An Improved BIST Algorithm Research
2014 ◽
Vol 926-930
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pp. 2959-2963
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This paper presents an improved algorithm of test vector based on GA and LFSR method, to improve the TPG first, then using GA and LFSR algorithm generate test vector, finally establish the algorithm to test vector for sorting, make the bit jump number of sorted sequence at least, and uses the improved output circuit TC test method are analyzed in the response, through the experimental data, verify the advantages of this scheme is to improve the test fault coverage, reduce power consumption and improve test speed.
2018 ◽
Vol 27
(05)
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pp. 1850078
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Keyword(s):
2014 ◽
Vol E97.B
(12)
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pp. 2698-2705
Keyword(s):
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1973 ◽
Vol BTR-19
(1)
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pp. 58-64
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