scholarly journals A Differential Detection Method Based on a Linear Weak Measurement System

Sensors ◽  
2019 ◽  
Vol 19 (11) ◽  
pp. 2473
Author(s):  
Nian Xiong ◽  
Tian Guan ◽  
Yang Xu ◽  
Lixuan Shi ◽  
Suyi Zhong ◽  
...  
Keyword(s):  
Measurement System ◽  
Total Internal Reflection ◽  
High Stability ◽  
Detection Method ◽  
Weak Measurement ◽  
Internal Reflection ◽  
Differential Detection ◽  
Label Free ◽  
Label Free Detection ◽  
Linear Differential

Self-reference detection is necessary and important to a biosensor. The linear weak measurement system based on total internal reflection has attracted widespread attention due to its high stability, label-free detection, and easy integration. In this paper, we propose a differential detection method based on the linear total internal reflection weak measurement system. We introduce the half-wave plate (HWP) to convert the H light and the V light to each other, thereby obtaining the difference in phase change of the optical path before and after the HWP. Experiments show that the system can not only achieve differential detection, but also has high stability. The linear differential weak measurement system proposed in this paper not only provides a new differential measurement method for real-time biosensors, but also enriches the types of weak measurement sensors.

Differential detection photothermal spectroscopy: towards ultra-fast and sensitive label-free detection in picoliter & femtoliter droplets

Lab on a Chip ◽  
2017 ◽  
Vol 17 (21) ◽  
pp. 3654-3663 ◽  
Author(s):  
Richard M. Maceiczyk ◽  
David Hess ◽  
Flora W. Y. Chiu ◽  
Stavros Stavrakis ◽  
Andrew J. deMello
Keyword(s):  
Differential Detection ◽  
Label Free ◽  
Photothermal Spectroscopy ◽  
Microfluidic Droplets ◽  
Label Free Detection

Differential detection photothermal spectroscopy enables ultra-fast and sensitive absorbance quantification in microfluidic droplets.

scholarly journals Silicene Quantum Capacitance Dependent Frequency Readout to a Label-free Detection of DNA Hybridization

2021 ◽  
Author(s):  
Sazzadur Rahman ◽  
Rokaia Laizu Naima ◽  
Khatuna Jannatun Shetu ◽  
Mahabub Hossain ◽  
M. Shamim Kaiser ◽  
...  
Keyword(s):  
Band Gap ◽  
Dna Hybridization ◽  
Glucose Sensor ◽  
Detection Method ◽  
Genetic Research ◽  
Ph Sensor ◽  
Detection Methods ◽  
Quantum Capacitance ◽  
Label Free ◽  
Label Free Detection

Two-dimensional silicon allotrodes– also called Sinicene– have recently experienced intensive scientific research interest due to their unique electrical, mechanical, and sensing characteristics. A novel silicene based nano-material has been enticed great amenities, partially because of its uniformity with graphene. Silicene is a highly sensitive for numerous sensors based on molecular sensing as pH sensor, gas sensor, ion sensor and biosensing are Deoxyribonucleic acid (DNA) nucleobase sensor, photonic sensor, cell-based biosensor, glucose sensor, and bioelectric nose sensor. Nowadays genetic research based on DNA hybridization, which is a vital tools for sensing material and it has various detection methods. Among of them, the detection method is frequency readout used to a label-free detection of DNA hybridization. In this paper we have compared the graphene and silicene quantum capacitance that has been proposed for a DNA hybridization detection method on wireless readout. These method shows, the strands of mismatched and complementary DNA have in different range of frequency to identify output efficiency. With respect to DNA concentration the output of silicene is almost sharply linear than graphene. In addition of field effect transistor, silicene opens a new opportunities due to its band gap whereas graphene indicates zero band gap. It can be stated that silicene is much more reliable as well as much stronger than multi-layered graphene.

scholarly journals A Simple and Label-Free Detection of As3+ using 3-nitro-L-tyrosine as an As3+-chelating Ligand

Sensors ◽  
2019 ◽  
Vol 19 (13) ◽  
pp. 2857 ◽  
Author(s):  
Jin-Ho Park ◽  
Gyuho Yeom ◽  
Donggu Hong ◽  
Eun-Jung Jo ◽  
Chin-Ju Park ◽  
...  
Keyword(s):  
Detection Method ◽  
Color Change ◽  
Specific Property ◽  
Quantitative Detection ◽  
Label Free ◽  
Real Samples ◽  
Real Water Samples ◽  
Label Free Detection ◽  
Reaction Stoichiometry ◽  
Site Binding

A simple and rapid As3+ detection method using 3-nitro-L-tyrosine (N-Tyr) is reported. We discovered the specific property of N-Tyr, which specifically chelates As3+. The reaction between As3+ and N-Tyr induces a prompt color change to vivid yellow, concomitantly increasing the absorbance at 430 nm. The selectivity for As3+ is confirmed by competitive binding experiments with various metal ions (Hg2+, Pb2+, Cd2+, Cr3+, Mg2+, Ni2+, Cu2+, Fe2+, Ca2+, Zn2+, and Mn2+). Also, the N-Tyr binding site, binding affinity, and As3+/N-Tyr reaction stoichiometry are investigated. The specific reaction is utilized to design a sensor that enables the quantitative detection of As3+ in the 0.1–100 μM range with good linearity (R2 = 0.995). Furthermore, the method’s applicability for the analysis of real samples, e.g., tap and river water, is successfully confirmed, with good recoveries (94.32–109.15%) using As3+-spiked real water samples. We believe that our discovering and its application for As3+ analysis can be effectively utilized in environmental analyses such as those conducted in water management facilities, with simplicity, rapidity, and ease.

scholarly journals Label-Free Imaging of Single Nanoparticles Using Total Internal Reflection-Based Leakage Radiation Microscopy

Nanomaterials ◽  
2020 ◽  
Vol 10 (4) ◽  
pp. 615
Author(s):  
Liwen Jiang ◽  
Xuqing Sun ◽  
Hongyao Liu ◽  
Ruxue Wei ◽  
Xue Wang ◽  
...  
Keyword(s):  
Total Internal Reflection ◽  
Near Field ◽  
Internal Reflection ◽  
In Situ Monitoring ◽  
Far Field ◽  
Label Free ◽  
Polystyrene Nanospheres ◽  
Leakage Radiation Microscopy ◽  
Leakage Radiation

Label-free, fast, and single nanoparticle detection is demanded for the in situ monitoring of nano-pollutants in the environment, which have potential toxic effects on human health. We present the label-free imaging of single nanoparticles by using total internal reflection (TIR)-based leakage radiation microscopy. We illustrate the imaging of both single polystyrene (PS) and Au nanospheres with diameters as low as 100 and 30 nm, respectively. As both far-field imaging and simulated near-field electric field intensity distribution at the interface showed the same characteristics, i.e., the localized enhancement and interference of TIR evanescent waves, we confirmed the leakage radiation, transforming the near-field distribution to far-field for fast imaging. The localized enhancement of single PS and Au nanospheres were compared. We also illustrate the TIR-based leakage radiation imaging of single polystyrene nanospheres with different incident polarizations. The TIR-based leakage radiation microscopy method is a competitive alternative for the fast, in situ, label-free imaging of nano-pollutants.

Development of an Evanescent Light Measurement System for Si Wafer Microdefect Detection

2005 ◽  
Vol 295-296 ◽  
pp. 15-20 ◽  
Author(s):  
S. Takahashi ◽  
R. Nakajima ◽  
Takashi Miyoshi ◽  
Yasuhiro Takaya ◽  
Kiyoshi Takamasu
Keyword(s):  
Measurement System ◽  
Total Internal Reflection ◽  
Detection Method ◽  
Wafer Surface ◽  
Next Generation ◽  
Air Interface ◽  
Light Measurement ◽  
Evanescent Light ◽  
And Control ◽  
Si Wafer

In order to reduce and control yield loss in the fabrication process of next generation ULSI devices, nano-defects inspection technique for polished Silicon (Si) wafer surface becomes more essential. This paper discusses a new optical nano-defects detection method, which is applicable to silicon wafer surface inspection for next-generation semiconductors. In our proposed method, the evanescent light is emerged on the wafer surface with total internal reflection (TIR) of infrared (IR) laser at the Si-air interface. By scanning the surface where the evanescent light is emerging with a very shaped fiber probe, it enables to detect nanometer scale defects in the vicinity of Si wafer surface without diffraction limit to resolution. To experimentally verify the feasibility of this method, an evanescent light measurement system was developed and several fundamental experiments were performed. The results show that the proposed Si wafer microdefects detection method can detect the microdefect with 10nm scale on and beneath the surface based on evanescent light distribution.

scholarly journals Label-Free Single-Particle Imaging of the Influenza Virus by Objective-Type Total Internal Reflection Dark-Field Microscopy

PLoS ONE ◽  
2012 ◽  
Vol 7 (11) ◽  
pp. e49208 ◽  
Author(s):  
Sawako Enoki ◽  
Ryota Iino ◽  
Nobuhiro Morone ◽  
Kunihiro Kaihatsu ◽  
Shouichi Sakakihara ◽  
...  
Keyword(s):  
Influenza Virus ◽  
Single Particle ◽  
Total Internal Reflection ◽  
Dark Field ◽  
Internal Reflection ◽  
Label Free ◽  
Dark Field Microscopy ◽  
Particle Imaging ◽  
Single Particle Imaging ◽  
Objective Type
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