Exploring wear at the nanoscale with circular mode atomic force microscopy

The development of atomic force microscopy (AFM) has allowed wear mechanisms to be investigated at the nanometer scale by means of a single asperity contact generated by an AFM tip and an interacting surface. However, the low wear rate at the nanoscale and the thermal drift require fastidious quantitative measurements of the wear volume for determining wear laws. In this paper, we describe a new, effective, experimental methodology based on circular mode AFM, which generates high frequency, circular displacements of the contact. Under such conditions, the wear rate is significant and the drift of the piezoelectric actuator is limited. As a result, well-defined wear tracks are generated and an accurate computation of the wear volume is possible. Finally, we describe the advantages of this method and we report a relevant application example addressing a Cu/Al2O3 nanocomposite material used in industrial applications.

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Quantitative Measurements of Intercellular Adhesion Strengths between Cancer Cells with Different Malignancies Using Atomic Force Microscopy

Analytical Chemistry ◽

10.1021/acs.analchem.9b01569 ◽

2019 ◽

Vol 91 (16) ◽

pp. 10557-10563 ◽

Cited By ~ 1

Author(s):

Hyonchol Kim ◽

Kenta Ishibashi ◽

Kosuke Matsuo ◽

Atsushi Kira ◽

Tomoko Okada ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Cancer Cells ◽

Intercellular Adhesion ◽

Force Microscopy ◽

Quantitative Measurements ◽

Atomic Force

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Quantitative measurements of dielectrophoresis in a nanoscale electrode array with an atomic force microscopy

Applied Physics Letters ◽

10.1063/1.4983785 ◽

2017 ◽

Vol 110 (20) ◽

pp. 203701 ◽

Cited By ~ 2

Author(s):

James Froberg ◽

Vidura Jayasooriya ◽

Seungyong You ◽

Dharmakeerthi Nawarathna ◽

Yongki Choi

Keyword(s):

Atomic Force Microscopy ◽

Electrode Array ◽

Force Microscopy ◽

Quantitative Measurements ◽

Atomic Force

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Improved Measurements of the Physical Properties of Oriental Lacquers Using Atomic Force Microscopy and a Nanoindenter

Polymers ◽

10.3390/polym13091395 ◽

2021 ◽

Vol 13 (9) ◽

pp. 1395

Author(s):

Hye Hyun Yu ◽

Jung-Ah Lim ◽

Kang-Bong Lee ◽

Yeonhee Lee

Keyword(s):

Atomic Force Microscopy ◽

Physical Properties ◽

Quantitative Methods ◽

Measurement Techniques ◽

Industrial Applications ◽

Chemical Compositions ◽

Drying Time ◽

Force Microscopy ◽

Atomic Force ◽

Oriental Lacquer

Researchers have widely investigated Oriental lacquers to identify the chemical composition and have elucidated corresponding polymerization mechanisms using rigorous analytical techniques. However, researchers generally test the physical properties of Oriental lacquers by conventional methods that are perhaps overly simplistic. Here, we propose accurate and quantitative methods for evaluating the physical properties of Korean, Vietnamese, and Myanmarese lacquer films using atomic force microscopy (AFM), a nanoindenter, and a 90° peel tester. We obtained surface images of the lacquers in accordance with drying time using scanning electron microscopy and AFM. The Korean lacquer film exhibited fast hardening speed, enhanced hardness, and strong adhesion strength compared with the other lacquers, although the Myanmarese lacquer film had a smoother surface than the Korean lacquer film. We used our characterization approach for evaluating a mixed Korean/Myanmarese (50/50 w/w) lacquer. Our proposed measurement techniques for Oriental lacquer films provided results that agreed with qualitative results from conventional tests. Force–distance curves in AFM and force–displacement with nanoindenter for Oriental lacquer films showed more accurate and quantitative data on the mechanical properties. Thus, researchers will find our approach useful when they optimize the chemical compositions and improve the physical properties of Oriental lacquer films for industrial applications.

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Atomic force microscopy—a powerful tool for industrial applications

Surface and Interface Analysis ◽

10.1002/(sici)1096-9918(199905/06)27:5/6<401::aid-sia533>3.0.co;2-a ◽

1999 ◽

Vol 27 (5-6) ◽

pp. 401-409 ◽

Cited By ~ 24

Author(s):

A. Karbach ◽

D. Drechsler

Keyword(s):

Atomic Force Microscopy ◽

Industrial Applications ◽

Force Microscopy ◽

Atomic Force

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Stability, resolution, and ultra-low wear amplitude modulation atomic force microscopy of DNA: Small amplitude small set-point imaging

Applied Physics Letters ◽

10.1063/1.4817906 ◽

2013 ◽

Vol 103 (6) ◽

pp. 063702 ◽

Cited By ~ 24

Author(s):

Sergio Santos ◽

Victor Barcons ◽

Hugo K. Christenson ◽

Daniel J. Billingsley ◽

William A. Bonass ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Amplitude Modulation ◽

Small Amplitude ◽

Set Point ◽

Force Microscopy ◽

Atomic Force ◽

Small Set ◽

Low Wear

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Nano-Scale Forces, Stresses, and Tip Geometry Evolution of Amplitude Modulation Atomic Force Microscopy Probes

Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference ◽

10.1115/detc2011-48653 ◽

2011 ◽

Cited By ~ 1

Author(s):

Vahid Vahdat ◽

David S. Grierson ◽

Kevin T. Turner ◽

Robert W. Carpick

Keyword(s):

Atomic Force Microscopy ◽

Amplitude Modulation ◽

Interaction Model ◽

Wear Test ◽

Atomic Scale ◽

Wear Volume ◽

Microscopy Imaging ◽

Wear Process ◽

Force Microscopy ◽

Atomic Force

Atomic-scale wear is one of the main factors that hinders the performance of probes for atomic force microscopy (AFM) [1–6], including for the widely-used amplitude modulation (AM-AFM) mode. To conduct consistent and quantitative AM-AFM wear experiments, we have developed a protocol that involves controlling the tip-sample interaction regime, calculating the maximum contact force and normal stress over the course of the wear test, and quantifying the wear volume using high-resolution transmission electron microscopy imaging (HR-TEM). The tip-sample interaction forces are estimated from a closed-form equation that uses the Derjaguin-Mu¨ller-Toporov interaction model (DMT) accompanied by a tip radius measurement algorithm known as blind tip reconstruction. The applicability of this new protocol is demonstrated experimentally by scanning silicon probes against ultrananocrystalline diamond (UNCD) samples. The wear process for the Si tip involved blunting of the tip due to tip fragmentation and plastic deformation. In addition, previous studies on the relative contributions of energy dissipation processes to AFM tip wear are reviewed, and initial steps are taken towards applying this concept to AM-AFM.

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