Study of the Localized Heating of Si Solar Cells by Thermal Imaging and Scanning Electron Microscopy

2013 ◽  
Vol 770 ◽  
pp. 157-160
Author(s):  
Buntoon Wiengmoon
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Solar Cells ◽  
Energy Dispersive Spectroscopy ◽  
Thermal Imaging ◽  
Hot Spots ◽  
Micro Cracks ◽  
Impurity Contamination ◽  
Localized Heating ◽  
Scanning Electron

The aim of this study was to investigate the localized solar cells heating by thermal imaging, scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS). The electrical measurements and thermal infrared measurements were done on the commercial crystalline Si cells (10 cm x 10 cm). SEM was used for the observation of the localized heating. The I-V characteristics of all cells were quite similar with a small spread in the electrical parameters, while the IR images were different: some cells had quite uniform temperature profiles distribution and other ones showed the localized heating. The energy dispersive spectroscopy (EDS) analysis showed that some hot spots have high metal impurity contamination. The micro-structure investigation of hot spots revealed the micro-cracks presence. Our study found direct correlation between areas of high impurity contamination, micro cracks and hot-spot heating.

Analyse of Indium Loss in Preparation of CuInSe2 Flims for Solar Cells

2011 ◽  
Vol 183-185 ◽  
pp. 1837-1841
Author(s):  
Lei Sha ◽  
Yan Lai Wang ◽  
Shi Liang Ban
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Stainless Steel ◽  
Solar Cells ◽  
Surface Morphology ◽  
Energy Dispersive Spectroscopy ◽  
Titanium Substrates ◽  
Selenization Process ◽  
Scanning Electron

CuInSe2 thin films were obtained by selenization of the Cu-In precursors in the atmosphere of Se vapour, which were prepared on stainless steel and titanium substrates by electrodeposition. The films were characterized by XRD, scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS). The respective influences of composition, phases and surface morphology of Cu-In precursors on indium loss were investigated. The results indicate that the indium loss occurs in selenization process because of volatile In2Se arising. The indium loss is less in selenization process of Cu-In precursors contained CuIn, Cu2In and In phases.

Pengaruh implantasi ion tin (Titanium Nitrida) terhadap sifat mekanis baja VCL 140

2010 ◽  
Vol 8 (1) ◽  
pp. 753
Author(s):  
Muhammad Muhammad
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Energy Dispersive Spectroscopy ◽  
Energy Dispersive ◽  
Scanning Electron

Implantasi ion dapat meningkatkan sifat mekanik seperti kekerasan bahan yang akan digunakan untuk komponen dan peralatan proses manufaktur. Implantasi ion dipengaruhi oleh jenis ion dopan, waktu dan energi yang digunakan. Penelitian ini dilakukan untuk mengetahui pengaruh energi dan waktu implantasi ion titanium nitrida terhadap kekerasan dan struktur mikro pada baja VCL 140. Implantasi dilakukan pada arus berkas tetap 10 yA. Variasi waktu 60, 70, 80, 90, 100, 110, 120 menit, energi 75 keV dan variasi energi 15, 30, 45, 60, 75, 90 dan 100 keV dengan waktu implantasi 100 menit dilakukan untuk mendapatkan kekerasan optimum. Uji Kekerasan menggunakan metode Vickers dengan beban 10 gram dan waktu 10 detik. Topografi dari lapisan TIN diamati menggunakan scanning electron microscopy (SEM) dan komposisi kimia dari lapisan TIN dianalisa menggunakan energy dispersive spectroscopy (EDS).Kata kunci : Implantasi ion, VCL 140, kekerasan

scholarly journals Use of Scanning Electron Microscopy and Energy-Dispersive Spectroscopy to Correlate the Arrangement of Starch with Resistance to Maize Weevil (Coleoptera: Curculionidae) in Sorghum Grain

2011 ◽  
Vol 17 (S2) ◽  
pp. 250-251
Author(s):  
M Pendleton ◽  
B Pendleton ◽  
E Ellis ◽  
G Peterson ◽  
F Chito ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Energy Dispersive Spectroscopy ◽  
Energy Dispersive ◽  
Maize Weevil ◽  
Sorghum Grain ◽  
Scanning Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Methodology for the determination of <63 µm free mica fines in sand and within the cement matrix of hardened concrete blocks using scanning electron microscopy and energy dispersive spectroscopy

2019 ◽  
Vol 53 (3) ◽  
pp. 425-430
Author(s):  
Leona O'Connor ◽  
Robbie Goodhue
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Resolution ◽  
Energy Dispersive Spectroscopy ◽  
Cement Matrix ◽  
Hardened Concrete ◽  
Concrete Blocks ◽  
Free Mica ◽  
Supplementary Material ◽  
Scanning Electron

We propose a method for quantification of the percentage of <63 µm muscovite fines (termed free mica) in mixed sand fines and the identification/semi-quantitative analysis of free mica in the cement matrix of hardened concrete blocks. In recent times homeowners in County Donegal, Ireland reported structural problems in their buildings and concern that it is due to high concentrations of free mica within the concrete blocks. Our method requires the generation of high-resolution backscattered electron (BSE) images using field emission scanning electron microscopy (FE-SEM), where the characteristic needle-like morphology of mica can easily be identified. Additional information on the size, shape and chemical composition of the free mica fines, is gathered using energy dispersive spectroscopy (EDS or EDX). The combination of high-magnification images, high-resolution elemental maps, and mineral liberation software allows accurate identification and quantification of free mica within the sand fines and cement matrix.Supplementary material: Information pertaining to the measurements by SEM-EDX are reported in Supplementary Tables 1 and 2, available at https://doi.org/10.6084/m9.figshare.c.4709390

Field emission scanning electron microscopy (FESEM): an easy way to characterize morphologies of P3HT:PCBM coated and printed solar cells

2019 ◽  
Vol 4 (3) ◽  
pp. 034001
Author(s):  
Riccardo Po ◽  
Gianni Corso ◽  
Alessandra Cominetti ◽  
Chiara Carbonera ◽  
Andrea Bernardi ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Solar Cells ◽  
Field Emission ◽  
Scanning Electron
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