The Application of Non-Destructive Testing Based on Terahertz Technology in the Field of Smart Grid

2013 ◽  
Vol 760-762 ◽  
pp. 409-412
Author(s):  
Xiao Juan Li ◽  
Ming Wang ◽  
Xiao Bin Liang ◽  
Xian Long Zhao ◽  
Ming Fei Zhao
Keyword(s):  
Smart Grid ◽  
Materials Science ◽  
Important Research ◽  
Non Destructive Testing ◽  
Electronic Components ◽  
Destructive Testing ◽  
Semiconductor Physics ◽  
Power System Monitoring ◽  
Terahertz Technology ◽  
Non Destructive

The terahertz technology involves electromagnetics, semiconductor physics, optoelectronics, materials science and micro-processing technology and other disciplines. Based on terahertz technology, non-destructive testing has important research value and application prospect in the field of medical imaging, security checking, product testing and power system monitoring. The generation of terahertz technology and its advantages is described in this article, and an analysis is also given on the application of non-destructive testing based on terahertz technology in the field of smart grid such as cable accident warning, intelligent anti-theft system and electronic components monitoring.

scholarly journals A Method for Automated Control of Electronic Components on Microfocus X-ray Images

2021 ◽  
Vol 24 (4) ◽  
pp. 27-36
Author(s):  
N. E. Staroverov
Keyword(s):  
Object Recognition ◽  
Average Error ◽  
Non Destructive Testing ◽  
Electronic Components ◽  
Destructive Testing ◽  
Automated Control ◽  
X Ray ◽  
Radiographic Inspection ◽  
Non Destructive

Introduction. Machine vision systems are increasingly used in industrial production, particularly for monitoring the quality of electronic components. Radiographic (Х-ray) inspection is currently one of the most popular types of non-destructive testing. Electronic components are typically characterized by a small size, hence, their radiographic inspection should be based on obtaining images and their further enlargement. X-ray equipment for performing such studies is designed such that there are relatively small input doses of X-ray radiation in the plane of the receiver, which leads to a higher image noise than that using conventional X-ray devices.Aim. To develop a method for automated object recognition on microfocus X-ray images.Materials and methods. A method for segmentation of X-ray images is proposed. In the first step, adaptive median filtering is performed followed by correction of the image background by subtracting the distorting function. Next, the contours of the objects in the image are identified using the Canny edge detector followed by recognition of the objects on the resulting image.Results. The developed method was tested for quality control of the installation of microcircuits and for determining the number of electronic components. The experiments confirmed the accuracy of the proposed method. When monitoring the quality of microcircuit installation, the number of detected defects differed from that verified by the operator by less than 10 %. The average error of the proposed method was less than 0.1% when determining the number of electronic components.Conclusion. The proposed method for object recognition on microfocus X-ray images demonstrated sufficient accuracy in typical tasks of non-destructive testing of electronic components.

Texture and Microstructure Imaging by the Moving Area Detector Method

2005 ◽  
Vol 105 ◽  
pp. 3-14 ◽  
Author(s):  
Andrea Preusser ◽  
Helmut Klein ◽  
Hans Joachim Bunge
Keyword(s):  
Materials Science ◽  
Volume Element ◽  
X Rays ◽  
Non Destructive Testing ◽  
Structural Components ◽  
Destructive Testing ◽  
Area Detector ◽  
Detector Method ◽  
Complex Structural ◽  
Non Destructive

Additional to the position of any volume element of a (poly)-crystalline material its crystal orientation must also be known. Both together are described in the six-dimensional orientation-location space. The paper describes the most frequent structures of materials in this space and how these can be imaged with the "Moving Area Detector Method" using hard synchrotron X-rays. This technique is equally well suited for basic reseach in materials science as well as for non-destructive testing of technological parts or even complex structural components.

scholarly journals Terahertz based non-destructive testing (NDT)

2020 ◽  
Vol 0 (0) ◽  
Author(s):  
Dirk Nüßler ◽  
Joachim Jonuscheit
Keyword(s):  
New Technology ◽  
Industrial Applications ◽  
X Rays ◽  
Non Destructive Testing ◽  
Destructive Testing ◽  
Reinforced Plastics ◽  
Hollow Structures ◽  
Terahertz Technology ◽  
Non Destructive ◽  
Made In

AbstractEstablished methods based on X-rays, ultrasound, thermography, eddy current, and optics are very effective in fault detection and structural analysis. However, these methods are limited for some applications, for example, the non-destructive testing of fiber-reinforced plastics, foams, and sandwich or hollow structures. In these cases, terahertz technology offers an innovative method to overcome these limitations. Tremendous advances have been made in this new technology in terms of their industrialization in recent years. This paper presents techniques for use in industrial applications.

scholarly journals Non-Contact, Non-Destructive Testing in Various Industrial Sectors with Terahertz Technology

Sensors ◽  
2020 ◽  
Vol 20 (3) ◽  
pp. 712 ◽  
Author(s):  
Yu Heng Tao ◽  
Anthony J. Fitzgerald ◽  
Vincent P. Wallace
Keyword(s):  
Construction Industry ◽  
Material Characterization ◽  
Manufacturing Industry ◽  
Thickness Measurement ◽  
Thz Spectroscopy ◽  
Non Destructive Testing ◽  
Destructive Testing ◽  
Industrial Sectors ◽  
Terahertz Technology ◽  
Non Destructive

In this article, we survey various non-contact, non-destructive testing methods by way of terahertz (THz) spectroscopy and imaging designed for use in various industrial sectors. A brief overview of the working principles of THz spectroscopy and imaging is provided, followed by a survey of selected applications from three industries—the building and construction industry, the energy and power industry, and the manufacturing industry. Material characterization, thickness measurement, and defect/corrosion assessment are demonstrated through the examples presented. The article concludes with a discussion of novel spectroscopy and imaging devices and techniques that are expected to accelerate industry adoption of THz systems.

scholarly journals Non-Destructive Testing for Building Diagnostics and Monitoring: Experience Achieved with Case Studies

2018 ◽  
Vol 149 ◽  
pp. 01015
Author(s):  
Ayşe Tavukçuoğlu
Keyword(s):  
Ultrasonic Testing ◽  
Building Materials ◽  
Materials Science ◽  
Pulse Velocity ◽  
Non Destructive Testing ◽  
Destructive Testing ◽  
Building Science ◽  
Historical Structures ◽  
Non Destructive

Building inspection on site, in other words in-situ examinations of buildings is a troublesome work that necessitates the use of non-destructive investigation (NDT) techniques. One of the main concerns of non-destructive testing studies is to improve in-situ use of NDT techniques for diagnostic and monitoring studies. The quantitative infrared thermography (QIRT) and ultrasonic pulse velocity (UPV) measurements have distinct importance in that regard. The joint use of QIRT and ultrasonic testing allows in-situ evaluation and monitoring of historical structures and contemporary ones in relation to moisture, thermal, materials and structural failures while the buildings themselves remain intact. For instances, those methods are useful for detection of visible and invisible cracks, thermal bridges and damp zones in building materials, components and functional systems as well as for soundness assessment of materials and thermal performance assessment of building components. In addition, those methods are promising for moisture content analyses in materials and monitoring the success of conservation treatments or interventions in structures. The in-situ NDT studies for diagnostic purposes should start with the mapping of decay forms and scanning of building surfaces with infrared images. Quantitative analyses are shaped for data acquisition on site and at laboratory from representative sound and problem areas in structures or laboratory samples. Laboratory analyses are needed to support in-situ examinations and to establish the reference data for better interpretation of in situ data. Advances in laboratory tests using IRT and ultrasonic testing are guiding for in-situ materials investigations based on measurable parameters. The knowledge and experience on QIRT and ultrasonic testing are promising for the innovative studies on today’s materials technologies, building science and conservation/maintenance practices. Such studies demand a multi-disciplinary approach that leads to bring together knowledge on materials science and building science.

scholarly journals X-ray inspection systems for electronic parts

2018 ◽  
Vol 28 (4) ◽  
pp. 52-58
Author(s):  
A. O. Ustinov
Keyword(s):  
Reading Speed ◽  
Inspection System ◽  
Non Destructive Testing ◽  
Electronic Components ◽  
Flat Panel ◽  
Destructive Testing ◽  
X Ray ◽  
Flat Panel Detector ◽  
Cmos Sensor ◽  
Non Destructive

An X-ray inspection is one of the basic methods of non-destructive testing along with optical inspection. Lack of Russian manufacturers in this sector of measuring equipment was a barrier for implementation of the State program «Development of the electronics and radio electronics industry, 2013–2025». High sensitivity X-ray flat panel detector and inspection system concept for non-destructive testing of electronic components were developed. The detector is based on CMOS sensor with pixel pitch 50 um. Key features of the flat panel detector are: limiting spatial resolution 10 LP/mm, reading speed 30 fps, anode voltage range from 20 to 300 kV. Availability of technologies for the production of microfocus sources and flat panel detectors allows creating X-ray inspection system for electronic components for the needs of the microelectronics industry.

Non destructive testing of works of art by terahertz analysis

2013 ◽  
Vol 64 (2) ◽  
pp. 21001 ◽  
Author(s):  
Jean-Luc Bodnar ◽  
Jean-Jacques Metayer ◽  
Kamel Mouhoubi ◽  
Vincent Detalle
Keyword(s):  
Non Destructive Testing ◽  
Destructive Testing ◽  
Works Of Art ◽  
Non Destructive

Modeling of a sensitive element on a planar mushroom-shaped metamaterial for non-destructive testing and searching for inhomogeneities in technological media

2020 ◽  
pp. 54-59
Author(s):  
A. A. Yelizarov ◽  
A. A. Skuridin ◽  
E. A. Zakirova
Keyword(s):  
Sensitive Element ◽  
Non Destructive Testing ◽  
Destructive Testing ◽  
Resonant Frequency Shift ◽  
Maltese Cross ◽  
Informative Parameters ◽  
Non Destructive ◽  
Cross Type ◽  
Electrodynamic Structure ◽  
Electrophysical Parameters

A computer model and the results of a numerical experiment for a sensitive element on a planar mushroom-shaped metamaterial with cells of the “Maltese cross” type are presented. The proposed electrodynamic structure is shown to be applicable for nondestructive testing of geometric and electrophysical parameters of technological media, as well as searching for inhomogeneities in them. Resonant frequency shift and change of the attenuation coefficient value of the structure serve as informative parameters.

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