Application of Electron Backscatter Diffraction to Grain Boundaries
2010 ◽
Vol 160
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pp. 39-46
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Keyword(s):
The technique of electron backscatter diffraction (EBSD) is ideal for the characterisation of grain boundary networks in polycrystalline materials. In recent years the experimental methodology has evolved to meet the needs of the research community. For example, the capabilities of EBSD have been instrumental in driving forward the topic of ‘grain boundary engineering’. In this paper the current capabilities of EBSD for grain boundary characterisation will be reviewed and illustrated by examples. Topics are measurement strategies based on misorientation statistics, determination of grain boundary plane distributions and grain boundary network characteristics.
2010 ◽
Vol 667-669
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pp. 373-378
2004 ◽
Vol 20
(2)
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pp. 173-180
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2010 ◽
2005 ◽
Vol 495-497
◽
pp. 1225-1230
2013 ◽
Vol 46
(2)
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pp. 483-492
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2011 ◽
Vol 172-174
◽
pp. 378-383
2007 ◽
Vol 539-543
◽
pp. 3389-3394
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