Development of High Speed Scanning System for the Fabrication of 3D Metal Parts Using Electron Beam Selective Melting Technology

2010 ◽  
Vol 97-101 ◽  
pp. 4001-4004
Author(s):  
Hai Bo Qi ◽  
Jian Qiang Wang ◽  
Li Ning Yang
Keyword(s):  
Electron Beam ◽  
High Speed ◽  
Scanning Speed ◽  
Scanning System ◽  
Scanning Method ◽  
Speed Up ◽  
Profile Vector ◽  
Point To Point ◽  
Electron Beam Selective Melting ◽  
Vector Scanning

In this article a method of high speed scanning in Electron Beam Selective Melting (EBSM) technology is presented. Based on the conventional point-to-point vector scanning method, a scanning method nominated profile vector scanning was developed in cooperation with the existing manufacturing system. A scanning speed up to 200m/s was realized using the improved system. 3D parts from 316L metal powder were fabricated using this scanning system and the quality of the fabricated parts was evaluated.

Scanning system development and digital beam control method for electron beam selective melting

2015 ◽  
Vol 21 (3) ◽  
pp. 313-321 ◽  
Author(s):  
Chao Guo ◽  
Jing Zhang ◽  
Jun Zhang ◽  
Wenjun Ge ◽  
Bo Yao ◽  
...  
Keyword(s):  
Electron Beam ◽  
Large Deflection ◽  
Control Method ◽  
Three Dimensional ◽  
Beam Deflection ◽  
Scanning System ◽  
Content Type ◽  
Metal Parts ◽  
Digital Scanning ◽  
Electron Beam Selective Melting

Purpose – The purpose of this paper is to correct the beam deflection errors and beam defocus by using a digital scanning system. Electron beam selective melting (EBSM) is an additive manufacturing technology for metal parts. Beam deflection errors and beam defocus at large deflection angles would greatly influence the accuracy of the built parts. Design/methodology/approach – The 200 × 200 mm2 scanning area of the electron beam is discretized into 1001 × 1001 points arranged in array, based on which a digital scanning system is developed. To correct the deflection errors, the electron beam scans a 41 × 41 testing grid, and the corrective algorithm is based on the bilinear transformation from the grid points’ nominal coordinates to their measured coordinates. The beam defocus is corrected by a dynamic focusing method. A three-dimensional testing part is built with and without using the corrective algorithm, and their accuracies are quantitatively compared. Findings – The testing grid scanning result shows that the accuracy of the corrected beam deflection system is better than ± 0.2 mm and beam defocus at large deflection angles is eliminated visibly. The testing part built with using the corrective algorithm is of greater accuracy than the one built without using it. Originality/value – Benefiting from the digital beam control method, the model-to-part accuracy of the system is effectively improved. The digital scanning system is feasible in rapid manufacturing large and complex three-dimensional metal parts.

Smart Scanning Ion-Conductance Microscopy Imaging Technique Using Horizontal Fast Scanning Method

2018 ◽  
Vol 24 (3) ◽  
pp. 264-276 ◽  
Author(s):  
Jian Zhuang ◽  
Zhiwu Wang ◽  
Zeqing Li ◽  
Pengbo Liang ◽  
Mugubo Vincent
Keyword(s):  
High Speed ◽  
Imaging System ◽  
Scanning Speed ◽  
Transverse Motion ◽  
Acquisition Time ◽  
Microscopy Imaging ◽  
Ion Conductance ◽  
Scanning Method ◽  
Scanning Ion Conductance Microscopy

AbstractTo solve extended acquisition time issues inherent in the conventional hopping-scanning mode of scanning ion-conductance microscopy (SICM), a new transverse-fast scanning mode (TFSM) is proposed. Because the transverse motion in SICM is not the detection direction and therefore presents no collision problem, it has the ability to move at high speed. In TSFM, the SICM probe gradually descends in the vertical/detection direction and rapidly scans in the transverse/nondetection direction. Further, the highest point that decides the hopping height of each scanning line can be quickly obtained. In conventional hopping mode, however, the hopping height is artificially set without a priori knowledge and is typically very large. Consequently, TFSM greatly improves the scanning speed of the SICM imaging system by effectively reducing the hopping height of each pixel. This study verifies the feasibility of this novel scanning method via theoretical analysis and experimental study, and compares the speed and quality of the scanning images obtained in the TFSM with that of the conventional hopping mode. The experimental results indicate that the TFSM method has a faster scanning speed than other SICM scanning methods while maintaining the quality of the images. Therefore, TFSM provides the possibility to quickly obtain high-resolution three-dimensional topographical images of extremely complex samples.

Scanning x-ray fluorescence microscopy and principal component analysis

1992 ◽  
Vol 50 (2) ◽  
pp. 1752-1753
Author(s):  
Brian Cross
Keyword(s):  
Principal Component Analysis ◽  
Fluorescence Microscopy ◽  
Spatial Resolution ◽  
High Speed ◽  
Image Acquisition ◽  
Principal Component ◽  
Fluorescence Microscope ◽  
Acquisition Rate ◽  
X Ray ◽  
Speed Up

A relatively new entry, in the field of microscopy, is the Scanning X-Ray Fluorescence Microscope (SXRFM). Using this type of instrument (e.g. Kevex Omicron X-ray Microprobe), one can obtain multiple elemental x-ray images, from the analysis of materials which show heterogeneity. The SXRFM obtains images by collimating an x-ray beam (e.g. 100 μm diameter), and then scanning the sample with a high-speed x-y stage. To speed up the image acquisition, data is acquired "on-the-fly" by slew-scanning the stage along the x-axis, like a TV or SEM scan. To reduce the overhead from "fly-back," the images can be acquired by bi-directional scanning of the x-axis. This results in very little overhead with the re-positioning of the sample stage. The image acquisition rate is dominated by the x-ray acquisition rate. Therefore, the total x-ray image acquisition rate, using the SXRFM, is very comparable to an SEM. Although the x-ray spatial resolution of the SXRFM is worse than an SEM (say 100 vs. 2 μm), there are several other advantages.

Image quality vs data obtainment in biological electron microscopy

1986 ◽  
Vol 44 ◽  
pp. 42-43
Author(s):  
J. E. Johnson
Keyword(s):  
Electron Microscopy ◽  
Endoplasmic Reticulum ◽  
Electron Beam ◽  
Image Quality ◽  
High Speed ◽  
Early Period ◽  
Early Years ◽  
Fluorescent Screen ◽  
Embedding Medium

In the early years of biological electron microscopy, scientists had their hands full attempting to describe the cellular microcosm that was suddenly before them on the fluorescent screen. Mitochondria, Golgi, endoplasmic reticulum, and other myriad organelles were being examined, micrographed, and documented in the literature. A major problem of that early period was the development of methods to cut sections thin enough to study under the electron beam. A microtome designed in 1943 moved the specimen toward a rotary “Cyclone” knife revolving at 12,500 RPM, or 1000 times as fast as an ordinary microtome. It was claimed that no embedding medium was necessary or that soft embedding media could be used. Collecting the sections thus cut sounded a little precarious: “The 0.1 micron sections cut with the high speed knife fly out at a tangent and are dispersed in the air. They may be collected... on... screens held near the knife“.

HIGH SPEED ELECTRON BEAM THERAPY

1967 ◽  
Vol 99 (4) ◽  
pp. 932-938 ◽  
Author(s):  
A. ZUPPINGER
Keyword(s):  
Electron Beam ◽  
High Speed ◽  
Electron Beam Therapy

scholarly journals Variable step control to improve scanning speed of gene sequencing stage

2021 ◽  
pp. 002029402110022
Author(s):  
Xiaohua Zhou ◽  
Jianbin Zheng ◽  
Xiaoming Wang ◽  
Wenda Niu ◽  
Tongjian Guo
Keyword(s):  
Motion Control ◽  
High Precision ◽  
High Speed ◽  
Stable State ◽  
Gene Sequencing ◽  
Scanning Speed ◽  
Settling Time ◽  
Step Motion ◽  
Variable Step ◽  
Step Control

High-speed scanning is a huge challenge to the motion control of step-scanning gene sequencing stage. The stage should achieve high-precision position stability with minimal settling time for each step. The existing step-scanning scheme usually bases on fixed-step motion control, which has limited means to reduce the time cost of approaching the desired position and keeping high-precision position stability. In this work, we focus on shortening the settling time of stepping motion and propose a novel variable step control method to increase the scanning speed of gene sequencing stage. Specifically, the variable step control stabilizes the stage at any position in a steady-state interval rather than the desired position on each step, so that reduces the settling time. The resulting step-length error is compensated in the next acceleration and deceleration process of stepping to avoid the accumulation of errors. We explicitly described the working process of the step-scanning gene sequencer and designed the PID control structure used in the variable step control for the gene sequencing stage. The simulation was performed to check the performance and stability of the variable step control. Under the conditions of the variable step control where the IMA6000 gene sequencer prototype was evaluated extensively. The experimental results show that the real gene sequencer can step 1.54 mm in 50 ms period, and maintain a high-precision stable state less than 30 nm standard deviation in the following 10 ms period. The proposed method performs well on the gene sequencing stage.

An automatic high-speed scanner for moiré fringe techniques

1972 ◽  
Vol 7 (2) ◽  
pp. 151-156 ◽  
Author(s):  
D J Hitchings ◽  
A R Luxmoore
Keyword(s):  
High Speed ◽  
Peak Detection ◽  
Optical Signal ◽  
Single Line ◽  
Scanning System ◽  
Moiré Fringes ◽  
Moire Fringe ◽  
Scanning Line ◽  
Moiré Fringe

A high-speed scanning system has been developed to locate the centres of moiré fringes along any single line. The system comprises a rotating-mirror scanner for conversion of an optical signal to electrical; this conversion is followed by peak detection, storage, and print-out electronics. Up to 20 fringes can be scanned in 1 ms. The results are printed in terms of fringe separations along the scanning line.

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