scholarly journals Alternative approach to variable wavelength interferometry

2020 ◽  
Vol 12 (4) ◽  
pp. 112
Author(s):  
Dariusz Litwin ◽  
Kamil Radziak ◽  
Jacek Galas
Keyword(s):  
Classical Method ◽  
Incidence Angle ◽  
Visible Spectrum ◽  
Thickness Measurement ◽  
Optical Path Difference ◽  
Zero Order ◽  
Optical Systems ◽  
Fast Variable ◽  
Current Increase ◽  
Measurement Science

The paper presents an alternative technique of calculation the retardance of quartz waveplates. The technique utilizes continuously tuned wavelength, which identifies the zero-order fringe and simultaneously facilitates high repeatability of the optical path difference across the entire visible spectrum. Unlike in classical method, precise monitoring of the current increase or decrease of the interference order is not required. The discussion includes comparison of the standard deviation between the classical and novel approaches. Full Text: PDF ReferencesM. Pluta, Advanced Light Microscopy (Vol. 3, PWN, Elsevier, Warszawa-Amsterdam-London-New York-Tokyo, 1993). DirectLinkM. Pluta, "Object-adapted variable-wavelength interferometry. I. Theoretical basis", Journal of Opt. Soc. Am., A4(11), 2107 (1987). CrossRef M. Pluta, "Variable wavelength microinterferometry of textile fibres", J. Microscopy, 149(2), 97 (1988). CrossRef M. Pluta, "On double‐refracting microinterferometers which suffer from a variable interfringe spacing across the image plane", Journal of Microscopy, 145(2), 191 (1987). CrossRef M. Pluta, "Variable wavelength interferometry of birefringent retarders", Opt. Laser Technology, 19(3), 131 (1987). CrossRef D. Litwin, A. M. Sadik, "Computer-aided variable wavelength Fourier transform polarizing microscopy of birefringent fibers", Optica Applicata 28(2), 139 (1998). DirectLink A. Sadik, W. A. Ramadan, D. Litwin, "Variable incidence angle method combined with Pluta polarizing interference microscope for refractive index and thickness measurement of single-medium fibres", Measurement Science and Technology, IOP Publishing 14(10), 1753 (2003). CrossRef J. Galas, S. Sitarek; D. Litwin; M. Daszkiewicz, "Fringe image analysis for variable wavelength interferometry", Proc. SPIE 10445, 1044504 (2017). CrossRef D. Litwin, J. Galas, N. Błocki, "Automated variable wavelength interferometry in reflected light mode", Proc.SPIE 6188, 61880F (2006). CrossRef J. Galas, D. Litwin, M. Daszkiewicz, "New approach for identifying the zero-order fringe in variable wavelength interferometry", Proc. SPIE 10142, 101421R (2016). CrossRef D. Litwin, J. Galas, M. Daszkiewicz, T. Kryszczyński, A. Czyżewski, K. Radziak, "Dedicated optical systems of the Institute of Applied Optics", Phot. Lett. Pol., vol. 11, no. 2, pp. 29-31, (2019). CrossRef D. Litwin, K. Radziak, J. Galas "A fast variable wavelength interferometer", Proc. SPIE 11581, 115810O, (2020). CrossRef

scholarly journals Dedicated optical systems of the Institute of Applied Optics

2019 ◽  
Vol 11 (2) ◽  
pp. 29 ◽  
Author(s):  
Dariusz Litwin ◽  
Jacek Galas ◽  
Marek Daszkiewicz ◽  
Tadeusz Kryszczyński ◽  
Adam Czyżewski ◽  
...  
Keyword(s):  
Incidence Angle ◽  
Science And Technology ◽  
High Vacuum ◽  
Polymeric Materials ◽  
Image Plane ◽  
Molecular Beams ◽  
Thickness Measurement ◽  
Optical Systems ◽  
Measurement Science ◽  
Applied Optics

The paper presents a collection of selected optical systems recently developed in the Institute of Applied Optics-INOS. The collection includes the family of techniques where the continuously modified wavelength facilitates high accuracy measurements of optical and geometrical features of the object in question i.e. the variable wavelength interferometry and confocal chromatic sensors. In addition, the paper refers to the construction of a new type of a spectrometer with rotating plasma and an illumination system supporting the road safety. Full Text: PDF ReferencesM. Pluta, Advanced Light Microscopy (Vol. 3, PWN, Elsevier, Warszawa-Amsterdam-London-New York-Tokyo, 1993). DirectLink M. Pluta, "Object-adapted variable-wavelength interferometry. I. Theoretical basis", Journal of Opt. Soc. Am., A4(11), 2107 (1987). CrossRef M. Pluta, "Variable wavelength microinterferometry of textile fibres", J. Microscopy, 149(2), 97 (1988). CrossRef M. Pluta, "On double‐refracting microinterferometers which suffer from a variable interfringe spacing across the image plane", Journal of Microscopy, 145(2), 191 (1987). CrossRef K. A. El-Farahaty, A. M. Sadik, A. M. Hezma, "Study of Optical and Structure Properties of Polyester (PET) and Copolyester (PETG) Fibers by Interferometry", International Journal of Polymeric Materials 56(7),715 (2007). CrossRef J. Galas, D. Litwin, M. Daszkiewicz, "New approach for identifying the zero-order fringe in variable wavelength interferometry", Proc. SPIE 10142, 101421R (2016). CrossRef A. Sadik, W. A. Ramadan, D. Litwin, "Variable incidence angle method combined with Pluta polarizing interference microscope for refractive index and thickness measurement of single-medium fibres", Measurement Science and Technology, IOP Publishing 14(10), 1753 (2003). CrossRef J. Galas, S. Sitarek; D. Litwin; M. Daszkiewicz, "Fringe image analysis for variable wavelength interferometry", Proc. SPIE 10445, 1044504 (2017). CrossRef D. Litwin, A. M. Sadik, "Computer-aided variable wavelength Fourier transform polarizing microscopy of birefringent fibers.", Optica Applicata 28(2), 139 (1998). DirectLink D. Litwin, J. Galas, N. Błocki, "Automated variable wavelength interferometry in reflected light mode", Proc.SPIE 6188, 61880F (2006). CrossRef M. Pluta, "Variable wavelength interferometry of birefringent retarders", Opt. Laser Technology, 19(3), 131 (1987). CrossRef K. Fladischer et al. "An ellipsoidal mirror for focusing neutral atomic and molecular beams", New journal of Physics, 12(3) 033018 (2010). CrossRef K. Fladischer et al. "An optical profilometer for characterizing complex surfaces under high vacuum conditions", Precision engineering Elsevier 32(3), 182 (2008). CrossRef A.E. Weeks et al. "Accurate surface profilometry of ultrathin wafers", Semiconductor Science and Technology", IOP Publishing, 22(9), 997 (2007). CrossRef D. Litwin et al. "Overview of the measuring systems where a continuously altered light source plays a key role: Part I", Proc. SPIE 10808, 10 8080B (2018). CrossRef D. Litwin et al. "Noise reduction in an optical emission spectrometer with rotating diffraction grating", Proc. SPIE 10142 101421Q (2016). CrossRef D. Litwin et al. "Photonics approach to traffic signs", Proc SPIE 10142 1014214, (2016). CrossRef

The imaging properties of electron beams in arbitrary static electromagnetic fields

1952 ◽  
Vol 245 (894) ◽  
pp. 155-187 ◽  
Keyword(s):  
Variational Equation ◽  
Chromatic Aberration ◽  
Relativistic Correction ◽  
Zero Order ◽  
Second Order ◽  
Optical Systems ◽  
Characteristic Functions ◽  
Tensor Calculus ◽  
Paraxial Ray ◽  
Imaging Properties

Electron-optical systems with curved axes—such as mass spectrographs and certain beta-ray spectrometers—have long been in practical use, but there has been available no complete theory of the aberrations of such systems. It is the object of the present paper to construct such a theory and to demonstrate, by an example, its application to practical problems. An appropriate co-ordinate system is set up by means of a ray-axis together with its normal and binormal. The electric and magnetic fields are then investigated with the help of tensor calculus; the variational principle of electron optics is also put into tensor form. The integrand of the variational equation may be separated into a series of polynomials, one of which determines the paraxial imaging properties of the system and the rest of which determine the aberrations. The condition is established for which, upon an appropriate transformation, either of the paraxial ray equations contains only one off-axis co-ordinate. Subsequent investigations are restricted to systems, which are termed ‘orthogonal’, for which this condition is satisfied. It is shown that, in a certain sense, no orthogonal electron-optical system can be wholly divergent. The second-order aberration and the zero-order and paraxial chromatic aberrations are then investigated by the method of perturbation characteristic functions. All formulae are given in their relativistic forms but their non-relativistic forms are indicated; formulae are therefore given for the calculation of the zero-order and paraxial relativistic correction. It is indicated to what extent one forfeits control over the second-order aberration—and hence over the paraxial chromatic aberration also—by specifying that the paraxial behaviour of rays should be Gaussian. As an example, the imaging properties of a helical beam moving in the field of a pair of coaxial cylindrical electrodes are calculated. There is also an appendix which gives formulae for the effect upon aberrations of a change in the aperture position.

Fabrication and characterization of multilayer supermirrors for hard X-ray optics

1998 ◽  
Vol 5 (3) ◽  
pp. 711-713 ◽  
Author(s):  
K. Yamashita ◽  
K. Akiyama ◽  
K. Haga ◽  
H. Kunieda ◽  
G. S. Lodha ◽  
...  
Keyword(s):  
Energy Band ◽  
Incidence Angle ◽  
Grazing Angle ◽  
Float Glass ◽  
Optical Systems ◽  
X Ray ◽  
Dc Sputtering ◽  
Fabrication And Characterization ◽  
Sputtering System

Multilayer supermirrors stacked with three sets of Pt/C combinations have been fabricated on a flat float-glass and conical replica foil mirror using a magnetron DC sputtering system, and applied to X-ray optical systems in the hard X-ray region. The design of the supermirror is optimized to obtain the highest integrated reflectivity in the energy band and at the grazing angle concerned. X-ray reflectivities of 30% in the 25–35 keV band at an incidence angle of 0.3° were obtained.

scholarly journals STUDY OF MECHANISMS OF LIGHT ABSORPTION IN TITANIUM DIOXIDE FILMS

2016 ◽  
Vol 11 (4) ◽  
pp. 50-55
Author(s):  
V. V. Novopashin ◽  
L. A. Skvortsov ◽  
M. I. Skvortsova
Keyword(s):  
Titanium Dioxide ◽  
Near Infrared ◽  
Stoichiometric Composition ◽  
Ionic Current ◽  
Visible Spectrum ◽  
Infrared Range ◽  
Current Increase ◽  
Titanium Dioxide Films ◽  
532 Nm ◽  
Near Infrared Range

This work is devoted to comparison of optical absorption value of titanium dioxide coatings obtained by means of reactive thermal evaporation (RTE) and its activated species (ARTE), as well as to study on the dependence of the absorption coefficient of the coatings on the process parameters. Special attention is paid to the study of the influence of the films nonstoichiometry on absorption in the visible and near-infrared ranges of the spectrum. The results allow concluding that the dominant mechanism responsible for absorption in titanium dioxide films in the near-infrared range of the spectrum is the deviation from the stoichiometric composition. This deviation is caused by the presence of defects in the coating structure such as oxygen vacancies (ions Ti3+), which are seen as electron traps. As oxygen pressure and ionic current increase, the absorption of titanium dioxide films is reduced, and films with a composition closer to stoichiometric are obtained. In turn, the absorption of titanium dioxide in the visible spectrum (at wavelengths of 532 nm and 670 nm) has less to do with defects in stoichiometry, in contrast to contaminating impurities contained in the starting material, in the vacuum chamber and in the jet gas.

scholarly journals One-Shot phase-recovery using a Cellphone RGB Camera on a Jamin-Lebedeff Microscope

2019 ◽  
Author(s):  
Benedict Diederich ◽  
Barbora Marsikova ◽  
Brad Amos ◽  
Rainer Heintzmann
Keyword(s):  
Phase Retrieval ◽  
Classical Method ◽  
Dry Mass ◽  
Optical Path Difference ◽  
Path Difference ◽  
Optical Path ◽  
Interference Microscopy ◽  
Reference Image ◽  
Single Shot ◽  
Phase Measurements

AbstractJamin-Lebedeff (JL) polarization interference microscopy is a classical method for determining the change in the optical path of transparent tissues. Whilst a differential interference contrast (DIC) microscopy interferes an image with itself shifted by half a point spread function, the shear between the object and reference image in a JL-microscope is about half the field of view. The optical path difference (OPD) between the sample and reference region (assumed to be empty) is encoded into a colour by white-light interference. From a colour-table, the Michel-Levy chart, the OPD can be deduced. In cytology JL-imaging can be used as a way to determine the OPD which closely corresponds to the dry mass per area of cells in a single image.Like in other interference microscopy methods (e.g. holography), we present a phase retrieval method relying on single-shot measurements only, thus allowing real-time quantitative phase measurements. This is achieved by adding several customized 3D-printed parts (e.g. rotational polarization-filter holders) and a modern cellphone with an RGB-camera to the Jamin-Lebedeff setup, thus bringing an old microscope back to life.The algorithm is calibrated using a reference image of a known phase object (e.g. optical fiber). A gradient-descent based inverse problem generates an inverse look-up-table (LUT) which is used to convert the measured RGB signal of a phase-sample into an OPD.To account for possible ambiguities in the phase-map or phase-unwrapping artifacts we introduce a total-variation based regularization. We present results from fixed and living biological samples as well as reference samples for comparison.

scholarly journals Optical Absorption of Plasmonic Cylindrical Gold Nanoparticle in Hexagonal Geometry

2018 ◽  
Vol 7 (4.30) ◽  
pp. 269
Author(s):  
Norasikin M Nasar ◽  
Rosmila Abdul- Kahar ◽  
Nor Shamsidah Amir Hamzah ◽  
Fahmiruddin Esa
Keyword(s):  
Solar Cell ◽  
Optical Absorption ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Incidence Angle ◽  
Silicon Layer ◽  
Visible Spectrum ◽  
Angle Of Incidence ◽  
Simulation Design ◽  
Cell Simulation

A high quality solar cell depends on how good the design of the solar cell can absorb light.  In this study, cylindrical gold nanoparticles were embedded into indium tin oxide (ITO) layer and silicon layer arranged in hexagonal geometry on plasmonic solar cell simulation design. The aim is to investigate the optical absorption percentage in terms of wavelength and angle of incidence for the solar cell design. The numerical results showed that the highest absorption has occurred in 480 nm in the range of visible spectrum. In this wavelength, the highest absorption occurred at the incidence angle of 48 degree.

Intelligent reduction of zero-order diffraction in Fourier optical systems

2005 ◽  
Vol 44 (10) ◽  
pp. 103602
Author(s):  
Yuexin Liu ◽  
Bo Wang ◽  
Ruyan Guo ◽  
Francis T. S. Yu
Keyword(s):  
Zero Order ◽  
Optical Systems ◽  
Order Diffraction
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