scholarly journals Nano-Structure Studies of Perhydropolysilazane - Derived Silica Thin Layers

2021 ◽  
Author(s):  
Tomotake Niizeki ◽  
Yoshio Hasegawa ◽  
Kazuhiro Akutsu-Suyama
Keyword(s):  
Thin Layers ◽  
Nano Structure

scholarly journals Nano-Structure Studies of Perhydropolysilazane - Derived Silica Thin Layers

2021 ◽  
Author(s):  
Tomotake Niizeki ◽  
Yoshio Hasegawa ◽  
Kazuhiro Akutsu-Suyama
Keyword(s):  
Thin Layers ◽  
Nano Structure

Study of Thin Nafion® Films for Fuel Cells Using Energy Variable Slow Positron Annihilation Spectroscopy

2012 ◽  
Vol 733 ◽  
pp. 57-60
Author(s):  
Hamdy F.M. Mohamed ◽  
Seiti Kuroda ◽  
Yoshinori Kobayashi ◽  
Bruno Tavernier ◽  
Ryoichi Suzuki ◽  
...  
Keyword(s):  
Fuel Cells ◽  
Positron Annihilation ◽  
Positron Annihilation Spectroscopy ◽  
Dip Coating ◽  
Thin Layers ◽  
Nano Structure ◽  
Si Substrates ◽  
Catalyst Layers ◽  
Energy Variable ◽  
Conducting Membranes

Nafion® is one of the most popular proton conducting membranes for polymer electrolyte fuel cells (PEFCs). For the integration of Nafion® to the catalyst layers, very thin layers of the polymer are often formed on the catalysts of PEFC from dilute solutions. We applied energy variable positron annihilation to characterizing the structure of thin Nafion® films prepared by spin and dip coating from ethanol/water solutions of Nafion® on Si substrates. Experimental data suggest that the nano-structure of 23 nm thick spin coated Nafion® film is different from 220 nm thick film and also from 26 and 227 nm thick dip coated films, possibly due to the preservation of the unique rod-like structure of Nafion® in the dilute solution.

Immunoferritin localization of intracellular antigens in positively stained frozen sections

1978 ◽  
Vol 36 (2) ◽  
pp. 168-169
Author(s):  
K. T. Tokuyasu
Keyword(s):  
Surface Tension ◽  
Water Surface ◽  
Thin Layers ◽  
The Other ◽  
Positive Staining ◽  
Frozen Sections ◽  
The Past ◽  
Ultrathin Frozen Sections ◽  
Definition Of

During the past investigations of immunoferritin localization of intracellular antigens in ultrathin frozen sections, we found that the degree of negative staining required to delineate u1trastructural details was often too dense for the recognition of ferritin particles. The quality of positive staining of ultrathin frozen sections, on the other hand, has generally been far inferior to that attainable in conventional plastic embedded sections, particularly in the definition of membranes. As we discussed before, a main cause of this difficulty seemed to be the vulnerability of frozen sections to the damaging effects of air-water surface tension at the time of drying of the sections.Indeed, we found that the quality of positive staining is greatly improved when positively stained frozen sections are protected against the effects of surface tension by embedding them in thin layers of mechanically stable materials at the time of drying (unpublished).

EELS Measurement of the Local Electronic Structure of Copper Atoms Segregated to Aluminum Grain Boundaries

1996 ◽  
Vol 54 ◽  
pp. 342-343
Author(s):  
S.J. Splinter ◽  
J. Bruley ◽  
P.E. Batson ◽  
D.A. Smith ◽  
R. Rosenberg
Keyword(s):  
Electronic Structure ◽  
Grain Boundaries ◽  
Boundary Segregation ◽  
Thin Layers ◽  
Nominal Composition ◽  
Spatially Resolved ◽  
Service Lifetime ◽  
Heat Treated ◽  
Probe Size ◽  
Local Electronic Structure

It has long been known that the addition of Cu to Al interconnects improves the resistance to electromigration failure. It is generally accepted that this improvement is the result of Cu segregation to Al grain boundaries. The exact mechanism by which segregated Cu increases service lifetime is not understood, although it has been suggested that the formation of thin layers of θ-CuA12 (or some metastable substoichiometric precursor, θ’ or θ”) at the boundaries may be necessary. This paper reports measurements of the local electronic structure of Cu atoms segregated to Al grain boundaries using spatially resolved EELS in a UHV STEM. It is shown that segregated Cu exists in a chemical environment similar to that of Cu atoms in bulk θ-phase precipitates.Films of 100 nm thickness and nominal composition Al-2.5wt%Cu were deposited by sputtering from alloy targets onto NaCl substrates. The samples were solution heat treated at 748K for 30 min and aged at 523K for 4 h to promote equilibrium grain boundary segregation. EELS measurements were made using a Gatan 666 PEELS spectrometer interfaced to a VG HB501 STEM operating at 100 keV. The probe size was estimated to be 1 nm FWHM. Grain boundaries with the narrowest projected width were chosen for analysis. EDX measurements of Cu segregation were made using a VG HB603 STEM.

Domain structures in thin layers of a ferrocolloid

1993 ◽  
Vol 3 (11) ◽  
pp. 1633-1645 ◽  
Author(s):  
Yu. A. Buyevich ◽  
A. Yu. Zubarev
Keyword(s):  
Thin Layers ◽  
Domain Structures

INTERNAL FRICTION INVESTIGATIONS OF ELECTROLYTICALLY DEPOSITED THIN LAYERS

1983 ◽  
Vol 44 (C9) ◽  
pp. C9-487-C9-492
Author(s):  
G. Haneczok ◽  
R. Kuśka ◽  
R. Kwiatkowski ◽  
J. W. Moro
Keyword(s):  
Internal Friction ◽  
Thin Layers

Electrical Anisotropy of Thin Metal Films Growing on Dielectric Substrates

2002 ◽  
Vol 7 (2) ◽  
pp. 45-52
Author(s):  
L. Jakučionis ◽  
V. Kleiza
Keyword(s):  
Magnetic Field ◽  
Thin Films ◽  
Uniaxial Anisotropy ◽  
Metal Films ◽  
Thin Layers ◽  
Electrical Anisotropy ◽  
Electrical Field ◽  
Dielectric Substrates ◽  
Unequal Probability ◽  
Conductive Thin Films

Electrical properties of conductive thin films, that are produced by vacuum evaporation on the dielectric substrates, and which properties depend on their thickness, usually are anisotropic i.e. they have uniaxial anisotropy. If the condensate grow on dielectric substrates on which plane electrical field E is created the transverse voltage U⊥ appears on the boundary of the film in the direction perpendicular to E. Transverse voltage U⊥ depends on the angle γ between the applied magnetic field H and axis of light magnetisation. When electric field E is applied to continuous or grid layers, U⊥ and resistance R of layers are changed by changing γ. It means that value of U⊥ is the measure of anisotropy magnitude. Increasing voltage U0 , which is created by E, U⊥ increases to certain magnitude and later decreases. The anisotropy of continuous thin layers is excited by inequality of conductivity tensor components σ0 ≠ σ⊥. The reason of anisotropy is explained by the model which shows that properties of grain boundaries are defined by unequal probability of transient of charge carrier.

Injecting Inter-Layers and the Built-in Potential of Blue Polymer Light-Emitting Diodes

2000 ◽  
Vol 660 ◽  
Author(s):  
Thomas M. Brown ◽  
Ian S. Millard ◽  
David J. Lacey ◽  
Jeremy H. Burroughes ◽  
Richard H. Friend ◽  
...  
Keyword(s):  
Indium Tin Oxide ◽  
Light Emitting Diodes ◽  
Basic Structure ◽  
Thin Layers ◽  
Carrier Injection ◽  
Semiconducting Polymer ◽  
Light Emitting ◽  
Physical Mechanisms ◽  
Organic Solid ◽  
Polymer Light Emitting Diodes

ABSTRACTThe semiconducting-polymer/injecting-electrode heterojunction plays a crucial part in the operation of organic solid state devices. In polymer light-emitting diodes (LEDs), a common fundamental structure employed is Indium-Tin-Oxide/Polymer/Al. However, in order to fabricate efficient devices, alterations to this basic structure have to be carried out. The insertion of thin layers, between the electrodes and the emitting polymer, has been shown to greatly enhance LED performance, although the physical mechanisms underlying this effect remain unclear. Here, we use electro-absorption measurements of the built-in potential to monitor shifts in the barrier height at the electrode/polymer interface. We demonstrate that the main advantage brought about by inter-layers, such as poly(ethylenedioxythiophene)/poly(styrene sulphonic acid) (PEDOT:PSS) at the anode and Ca, LiF and CsF at the cathode, is a marked reduction of the barrier to carrier injection. The electro- absorption results also correlate with the electroluminescent characteristics of the LEDs.

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