A Comparative Study of the Morphology of 3C-SiC Grown at Different C/Si Ratios

2009 ◽  
Vol 615-617 ◽  
pp. 153-156 ◽  
Author(s):  
Giovanni Attolini ◽  
Bernard Enrico Watts ◽  
Matteo Bosi ◽  
Francesca Rossi ◽  
Ferenc Riesz
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Growth Rate ◽  
Comparative Study ◽  
Surface Defects ◽  
Force Microscopy ◽  
Atomic Force ◽  
Silane Precursor ◽  
Sic Films ◽  
Scanning Electron

A comparative study of the morphology of 3C-SiC films prepared with different C:Si ratios is presented. The silane precursor controls the growth rate at all values of C:Si ratio but combined of observations using Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) indicates that the C:Si ratio is critical in determining the grain size and at values of C:Si close to 1 texturing and faceting become evident. Makyoh Topography reveals various surface defects, a slight mesoscale roughness and bending of the epiwafers.

Comparative Study of Field Emission-Scanning Electron Microscopy and Atomic Force Microscopy to Assess Self-assembled Monolayer Coverage on Any Type of Substrate

1999 ◽  
Vol 5 (6) ◽  
pp. 413-419 ◽  
Author(s):  
Bernardo R.A. Neves ◽  
Michael E. Salmon ◽  
Phillip E. Russell ◽  
E. Barry Troughton
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Comparative Study ◽  
Field Emission ◽  
Self Assembled Monolayer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Self Assembled ◽  
Scanning Electron

Abstract: In this work, we show how field emission–scanning electron microscopy (FE-SEM) can be a useful tool for the study of self-assembled monolayer systems. We have carried out a comparative study using FE-SEM and atomic force microscopy (AFM) to assess the morphology and coverage of self-assembled monolayers (SAM) on different substrates. The results show that FE-SEM images present the same qualitative information obtained by AFM images when the SAM is deposited on a smooth substrate (e.g., mica). Further experiments with rough substrates (e.g., Al grains on glass) show that FE-SEM is capable of unambiguously identifying SAMs on any type of substrate, whereas AFM has significant difficulties in identifying SAMs on rough surfaces.

scholarly journals Corrosion Behavior and Mechanical Properties of a Nanocomposite Superhydrophobic Coating

Coatings ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 652
Author(s):  
Divine Sebastian ◽  
Chun-Wei Yao ◽  
Lutfun Nipa ◽  
Ian Lian ◽  
Gary Twu
Keyword(s):  
Electron Microscopy ◽  
Mechanical Properties ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Nanocomposite Coating ◽  
Superhydrophobic Coating ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Images ◽  
Scanning Electron

In this work, a mechanically durable anticorrosion superhydrophobic coating is developed using a nanocomposite coating solution composed of silica nanoparticles and epoxy resin. The nanocomposite coating developed was tested for its superhydrophobic behavior using goniometry; surface morphology using scanning electron microscopy and atomic force microscopy; elemental composition using energy dispersive X-ray spectroscopy; corrosion resistance using atomic force microscopy; and potentiodynamic polarization measurements. The nanocomposite coating possesses hierarchical micro/nanostructures, according to the scanning electron microscopy images, and the presence of such structures was further confirmed by the atomic force microscopy images. The developed nanocomposite coating was found to be highly superhydrophobic as well as corrosion resistant, according to the results from static contact angle measurement and potentiodynamic polarization measurement, respectively. The abrasion resistance and mechanical durability of the nanocomposite coating were studied by abrasion tests, and the mechanical properties such as reduced modulus and Berkovich hardness were evaluated with the aid of nanoindentation tests.

scholarly journals Структура и механизмы образования наноразмерных пленок примесного металла кобальта и никеля в монокристаллах LiF и MgF-=SUB=-2-=/SUB=-

2021 ◽  
Vol 63 (9) ◽  
pp. 1340
Author(s):  
Н.А. Иванов ◽  
С.А. Небогин ◽  
С.С. Колесников ◽  
Л.И. Брюквина
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Etch Pits ◽  
Force Microscopy ◽  
Thermal Etching ◽  
Air Atmosphere ◽  
Atomic Force ◽  
Residual Air ◽  
Scanning Electron ◽  
Cobalt And Nickel

It is investigated the thermal etching of LiF and MgF2 crystals with cobalt and nickel impurities by means of scanning electron microscopy and atomic force microscopy with using decorating. It is shown that impurity inclusions leave the crystal from dislocations. The differences between of thermal etching in vacuum and air atmosphere take place. The crystallographic oriented terraced etch pits are formed after exit of impurities from dislocations. The square thermal etch pits are formed after thermal etching at 750°C in air. The surface impurity nanoscale film is formed at thermal etching. The oxidation of surface impurities observed at thermal etching in air atmosphere or in residual air atmosphere.

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