Characterization of a Bar-coated Graphene film from Surfactant-added Water Dispersion

2021 ◽  
Vol 71 (11) ◽  
pp. 901-907
Author(s):  
Woojin SHIN ◽  
Hyesung OH ◽  
Sehyun JUNG ◽  
Gyun-Hui KIM ◽  
Haneul LEE ◽  
...  
Author(s):  
Paolo La Torraca ◽  
Luca Larcher ◽  
Paolo Lugli ◽  
Marco Bobinger ◽  
Francisco J. Romero ◽  
...  

Author(s):  
Man Li ◽  
Yanan Yue

The negative influence of substrate on in-plane phonon transport in graphene has been revealed by intensive research, whereas the interaction between phonons couplings across graphene/substrate interface and within graphene is still needed to figure out. In this work, we put forward a two-step Raman method to accomplish interface thermal resistance characterization of graphene/SiO2 and in-plane thermal conductivity measurement of supported graphene by SiO2. In order to calculate the interfacial thermal resistance, the temperature difference between graphene and its substrate was probed using Raman thermometry after the graphene film was uniformly electrically heated. Combing the ITR and the temperature response of graphene to laser heating, the thermal conductivity was computed using the fin heat transfer model. Our results shows that the thermal resistance of free graphene/SiO2 is enormous and the thermal conductivity of the supported graphene is significantly suppressed. The phonons scattering and leakage at the interface are mainly responsible for the reduction of thermal conductivity of graphene on substrate. The morphology change of graphene caused by heating mainly determines the huge interfacial thermal resistance and partly contributes to the suppression of thermal conductivity of graphene. This thermal characterization approach simultaneously realizes the non-contact and non-destructive measurement of interfacial thermal resistance and thermal conductivity of graphene interface materials.


Foods ◽  
2021 ◽  
Vol 10 (10) ◽  
pp. 2253
Author(s):  
Sanita Reidzane ◽  
Zanda Kruma ◽  
Jekaterina Kazantseva ◽  
Anna Traksmaa ◽  
Dace Klava

The development of microorganisms of sourdough and biodiversity of microbiota can be influenced by changing the parameters of the technological process such as the ratio of flour and added water, the fermentation temperature and time. The Box–Behnken design methodology was used to determine the optimal parameters for the three-phase spontaneous backslopping fermentation process of hull-less barley sourdough, as well as to characterize the microbiological diversity. The optimized parameters of backslopping fermentation are flour and water ratio 1:1.13, temperature 30 °C, time 24 h in the 1st backslopping; the inoculate, flour and water ratio 1:1:1.3, temperature 31 °C, time 14 h in the 2nd backslopping, and the inoculate, flour and water ratio 1:1:1.5, and temperature 28.5 °C, time 12 h in the 3rd step of backslopping. In the controlled spontaneous fermentation environment in three backslopping steps, the microbiological research of hull-less barley sourdough has confirmed the dominance of species Pediococcus pentosaceus in the 3rd backslopping step of spontaneous fermentation. The developed spontaneous hull-less barley sourdough is consistent with the number of lactic bacteria and yeasts in line with that seen by the active sourdough.


Optica ◽  
2016 ◽  
Vol 3 (2) ◽  
pp. 151 ◽  
Author(s):  
Henri Jussila ◽  
He Yang ◽  
Niko Granqvist ◽  
Zhipei Sun

2020 ◽  
Vol 1001 ◽  
pp. 229-234
Author(s):  
Qin Sheng Wang ◽  
Zheng Liu ◽  
Wen Juan Su ◽  
Yong Qiang Yang ◽  
Wei Fang Zhao ◽  
...  

Graphene was attended widely in recent years because of its excellent performance in electrical, mechanical, optical and magnetic applications. X-ray photoelectron spectroscopy (XPS) is commonly used tools for studying the chemical binding state, chemical modification, heteroatom dopants and quantitative chemical composition of graphene. In this work, XPS characterization of graphene films, obtained through reduction and then thermal treatment of graphene oxide films, was studied. The XPS of the graphene films are performed by direct testing, Ar+ etching, and direct peeling of the surface layer. The result shows that for graphene film, direct peeling is a simple and easy to use low-cost treatment, which can also be extended to XPS testing of other two-dimensional (2D) materials.


2012 ◽  
Vol 48 (1) ◽  
pp. 156-161 ◽  
Author(s):  
Wen-Shi Ma ◽  
Ji Li ◽  
Bang-Jun Deng ◽  
Xu-Sheng Zhao

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