Thickness Effect and Mesoscopic Character of the Metal Oxide Gas Sensing Nano-Thin Films

2007 ◽  
Vol 121-123 ◽  
pp. 1341-1346
Author(s):  
Jian Ping Xing ◽  
Juan Li ◽  
Lei Zhou ◽  
Jian Ming Li ◽  
Nan Yuan Qiu
Keyword(s):  
Thin Films ◽  
Metal Oxide ◽  
Film Thickness ◽  
Characteristic Time ◽  
Gas Sensing ◽  
Diffusion Reaction ◽  
Thickness Effect ◽  
Optimum Thickness ◽  
Sensing Mechanism ◽  
Activity Energy

The characters of metal oxide gas sensing nano-thin films are studied. The formula of the dynamical thickness effect characteristic time is given. The relation of the sensitivity Sn and the film thickness l, the character of existing the optimum thickness, the character of the change of conductance activity energy with the film thickness are given also. The idea of diffusion reaction of gas sensing mechanism and the idea of mesoscopic effect in the nano-thin films are proposed.

Thickness Effect and Mesoscopic Character of the Metal Oxide Gas Sensing Nano-Thin Films

2007 ◽  
pp. 1341-1346
Author(s):  
Jian Ping Xing ◽  
Juan Li ◽  
Lei Zhou ◽  
Jian Ming Li ◽  
Nan Yuan Qiu
Keyword(s):  
Thin Films ◽  
Metal Oxide ◽  
Gas Sensing ◽  
Thickness Effect

Diffusion-reaction theory for conductance response in metal oxide gas sensing thin films

2000 ◽  
Vol 66 (1-3) ◽  
pp. 228-231 ◽  
Author(s):  
Honglong Lu ◽  
Wencai Ma ◽  
Jianhua Gao ◽  
Jianming Li
Keyword(s):  
Thin Films ◽  
Metal Oxide ◽  
Gas Sensing ◽  
Diffusion Reaction ◽  
Reaction Theory

Dependence of Film Thickness on Properties of Al Doped ZnO Thin Films

2011 ◽  
Vol 194-196 ◽  
pp. 2305-2311
Author(s):  
Ying Ge Yang ◽  
Dong Mei Zeng ◽  
Hai Zhou ◽  
Wen Ran Feng ◽  
Shan Lu ◽  
...  
Keyword(s):  
Thin Films ◽  
Film Thickness ◽  
Electrical Parameter ◽  
Substrate Surface ◽  
Rf Magnetron Sputtering ◽  
Thickness Effect ◽  
Visible Range ◽  
Glass Substrates ◽  
Doped Zno

In this study high quality of Al doped ZnO (ZAO) thin films were prepared by RF magnetron sputtering on glass substrates at room temperature in order to study the thickness effect upon their structure, electrical and optical properties. XRD results show that the films are polycrystalline and with strongly preferred (002) orientation perpendicular to substrate surface whatever the thickness is. The crystallite size was calculated by Williamson-Hall method, while it increases as the film thickness increased. The lattice stress is mainly caused by the growth process. Hall measurements revealed electrical parameter very dependent upon thickness when the thickness of ZAO film is lower than 700 nm. The resistivity decreased and the carrier concentration and Hall mobility increases as the film thickness increased. When film thickness becomes larger, only a little change in the above properties was observed. All the films have high transmittance above 90% in visible range. Red shift of the absorption edge was observed as thickness increased. The optical energy bandgap decreased from 3.41eV to 3.30 eV with the increase of film thickness.

Film thickness effect on texture and residual stress sign transition in sputtered TiN thin films

2017 ◽  
Vol 43 (15) ◽  
pp. 11992-11997 ◽  
Author(s):  
Yeting Xi ◽  
Kewei Gao ◽  
Xiaolu Pang ◽  
Huisheng Yang ◽  
Xiaotao Xiong ◽  
...  
Keyword(s):  
Thin Films ◽  
Residual Stress ◽  
Film Thickness ◽  
Thickness Effect ◽  
Tin Thin Films

Palladium thin films on microfiber filtration paper as flexible substrate and its hydrogen gas sensing mechanism

2019 ◽  
Vol 44 (31) ◽  
pp. 17185-17194 ◽  
Author(s):  
Zahra Shahzamani ◽  
Mehdi Ranjbar ◽  
Elisabetta Comini ◽  
Mehdi Torabi Goodarzi ◽  
Hadi Salamati ◽  
...  
Keyword(s):  
Thin Films ◽  
Gas Sensing ◽  
Flexible Substrate ◽  
Hydrogen Gas ◽  
Sensing Mechanism

Carbon nanotube-metal oxide nanocomposite gas sensing mechanism assessed via NO2 adsorption on n-WO3/p-MWCNT nanocomposites

2020 ◽  
Vol 46 (18) ◽  
pp. 29233-29243 ◽  
Author(s):  
Nguyen Manh Hung ◽  
Nguyen Duc Chinh ◽  
Tien Dai Nguyen ◽  
Eui Tae Kim ◽  
GyuSeok Choi ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Metal Oxide ◽  
Gas Sensing ◽  
Sensing Mechanism ◽  
No2 Adsorption

Film Thickness Effect on Tensile Properties and Microstructures of Submicron Aluminum Thin Films on Polyimide

1996 ◽  
Vol 436 ◽  
Author(s):  
Y. S. Kang ◽  
P. S. Ho ◽  
R. Knipe ◽  
J. Tregilgas
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Film Thickness ◽  
Metal Film ◽  
Tensile Force ◽  
Thickness Effect ◽  
Published Data ◽  
Free Standing ◽  
Aluminum Films ◽  
Flexible Polymer

AbstractThe mechanical behavior of the metal film on a polymer substrate becomes an important issue in microelectronics metallization. The metal/polymer structure is also useful to investigate the deformation behavior of very thin free-standing metal film since the flexible polymer serves as a deformable substrate. The tensile force-elongation curves have been measured using a microtensile tester for aluminum thin films, deposited on a PMDA-ODA polyimide film, in the thickness range from 60 rum to 480 nm. The stress-strain curves for aluminum films were constructed by subtracting these curves with polyimide curves measured separately. Tensile strength increases linearly with decreasing film thickness from 196 MPa to 408 MPa within the film thickness range studied. This is in good agreement with the published data for free-standing aluminum films in the same thickness range. The measured Young's modulus is lower than the bulk modulus and exhibits no systematic dependence on the film thickness. The microstructures of aluminum films have been examined using a transmission electron microscope (TEM). These films posses the (111)-textured columnar grain structures. Grain sizes exhibit log-normal distributions and the mean grain size increases monotonically with the film thickness. An attempt is made to evaluate the effect of film thickness and grain size on the strength of aluminum thin film and the result is discussed.

Effect of Film Thickness on the Rheological Properties of Asphalts in Contact with Aggregate Surface

1998 ◽  
Vol 1638 (1) ◽  
pp. 31-39 ◽  
Author(s):  
Shin-Che Huang ◽  
Jan F. Branthaver ◽  
Raymond E. Robertson ◽  
Sang-Soo Kim
Keyword(s):  
Thin Films ◽  
Film Thickness ◽  
Rheological Properties ◽  
Thickness Effect ◽  
Asphalt Binders ◽  
Shear Rates ◽  
Service Environment ◽  
Asphalt Mix ◽  
Plate Geometry ◽  
Low Shear

The effect of the interaction between aggregate and asphalt on asphalt mix properties has been a subject of many studies. However, studies using compacted mixtures cannot isolate the pure effects of the asphalt-aggregate interactions, while studies using mixtures of asphalt and fines cannot determine the asphalt rheology at the interface. In this study, direct measurement of asphalt rheology at the interface is investigated using the sliding plate geometry with machined aggregate plates. Significant differences in the behavior of asphalts in contact with aggregate plates have been observed, especially at low shear rates. One asphalt shows substantial aggregate surface-induced structuring, while another asphalt shows essentially none. In addition, the film thickness effect on the rheological properties of asphalt binders and asphalt aggregate mixtures was investigated. The results strongly show that thin films of asphalt on an aggregate surface have substantially changed rheological properties that are asphalt composition–dependent, and that asphalts that are graded alike as bulk materials do not have the same rheological properties as thin films, in this service environment.

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