ◽  
High Sensitivity ◽  
Differential Pulse ◽  
Electrochemical Sensing ◽  
High Catalytic Activity ◽  
Aminobenzoic Acid ◽  
Transmission Electron

In this work, the Ag@Cu particles with yolk–shell nanostructure was prepared by facile solvothermal method, which was modified on glassy carbon electrode (GCE) to fabricate electrochemical sensor for the convenient and fast determination of p-aminobenzoic acid (PABA). The surface morphology and electrochemical properties of the as-prepared Ag@Cu nanocomposite modified electrode were characterized by scanning electron microscopy, transmission electron microscopy, chronocoulometry, and electrochemical impedance spectroscopy. Further, the electrochemical sensing of PABA was performed on the Ag@Cu/GCE using cyclic voltammetry and differential pulse voltammetry techniques, showing high catalytic activity. Under the optimal conditions, the sensor exhibited a wide linear range, high sensitivity, and low detection limit of 0.315 μmol/L for PABA. The developed sensor was also successfully applied for PABA detection in anesthetic and cosmetics with satisfactory results.

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