Direct observation of three-dimensional transient temperature distribution in SiC Schottky barrier diode under operation by optical-interference contactless thermometry (OICT) imaging
Keyword(s):
Hot Spot
◽
Abstract We have developed optical-interference contactless thermometry (OICT) imaging technique to visualize three-dimensional transient temperature distribution in 4H-SiC Schottky barrier diode (SBD) under operation. When a 1 ms forward pulse bias was applied, clear variation of optical interference fringes induced by self-heating and cooling were observed. Thermal diffusion and optical analysis revealed three-dimensional temperature distribution with high spatial (≤ 10 μm) and temporal (≤ 100 μs) resolutions. A hot spot that signals breakdown of the SBD was successfully captured as an anormal interference, which indicated a local heating to a temperature as high as 805 K at the time of failure.
1980 ◽
Vol 56
(2)
◽
pp. 359-368
◽
1958 ◽
Vol 25
(12)
◽
pp. 742-750
◽
Proceedings of the Institution of Mechanical Engineers Part B Management and engineering manufacture
◽
1987 ◽
Vol 201
(3)
◽
pp. 149-156
◽
1972 ◽
Vol 7
(2)
◽
pp. 117-124
◽
2004 ◽
Vol 126
(3)
◽
pp. 619-626
◽
1994 ◽
Transient Temperature Distribution in Composites with Layers of Functionally Graded Materials (FGMs)
2006 ◽
Vol 25
(5)
◽
pp. 513-542
◽