scholarly journals Linearity and Analog Performance Analysis of Double Gate Tunnel FET: Effect of Temperature and Gate Stack

2011 ◽  
Vol 2 (3) ◽  
pp. 185-200 ◽  
Author(s):  
Rakhi Narang ◽  
Manoj Saxena ◽  
Gupta ◽  
Mridula Gupta
2018 ◽  
Vol 7 (2) ◽  
pp. 259-267 ◽  
Author(s):  
Gaurav Dhiman ◽  
Rajeev Pourush ◽  
P. K. Ghosh

2011 ◽  
Vol 110-116 ◽  
pp. 1892-1899 ◽  
Author(s):  
Esmat Farzana ◽  
Shuvro Chowdhury ◽  
Rizvi Ahmed ◽  
M. Ziaur Rahman Khan

The performance and characteristics of Double Gate MOSFET with high dielectric constant (high-κ) gate stack have been analyzed and compared with those of conventional pure SiO2gate MOSFET. Quantum Ballistic Transport Model has been used to demonstrate the performance of the device in terms of threshold voltage, drain current in both low and high drain voltage regions and subthreshold swing. The effect of temperature on the threshold voltage and subthreshold characteristics has also been observed. This work reveals that improved performance of this structure can be achieved by scaling the gate length and illustrates its superiority over SiO2gate MOSFETs in achieving long-term ITRS goals.


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