Sub-Surface Residual Stress Gradients: Advances in Laboratory XRD Methods
2006 ◽
Vol 524-525
◽
pp. 25-30
◽
Keyword(s):
X Ray
◽
A new algorithm is proposed to determine the through-thickness residual stress gradient by X-ray Diffraction measurements on progressively thinned components. The procedure is based on a chemical or electrochemical attack of the component surface, which is then measured at each thinning stage. The simple algorithm provided for by a specific norm has been revised to take into account the X-ray absorption effects and the conditions of mechanical equilibrium of the component. The new procedure is illustrated for a typical case of study concerning a shot-peened metal component.
2014 ◽
Vol 996
◽
pp. 181-186
◽
2013 ◽
Vol 768-769
◽
pp. 707-713
2006 ◽
Vol 514-516
◽
pp. 1618-1622
◽
2013 ◽
Vol 768-769
◽
pp. 420-427
◽