XPS Research on SrTiO3-Based Voltage-Sensitive Material
2008 ◽
Vol 368-372
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pp. 535-537
Keyword(s):
X Ray
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SrTiO3-based voltage-sensitive material was prepared successfully. The structure and properties were investigated using scanning electron microscopy, X-ray diffraction and X-ray photoelectron spectroscopy. It was observed that the average grain size was greater than 3μm and a cubic perovskite structure was obtained. XPS analysis of oxygen indicated that there existed multiform chemical state oxygen at the surface of the grain. Further researches shown that there were a few [AO12] polyhedrons and many cation vacancies in the material discussed, which demonstrated that a lot of oxygen volatilized and a well-known semiconductivity level was achieved.
2010 ◽
Vol 177
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pp. 9-11
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2007 ◽
Vol 353-358
◽
pp. 1477-1480
2012 ◽
Vol 557-559
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pp. 489-492