Structural and Optical Properties of Nickel-Doped and Undoped Zinc Oxide Thin Films Deposited by Sol-Gel Method

2014 ◽  
Vol 895 ◽  
pp. 250-253 ◽  
Author(s):  
Siti Hajar Basri ◽  
Mohd Arif Mohd Sarjidan ◽  
Wan Haliza Abd Majid
Keyword(s):  
Thin Films ◽  
Zinc Acetate ◽  
Zinc Acetate Dihydrate ◽  
Sol Gel ◽  
Chelating Agent ◽  
Zno Films ◽  
Ni Doping ◽  
Gel Method ◽  
Sol Gel Method ◽  
Glass Substrates

ZnO thin films with and without Ni-doping were successfully deposited by sol-gel method with zinc acetate dihydrate as inorganic precursor, and nickel (II) acetate tetrahydrate as dopant. The solutions were prepared by dissolving zinc acetate and nickel (II) acetate in ethanol and diethanolamine (DEA) as its chelating agent. Thin films were fabricated by using spin-coating method on glass substrates. ZnO films were obtained by pre-heating and post-heating at 300 °C for 10 minutes and 500 °C for 1 h respectively. The films were analyzed by X-ray diffraction (XRD), UV-Vis transmittance and photoluminescence (PL). All samples exhibit high transparency in visible. Ni dopant does not alter so much ZnO structure, which due to the ion substitution between Ni and Zn. However, the Ni tends to create a dopant energy interlayer in ZnO energy band gap which cause significant change in PL intensity.

Microstructural, Optical and Electrical Properties of ZnO:Sn Thin Films Deposited by Sol-Gel Method

2013 ◽  
Vol 652-654 ◽  
pp. 519-522
Author(s):  
Jun Chen ◽  
Yue Hui Hu ◽  
Hong Hao Hu ◽  
Yi Chuan Chen
Keyword(s):  
Thin Films ◽  
Electrical Properties ◽  
Sol Gel ◽  
Hexagonal Structure ◽  
Optical And Electrical Properties ◽  
Axis Orientation ◽  
Gel Method ◽  
Sol Gel Method ◽  
Sn Doping ◽  
Glass Substrates

Transparent thin films of Sn-doped ZnO (ZnO:Sn) were deposited onto silica glass substrates by the sol–gel method. The effect of different Sn doping on the crystallinity, structural, optical and electrical properties of ZnO:Sn thin films were investigated by XRD, SEM, UV-VIS spectrophotometer and four-point probe method respectively. Among all of ZnO:Sn thin films in this paper, Sn-doped with 2 at.% exhibited the best properties, the surface demonstrate an accumulative crystallization and hexagonal structure, with a high-preferential c-axis orientation, namely an average transmittance of 90% and the resistivity of 19.6 Ω·cm.

Studying on Preparation of AZO Thin Films with Sol-Gel Method

2010 ◽  
Vol 152-153 ◽  
pp. 868-873 ◽  
Author(s):  
Xiu Ling Lv ◽  
Yu Bo Dou ◽  
Juan Wang ◽  
Ying Xu
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Sol Gel ◽  
Treatment Temperature ◽  
Zno Films ◽  
Gel Method ◽  
Sol Gel Method ◽  
Crystallization Properties ◽  
Doped Zno ◽  
Micro Morphology

Al doped ZnO thin films（AZO films） was prepared by sol-gel method. The influence of Parameters of different processes on the crystallization properties, micro-morphology and optical properties of this kind of films were studied, using by X-ray diffractometer, filed emission stereoscan, spectral photometer, hall admeasuring apparatus. The results indicated that the crystallization properties, micro-morphology and optical properties of Al doped ZnO films were best on the condition that the sol density was 0.5mol/L, hat treatment temperature is 600 and there is a 8-layer coating.

Effect of Ruthenium Concentration on Structural and I-V Characteristics of ZnO Thin Films by Sol–Gel Method

2017 ◽  
Vol 05 (01) ◽  
pp. 1750004
Author(s):  
R. Vettumperumal ◽  
S. Kalyanaraman ◽  
R. Thangavel
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Zno Thin Films ◽  
Zno Films ◽  
X Ray Diffraction ◽  
Axis Orientation ◽  
Gel Method ◽  
X Ray ◽  
Sol Gel Method ◽  
Doped Zno

Nanocrystalline ruthenium (Ru)-doped ZnO thin films on sapphire substrate was prepared using sol–gel method by spin coating technique. The structural and I-V characteristics of Ru doped ZnO thin films were studied from the X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscope (SEM) analysis and Raman spectroscopy. X-ray diffraction (XRD) results revealed that the deposited films belonged to hexagonal wurtzite structure with c-axis orientation. It is also confirmed from the Raman spectra. Enhancement of longitudinal optical (LO) phonon is observed by the strong electron–phonon interaction. An observed increment in sheet resistance with increase in dopant percentage of Ru (1–2[Formula: see text]mol%) in ZnO films was found and better I-V characteristic behavior was observed at 1[Formula: see text]mol% of Ru-doped ZnO thin films. Trap limited current flow inside the material was calculated from the log I versus log V plot in the higher voltage region.

SCANNING ELECTRON MICROSCOPE AND X-RAY DIFFRACTION STUDIES ON THE LATTICE CONSTANT OF SPIN-COATED Zn1-xMgxO THIN FILMS OF SOL-GEL METHOD

2005 ◽  
Vol 12 (04) ◽  
pp. 605-610 ◽  
Author(s):  
M. RUSOP ◽  
K. UMA ◽  
T. SOGA ◽  
T. JIMBO
Keyword(s):  
Thin Films ◽  
Lattice Constant ◽  
Zinc Acetate Dihydrate ◽  
Sol Gel ◽  
Zno Films ◽  
Silicon Substrates ◽  
Acetate Dihydrate ◽  
Glass Substrates ◽  
Sol Gel Process ◽  
Coating Method

ZnO and Zn 1-x Mg x O thin films were prepared on glass and silicon substrates by spin coating method using 2-methoxyethanol solution of zinc acetate dihydrate and magnesium acetate dihydrate stabilized by monoethanolamine. The effects of drying and annealing condition of structural and optical properties of the films were studied. It was found that the samples annealed at 650°C improves the crystallographic orientation of the ZnO films grown by the sol-gel process significantly. Two types of substrates were used to examine the substrate effects of the growth of Zn 1-x Mg x O thin films. In corning glass substrates, the lattice constant decreased by a little with increasing concentration of Mg , whereas in the case of silicon substrates, the lattice constant decreased rapidly with x when compared to the glass substrates. The optical band energy gaps of Zn 1-x Mg x O thin films were slightly increased with increasing concentration of Mg .

INFLUENCE OF FIRING TEMPERATURE ON THE PROPERTIES OF CdO THIN FILMS OBTAINED BY THE SOL-GEL METHOD

2001 ◽  
Vol 15 (17n19) ◽  
pp. 726-729 ◽  
Author(s):  
C. I. ZUÑIGA-ROMERO ◽  
G. TORRES-DELGADO ◽  
S. JIMENEZ-SANDOVAL ◽  
O. JIMENEZ-SANDOVAL ◽  
R. CASTANEDO-PEREZ
Keyword(s):  
Thin Films ◽  
Firing Temperature ◽  
Sol Gel ◽  
Precursor Solution ◽  
Cadmium Acetate ◽  
Gel Method ◽  
Sol Gel Method ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Cdo Thin Films

CdO thin films were prepared by the sol-gel method, by using a precursor solution with cadmium acetate dihydrate as metal source. The films were obtained on slide-glass substrates and fired in open atmosphere at 200-450°C, at 50°C intervals. The X-ray data show that the films are polycrystalline with a NaCl cubic structure. The transmission of the films is 95-100% at wavelengths ≥600 nm, one of the highest obtained so far for CdO thin films. The atomic force microscopy results show that the grains coalesce, which results in morphology changes as the firing temperature increases. The resistivity showed its minimum value around 300°C (~10-3 Ω-cm).

Growth and Characterisation of Nanocrystalline ZnO Thin Films by Dip Coating Technique

2013 ◽  
Vol 832 ◽  
pp. 368-373
Author(s):  
Mohd Firdaus Malek ◽  
Mohamad Hafiz Mamat ◽  
Mohd Zainizan Sahdan ◽  
Musa Mohamed Zaihidi ◽  
Zuraida Khusaimi ◽  
...  
Keyword(s):  
Thin Films ◽  
Zinc Acetate ◽  
Sol Gel ◽  
Homogeneous Solution ◽  
Nir Spectroscopy ◽  
Dip Coating ◽  
Zno Thin Films ◽  
Molar Ratio ◽  
Zno Films ◽  
Glass Substrates

Nanocrystalline zinc oxide (ZnO) thin films have been obtained by the sol gel process. A stable and homogeneous solution was prepared by dissolving zinc acetate dehydrate as a starting material in a solution of 2-methoxyethanol and monoethanolamine (MEA). The molar concentration of zinc acetate was fixed at 0.6 mol/L while the molar ratio of MEA to zinc acetate was kept at 1:1. The films were deposited by various deposition speeds by dip-coating on glass substrates, and subsequently transformed into nanocrystalline pure ZnO films after a thermal treatment. Various deposition speeds were selected as the parameter to optimize the thin films quality. The structural and optical properties of the ZnO films were studied by X-ray diffraction (XRD), UV-Vis-NIR spectroscopy, respectively. The electrical properties of the ZnO thin films were characterised by dc 2 probing system and power supply (Advantest R6243). It was found that the deposition speed affects the resultant properties of ZnO thin films.

Microstructure, Optical and Photocatalytic Properties of TiO2 Thin Films Prepared by Chelating-Agent Assisted Sol–Gel Method

2016 ◽  
Vol 16 (1) ◽  
pp. 504-514 ◽  
Author(s):  
Lenka Matějová ◽  
Monika Cieslarová ◽  
Zdeněk Matěj ◽  
Stanislav Daniš ◽  
Pavlína Peikertová ◽  
...  
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Chelating Agent ◽  
Photocatalytic Properties ◽  
Tio2 Thin Films ◽  
Gel Method ◽  
Sol Gel Method
Sign in / Sign up

Export Citation Format

Share Document