scholarly journals In-situ Evaluation of Properties of Solid-Liquid Interface by Atomic Force Microscope.

1998 ◽  
Vol 35 (1) ◽  
pp. 31-39
Author(s):  
Ko HIGASHITANI ◽  
Yoichi KANDA
Keyword(s):  
Atomic Force Microscope ◽  
Liquid Interface ◽  
Atomic Force ◽  
Solid Liquid Interface ◽  
Solid Liquid

scholarly journals Directed nanoscale metal deposition by the local perturbation of charge screening at the solid–liquid interface

Nanoscale ◽  
2019 ◽  
Vol 11 (40) ◽  
pp. 18619-18627
Author(s):  
Mark Aarts ◽  
Esther Alarcon-Llado
Keyword(s):  
Atomic Force Microscope ◽  
Electrochemical Deposition ◽  
Metal Deposition ◽  
Liquid Interface ◽  
Electrochemical Reactions ◽  
Local Perturbation ◽  
Atomic Force ◽  
Solid Liquid Interface ◽  
Solid Liquid ◽  
Micrometer Scale

Understanding and directing electrochemical reactions below the micrometer scale is a long-standing challenge in electrochemistry. Here, we demonstrate the directed electrochemical deposition of copper nanostructures by using an oscillating nanoelectrode operated with an atomic force microscope.

scholarly journals Shining light on the solid–liquid interface: in situ/operando monitoring of surface catalysis

2020 ◽  
Vol 10 (16) ◽  
pp. 5362-5385
Author(s):  
Leila Negahdar ◽  
Christopher M. A. Parlett ◽  
Mark A. Isaacs ◽  
Andrew M. Beale ◽  
Karen Wilson ◽  
...  
Keyword(s):  
Liquid Interface ◽  
Solid Catalyst ◽  
Chemical Transformations ◽  
Liquid Interfaces ◽  
Surface Catalysis ◽  
Catalytically Active ◽  
Solid Liquid Interface ◽  
Solid Liquid ◽  
Insight Into

Many industrially important chemical transformations occur at the interface between a solid catalyst and liquid reactants. In situ and operando spectroscopies offer unique insight into the reactivity of such catalytically active solid–liquid interfaces.

Morphological Features of the Solid-Liquid Interface of a Gallium Film

1991 ◽  
Vol 237 ◽  
Author(s):  
Richard D. Robinson ◽  
Ioannis N. Miaoulis
Keyword(s):  
Preliminary Investigation ◽  
Zone Melting ◽  
Liquid Interface ◽  
Silicon Films ◽  
Processing Conditions ◽  
Scanning Velocity ◽  
Solidification Interface ◽  
Solid Liquid Interface ◽  
Solid Liquid

ABSTRACTThis paper presents a new experimental method to investigate solid-liquid interface morphologies during Zone-Melting-Recrystallization at lower than the typical processing temperatures. Gallium films were used as a substitute for silicon films. In situ preliminary investigation identified three phenomena typically occurring during ZMR of silicon films: a) Transition from planar to dendritic to cellular morphologies was observed for different processing conditions; b) cell period proved to be dependant on scanning velocity; c) instabilities at the solidification interface at low heating strip temperatures were caused by supercooling and optical property variations as the material changed phase.

In-situ observation of solid-liquid interface during directional solidification of succinonitrile and pivalic acid

2005 ◽  
Vol 16 (1-4) ◽  
pp. 107-110
Author(s):  
A. P. Shpak ◽  
O. P. Fedorov ◽  
E. L. Zhivolub ◽  
Y. J. Bersudskyy ◽  
O. V. Shuleshova
Keyword(s):  
Directional Solidification ◽  
Pivalic Acid ◽  
Liquid Interface ◽  
In Situ Observation ◽  
Solid Liquid Interface ◽  
Solid Liquid
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