A Brief Introduction to Ambient Pressure X-ray Photoemission Spectroscopy and Its Related Research

The synthesis and characterization of Ti and TiN thin films of different thicknesses was carried out on a martensitic stainless steel AISI 410 substrate used for tool manufacturing. The mechanical parameters between the interacting surfaces such as thickness, adhesion and hardness were measured. By means of the scanning electron microscope (SEM) the superficial morphology of the Ti/TiN interface was observed, finding that the growth was of columnar grains and by means of EDAX the existence of titanium was verified. Using X-ray diffraction (XRD) it was possible to observe the presence of residual stresses (~ -3.1 GPa) due to the different crystalline phases in the coating. Under X-ray photoemission spectroscopy (XPS) it was possible to observe the molecular chemical composition of the coating surface, being Ti-N, Ti-N-O and Ti-O the predominant ones.

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Electronic Study of Pt-Ga Intermetallic Compounds Using X-Ray Photoemission Spectroscopy

10.21236/ada225036 ◽

1990 ◽

Author(s):

Young K. Kim ◽

David K. Shuh ◽

R. S. Williams ◽

Larry P. Sadwick ◽

Kang L. Wang

Keyword(s):

Intermetallic Compounds ◽

Photoemission Spectroscopy ◽

X Ray

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Understanding Solid-Gas Reaction Mechanisms by Operando Soft X-ray Absorption Spectroscopy at Ambient Pressure: On the Importance of Surface Hydroxides in SnO 2 Heterogeneous Catalysts and Sensors

SSRN Electronic Journal ◽

10.2139/ssrn.3520956 ◽

2020 ◽

Author(s):

Luca Braglia ◽

Martina Fracchia ◽

Paolo Ghigna ◽

Alessandro Minguzzi ◽

Daniela Meroni ◽

...

Keyword(s):

Absorption Spectroscopy ◽

Reaction Mechanisms ◽

Heterogeneous Catalysts ◽

Ambient Pressure ◽

X Ray ◽

X Ray Absorption

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Electronic Structure of n-Cycloparaphenylenes Directly Observed by Photoemission Spectroscopy

Physical Chemistry Chemical Physics ◽

10.1039/d1cp00625h ◽

2021 ◽

Author(s):

Kaname Kanai ◽

Takuya Inoue ◽

Takaya Furuichi ◽

Kaito Shinoda ◽

Takashi Iwahashi ◽

...

Keyword(s):

Electronic Structure ◽

Electronic Structures ◽

Photoemission Spectroscopy ◽

Cyclic Structure ◽

Visible Absorption ◽

X Ray ◽

Inverse Photoemission

A series of n-cycloparaphenylenes ([n]CPP) were studied by ultraviolet photoemission, inverse photoemission, ultraviolet-visible absorption, and X-ray photoemission spectroscopy to detect their unique electronic structures. [n]CPP has a cyclic structure in...

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In Situ probing of solid/liquid interfaces of potassium–oxygen batteries via ambient pressure X-ray photoelectron spectroscopy: New reaction pathways and root cause of battery degradation

Energy Storage Materials ◽

10.1016/j.ensm.2021.01.010 ◽

2021 ◽

Vol 36 ◽

pp. 341-346 ◽

Cited By ~ 1

Author(s):

Wanwan Wang ◽

Yu Wang ◽

Chia-Hsin Wang ◽

Yaw-Wen Yang ◽

Yi-Chun Lu

Keyword(s):

Photoelectron Spectroscopy ◽

Ambient Pressure ◽

Reaction Pathways ◽

Liquid Interfaces ◽

X Ray ◽

Root Cause ◽

Battery Degradation ◽

Solid Liquid

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Electrochemical reduction of CO2 in ionic liquid: Mechanistic study of Li–CO2 batteries via in situ ambient pressure X-ray photoelectron spectroscopy

Nano Energy ◽

10.1016/j.nanoen.2021.105830 ◽

2021 ◽

Vol 83 ◽

pp. 105830

Author(s):

Yu Wang ◽

Wanwan Wang ◽

Jing Xie ◽

Chia-Hsin Wang ◽

Yaw-Wen Yang ◽

...

Keyword(s):

Ionic Liquid ◽

Electrochemical Reduction ◽

Photoelectron Spectroscopy ◽

Ambient Pressure ◽

Mechanistic Study ◽

X Ray ◽

Reduction Of Co2

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The Degree of Oxidation of Graphene Oxide

Nanomaterials ◽

10.3390/nano11030560 ◽

2021 ◽

Vol 11 (3) ◽

pp. 560

Author(s):

Alexandra Carvalho ◽

Mariana C. F. Costa ◽

Valeria S. Marangoni ◽

Pei Rou Ng ◽

Thi Le Hang Nguyen ◽

...

Keyword(s):

Graphene Oxide ◽

Ab Initio ◽

State Of The Art ◽

High Accuracy ◽

Precise Determination ◽

Photoemission Spectroscopy ◽

Pristine Graphene ◽

X Ray ◽

Degree Of Oxidation

We show that the degree of oxidation of graphene oxide (GO) can be obtained by using a combination of state-of-the-art ab initio computational modeling and X-ray photoemission spectroscopy (XPS). We show that the shift of the XPS C1s peak relative to pristine graphene, ΔEC1s, can be described with high accuracy by ΔEC1s=A(cO−cl)2+E0, where c0 is the oxygen concentration, A=52.3 eV, cl=0.122, and E0=1.22 eV. Our results demonstrate a precise determination of the oxygen content of GO samples.

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