Preparation and Characterization of Innate Super-Hydrophilic TiO2/SiO2 Thin Films

2013 ◽  
Vol 743-744 ◽  
pp. 372-376 ◽  
Author(s):  
Huan Yang ◽  
Kai Bo Shen ◽  
Jian Liu ◽  
Wei Wang ◽  
Yue Huang ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Fumed Silica ◽  
Force Microscopy ◽  
Atomic Force ◽  
Inorganic Thin Films ◽  
Solgel Method ◽  
Scanning Electron

Unlike photo-induced super-hydrophilic inorganic thin films, non-photoinduced innate super-hydrophilic TiO2/SiO2 thin films have been successfully prepared in this work. SiO2/TiO2 thin films were prepared by solgel method via adding hydrophilic fumed silica to TiO2 sol and characterized by atomic force microscopy (AFM), scanning electron microscopy (SEM) and contact angle meter. The results show that the super-hydrophilicity of the as-prepared thin films can maintain for one month without light irradiation, and the thin films have excellent antifogging property as well.

Characterization of Multiple Functional Solid Line of Graphite Ink Surface Printed by Micro-Flexographic

2015 ◽  
Vol 752-753 ◽  
pp. 1379-1383
Author(s):  
M.I. Maksud ◽  
Mohd Sallehuddin Yusof ◽  
Zaidi Embong
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Photoelectron Spectroscopy ◽  
Printing Plate ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Flexographic Printing ◽  
Scanning Electron

The purpose of this paper is to study a ink surface morphology, quantify the chemical composition involved in processing of graphite ink printed by flexographic printing. The methodology is to use surface sensitive technique, X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) and Field Emission Scanning Electron Microscopy (FESEM). As a finding we successfully achieved 25 micron lines array using PDMS printing plate. The Originality and value of this work is surface sensitive techniques like XPS, AFM and FESEM were exclusively used in order to characterize graphite inks printed by flexographic method, using PDMS printing plate.

Fabrication and Characterization of Polyaniline–ZnO Hybrid Nanocomposite Thin Films

2008 ◽  
Vol 8 (4) ◽  
pp. 1757-1761 ◽  
Author(s):  
Ajeet Kaushik ◽  
Jitendra Kumar ◽  
M. K. Tiwari ◽  
R. Khan ◽  
B. D. Malhotra ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanocomposite Thin Films ◽  
Scanning Electron

Polyaniline (PANI)–ZnO nanocomposite thin film has been successfully fabricated on glass substrates by using vacuum deposition technique. The as-grown PANI–ZnO nanocomposite thin films have been characterized using X-ray diffraction, Scanning Electron Microscopy, Atomic Force Microscopy, UV-visible spectrophotometer and Fourier Transform Infrared (FTIR) spectroscopy, respectively. X-ray diffraction of as-grown film shows the reflection of ZnO nanoparticles along with a broad peak of PANI. The surface morphology of nanocomposite films has been investigated using scanning electron microscopy and atomic force microscopy. The hypsochromic shift of the UV absorption band corresponding to π–π* transition in polymeric chain of PANI and a band at 504 cm –1 due to ZnO nanoparticles has been observed in the FTIR spectra. The hydrogen bonding between the imine group of PANI and ZnO nanoparticle has been confirmed from the presence of the absorbance band at 1151 cm–1 in the FTIR spectra of the nanocomposite thin films.

Effect of TiO2 Nanofiller on Nanocomposited PMMA/TiO2 Thin Film

2012 ◽  
Vol 576 ◽  
pp. 417-420 ◽  
Author(s):  
N.N. Hafizah ◽  
Ismail Lyly Nyl ◽  
M.Z. Musa ◽  
Mohamad Rusop Mahmood
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Spin Coating ◽  
Weight Percentage ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanocomposite Thin Films ◽  
Scanning Electron

In this study, PMMA/TiO2 nanocomposite thin films were prepared by using sonication spin coating technique. The PMMA and TiO2 solution were mixed together and sonicated for 1h to confirm the homogeneity of the sample. The thin films obtained were then measured using atomic force microscopy (AFM), field emission scanning electron microscopy (FESEM) and Fourier transform infrared (FTIR). FESEM micrograph reveals that the uniformity increases with the increase of TiO2 weight percentage.

Physical Properties of Nano-Structured Zinc Oxide Thin Films Deposited by Radio-Frequency Magnetron Sputtering

2013 ◽  
Vol 667 ◽  
pp. 495-500 ◽  
Author(s):  
I. Saurdi ◽  
Mohamad Hafiz Mamat ◽  
Mohamad Rusop
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Particle Size ◽  
Atomic Force Microscopy ◽  
Zno Thin Films ◽  
Force Microscopy ◽  
Atomic Force ◽  
Substrate Temperatures ◽  
Scanning Electron

In this work, ZnO thin films were deposited by RF Magnetron sputtering at different substrate temperatures in the range of 100-400oC on glass substrate. The thin films were characterized using field emission scanning electron microscopy (FESEM), atomic force microscopy (AFM), and I-V measurement, for morphology and electrical properties study. Field emission scanning electron microscopy (FESEM) and atomic force microscopy (AFM) were used to study the structural and morphology of the thin films. The particle size varied from 41nm to 146nm showing that the nucleation of ZnO thin films as the substrate temperatures increased. Higher particle size was observed as the substrate temperatures increased up to 400oC as well as high conductivity of thin films at 400oC.

Sign in / Sign up

Export Citation Format

Share Document