Electron Microscope Investigation of PVD Coated Aluminium Alloy Surface Layer

2012 ◽  
Vol 186 ◽  
pp. 192-197 ◽  
Author(s):  
Tomasz Tański ◽  
Krzysztof Labisz
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Surface Layer ◽  
Electron Microscope ◽  
Aluminium Alloy ◽  
Aluminium Alloys ◽  
Wear Resistant ◽  
Electron Microscope Investigation ◽  
Microscope Investigation ◽  
Transmission Electron

The purpose of this work is electron microscope investigation of the Ti/TiCN/TiAlN and Cr/CrN/CrN coatings deposited by PVD process. The investigations were performed using scanning and transmission electron microscopy for the microstructure determination. By mind of the transmission electron microscopy the high resolution and phase determination was possible to obtain. The morphology was studied as well the lattice parameters for the layer matrix and substrate phase identification using diffraction methods was applied. After the coating of the aluminium alloys AlSi9Cu and AlSi9Cu4 with the selected coatings there are crystallites detected with the size of several tenth of diameter. The investigated samples were examined metallographically using electron microscope with different image techniques, also EDS microanalysis and electron diffraction was made. As an implication for the practice a new layer sequence can be possible to develop, based on PVD technique. Some other investigation should be performed in the future, but the knowledge found in this research shows an interesting investigation direction. The originality and value of this combination of TEM investigation for PVD deposited surface lasers on aluminium alloys makes the investigation very attractive for automotive and other industry branches. Some practical implications and employment of the surface treatment technology for elements, made from tool materials, with the PVD and CVD methods, to obtain the high wear resistant coatings, makes it possible to improve the properties of these materials by – among others – decreasing for example their friction coefficient, microhardness increase, improvement of the tribological contact conditions in practical use. One original value is it also to applied the PVD method on a common material like aluminium alloy. The double layer coatings worked out In the PVD process on the Al0Si-Cu alloys substrate hale the following configuration of the layers: bottom layer/gradient layer/wear resistant hard surface layer.

The distribution of condensed defect structures formed in annealed boron-implanted silicon

1969 ◽  
Vol 311 (1504) ◽  
pp. 75-78 ◽  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Surface Layer ◽  
Electron Beam ◽  
Electron Microscope ◽  
Turbulent Jet ◽  
Doping Profile ◽  
Defect Structures ◽  
Transmission Electron ◽  
Boron Ions

Silicon has been implanted with between 10 14 and 10 16 boron ions/cm 2 at energies of 25, 50, 75 and 100 keV; it has also been annealed at temperatures of between 873 and 1073 °K when the implanted boron ions occupy substitutional sites and form a ‘doped’ surface layer in which the doping profile can be accurately controlled, a desirable property in the manufacture of solid state circuits and devices (Large & Bicknell 1967). The implanted layers have been examined by both electron microscopy and electron diffraction before, during and after annealing to study the changes in crystal structures involved. For transmission electron microscope studies the silicon must be thinned to provide areas less than 1 p m in thickness, otherwise the electron beam is entirely absorbed within the specimen. It has been found that a modified form of jet etching using a turbulent jet enables large areas suitable for transmission electron microscopy to be easily produced from all types of specimens, both annealed and unannealed. Although specimens have been prepared and implanted with boron ions of different energies and doses the results discussed, which are typical of the range covered, are those obtained from silicon implanted with single energy 50 keV boron ions with a dose of 2 x 10 15 ions/cm 2 .

Transmission electron microscope investigation of indentation induced dislocation configurations on the (001) GaSb face

1994 ◽  
Vol 209 (3) ◽  
Author(s):  
J. Doerschel
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Room Temperature ◽  
Stacking Faults ◽  
Electron Microscope Investigation ◽  
Partial Dislocations ◽  
Transmission Electron ◽  
Induced Dislocation

AbstractDislocation configurations induced by room temperature microindentations on the (001) face of GaSb (undoped and Te-doped) have been studied using high voltage transmission electron microscopy. Perfect and partial dislocations could be found in all four arms of the dislocation rosette around the indent. Microtwins and rarely single stacking faults are associated with the partials. Contrary to other binary III–V compounds, an “inverse” glide prism along the [1[unk]0]/[[unk]10] rosette arms is created and it is bounded by {111}

Studies in the genus Strossmayeria (Helotiales). 5. Conidia and conidiogenesis in Pseudospiropes: a light and electron microscope investigation

1985 ◽  
Vol 63 (2) ◽  
pp. 195-200 ◽  
Author(s):  
Teresita Iturriaga ◽  
Herbert W. Israel
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Light Microscopy ◽  
Exterior Surface ◽  
Electron Microscope Investigation ◽  
Transmission Electron ◽  
Taxonomic Importance ◽  
Scanning Electron

Conidiogenesis and conidial morphology in two Pseudospiropes species, anamorphs of two unnamed Strossmayeria species, were studied using light microscopy and scanning electron microscopy, and for one of these, transmission electron microscopy. Conidiogenesis is clearly holoblastic. In these species there are approximately 10 cells per conidium, the apical and basal ones being darker than the others. A gel surrounds the conidium, and what probably is a gelatinous appendage is seen at its apex. The conidial wall is composed of at least eight layers, the exterior surface being distinctly poroid. There are columnar irregularities in the conidial walls. These morphological features have potential taxonomic importance.

Phenomena Associated with Oxygen in Titanium

1967 ◽  
Vol 25 ◽  
pp. 310-311
Author(s):  
E. U. Lee ◽  
P. A. Garner ◽  
J. S. Owens
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Microstructural Changes ◽  
Electrolytic Polishing ◽  
Interstitial Impurities ◽  
Thin Foils ◽  
Transmission Electron ◽  
Iodide Titanium ◽  
Alpha Titanium

Evidence for ordering (1-6) of interstitial impurities (O and C) has been obtained in b.c.c. metals, such as niobium and tantalum. In this paper we report the atomic and microstructural changes in an oxygenated c.p.h. metal (alpha titanium) as observed by transmission electron microscopy and diffraction.Oxygen was introduced into zone-refined iodide titanium sheets of 0.005 in. thickness in an atmosphere of oxygen and argon at 650°C, homogenized at 800°C and furnace-cooled in argon. Subsequently, thin foils were prepared by electrolytic polishing and examined in a JEM-7 electron microscope, operated at 100 KV.

The 1-MeV Electron Microscope Installation at the University of Colorado

1973 ◽  
Vol 31 ◽  
pp. 8-9 ◽  
Author(s):  
Mircea Fotino
Keyword(s):  
Electron Microscopy ◽  
Developmental Biology ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
National Institutes Of Health ◽  
Experimental Program ◽  
University Of Colorado ◽  
Transmission Electron ◽  
The University ◽  
Research Resources

A new 1-MeV transmission electron microscope (Model JEM-1000) was installed at the Department of Molecular, Cellular and Developmental Biology of the University of Colorado in Boulder during the summer and fall of 1972 under the sponsorship of the Division of Research Resources of the National Institutes of Health. The installation was completed in October, 1972. It is installed primarily for the study of biological materials without many of the limitations hitherto unavoidable in standard transmission electron microscopy. Only the technical characteristics of the installation are briefly reviewed here. A more detailed discussion of the experimental program under way is being published elsewhere.

Characterization of submicrometer fluid Inclusions in minerals by Analytical/Transmission Electron Microscopy and electron diffraction

1990 ◽  
Vol 48 (4) ◽  
pp. 424-424
Author(s):  
George Guthrie ◽  
David Veblen
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Electron Diffraction ◽  
Light Microscopy ◽  
Fluid Inclusions ◽  
Energy Dispersive Spectrometer ◽  
Analytical Transmission Electron Microscopy ◽  
Transmission Electron

The nature of a geologic fluid can often be inferred from fluid-filled cavities (generally <100 μm in size) that are trapped during the growth of a mineral. A variety of techniques enables the fluids and daughter crystals (any solid precipitated from the trapped fluid) to be identified from cavities greater than a few micrometers. Many minerals, however, contain fluid inclusions smaller than a micrometer. Though inclusions this small are difficult or impossible to study by conventional techniques, they are ideally suited for study by analytical/ transmission electron microscopy (A/TEM) and electron diffraction. We have used this technique to study fluid inclusions and daughter crystals in diamond and feldspar.Inclusion-rich samples of diamond and feldspar were ion-thinned to electron transparency and examined with a Philips 420T electron microscope (120 keV) equipped with an EDAX beryllium-windowed energy dispersive spectrometer. Thin edges of the sample were perforated in areas that appeared in light microscopy to be populated densely with inclusions. In a few cases, the perforations were bound polygonal sides to which crystals (structurally and compositionally different from the host mineral) were attached (Figure 1).

Structural Investigation of Iron Particles Used for Magnetic Recording Media

1980 ◽  
Vol 38 ◽  
pp. 406-407
Author(s):  
Alfred Baltz
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Structural Investigation ◽  
Magnetic Interaction ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Recording Medium ◽  
Iron Particles ◽  
Transmission Electron

As part of a program to develop iron particles for next generation recording disk medium, their structural properties were investigated using transmission electron microscopy and electron diffraction. Iron particles are a more desirable recording medium than iron oxide, the most widely used material in disk manufacturing, because they offer a higher magnetic output and a higher coercive force. The particles were prepared by a method described elsewhere. Because of their strong magnetic interaction, a method had to be developed to separate the particles on the electron microscope grids.

Microtexture of shock reaction products of niobium and silica mixtures

1999 ◽  
Vol 14 (7) ◽  
pp. 3169-3174 ◽  
Author(s):  
Reiko Murao ◽  
Masae Kikuchi ◽  
Kiyoto Fukuoka ◽  
Eiji Aoyagi ◽  
Toshiyuki Atou ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Shock Compression ◽  
Pressure Range ◽  
Reaction Products ◽  
Small Particles ◽  
Powder Mixtures ◽  
X Ray ◽  
Transmission Electron

Shock compression experiments on powder mixtures of niobium metal and quartz were conducted for the pressure range of 30–40 GPa by a 25-mm single-stage propellant gun. Chemical reaction occurred above 35 GPa, and products were found to be mainly so-called “Cu3Au-type” Nb3Si, which contained a small amount of oxygen. Microtextures of the specimen were examined by scanning and transmission electron microscopy. A field-emission transmission electron microscope was used for energy-dispersive x-ray analysis of microtextures in small particles found in the SiO2 matrix, and various species with different Nb/Si ratio and oxygen content were shown to be produced through the nonequilibrium process of shock compression.

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