Review of the ms. Electron backscatter diffraction (EBSD) based determination of crystallographic preferred orientation (CPO) in warm, coarse-grained ice: a case study, Storglaciären, Sweden

Abstract. Microstructures provide key insights into understanding the mechanical behavior of ice. Crystallographic preferred orientation (CPO) develops during plastic deformation as ice dynamically recrystallizes, with the dominance of intracrystalline glide on the basal plane. CPO patterns in fine-grained ice have been relatively well characterized and understood in experiments and nature, whereas CPO patterns in "warm" (T > −10 ºC), coarse-grained, natural ice remain enigmatic. Previous microstructural studies of coarse-grained ice have been limited to c-axis orientations using light optical measurements. We have developed a new sample preparation technique, by constructing composite sections, to allow us to use electron backscatter diffraction (EBSD) to obtain a representative, bulk CPO on coarse-grained ice. We suggest that a grain sampling bias of large, branching crystals that appear multiple times as island grains in thin section may result in the typical multiple maxima CPOs previously identified in warm, coarse-grained ice that has been subjected to prolonged shear. CPOs combined from multiple samples of highly sheared ice from Storglaciären provide a more comprehensive picture of the microstructure and yield a pronounced cluster of c-axes sub-normal to the shear plane and elongate or split in a plane normal to the shear direction, and a concomitant girdle of a-axes parallel to the shear plane with a maximum perpendicular to the shear direction. This pattern compares well with patterns produced by sub-sampling data sets from experimentally sheared ice at high homologous temperatures up to strains of ~ 1.5. Shear strains in the margin of Storglaciären are much higher than those in experimental work. At much lower natural strain rates, dynamic recrystallization, particularly grain boundary migration, may have been more effective so that the CPO has been continuously reset and represents a smaller, final fraction of the shear history, rather than the entire finite strain history.

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The deformation of plagioclase investigated using electron backscatter diffraction crystallographic preferred orientation data

Journal of Structural Geology ◽

10.1016/s0191-8141(01)00057-8 ◽

2002 ◽

Vol 24 (2) ◽

pp. 387-399 ◽

Cited By ~ 23

Author(s):

Tamsin Lapworth ◽

John Wheeler ◽

David J Prior

Keyword(s):

Electron Backscatter Diffraction ◽

Preferred Orientation ◽

Orientation Data ◽

Crystallographic Preferred Orientation ◽

Electron Backscatter ◽

Backscatter Diffraction

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Crystallographic preferred orientation (CPO) of gypsum measured by electron backscatter diffraction (EBSD)

Journal of Microscopy ◽

10.1111/j.1365-2818.2009.03292.x ◽

2009 ◽

Vol 236 (3) ◽

pp. 159-164 ◽

Cited By ~ 5

Author(s):

R.C. HILDYARD ◽

D.J. PRIOR ◽

E. MARIANI ◽

D.R. FAULKNER

Keyword(s):

Electron Backscatter Diffraction ◽

Preferred Orientation ◽

Crystallographic Preferred Orientation ◽

Electron Backscatter ◽

Backscatter Diffraction

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Electron backscatter diffraction determination of grain orientation and constituent phases

Wuhan University Journal of Natural Sciences ◽

10.1007/bf02841493 ◽

1999 ◽

Vol 4 (2) ◽

pp. 174-174

Author(s):

Chen Xiaomei ◽

Liu Jing ◽

Wang Jianbo ◽

Zhang Ruikang ◽

Wang Dahai ◽

...

Keyword(s):

Grain Orientation ◽

Electron Backscatter Diffraction ◽

Diffraction Determination ◽

Electron Backscatter ◽

Backscatter Diffraction

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Using electron backscatter diffraction to measure full crystallographic orientation in Antarctic land-fast sea ice

Journal of Glaciology ◽

10.1017/jog.2018.67 ◽

2018 ◽

Vol 64 (247) ◽

pp. 771-780 ◽

Cited By ~ 3

Author(s):

PAT WONGPAN ◽

DAVID J. PRIOR ◽

PATRICIA J. LANGHORNE ◽

KATHERINE LILLY ◽

INGA J. SMITH

Keyword(s):

Sea Ice ◽

Crystallographic Orientation ◽

Electron Backscatter Diffraction ◽

Preferred Orientation ◽

Angle Distribution ◽

Crystal Preferred Orientation ◽

Electron Backscatter ◽

Backscatter Diffraction ◽

First Time ◽

Platelet Ice

ABSTRACTWe have mapped the full crystallographic orientation of sea ice using electron backscatter diffraction (EBSD). This is the first time EBSD has been used to study sea ice. Platelet ice is a feature of sea ice near ice shelves. Ice crystals accumulate as an unconsolidated sub-ice platelet layer beneath the columnar ice (CI), where they are subsumed by the advancing sea–ice interface to form incorporated platelet ice (PI). As is well known, in CI the crystal preferred orientation comprises dominantly horizontal c-axes, while PI has c-axes varying between horizontal and vertical. For the first time, this study shows the a-axes of CI and PI are not random. Misorientation analysis has been used to illuminate the possible drivers of these alignments. In CI the misorientation angle distribution from random pairs and neighbour pairs of grains are indistinguishable, indicating the distributions are a consequence of crystal preferred orientation. Geometric selection during growth will develop the a-axis alignment in CI if ice growth in water is fastest parallel to the a-axis, as has previously been hypothesised. In contrast, in PI random-pair and neighbour-pair misorientation distributions are significantly different, suggesting mechanical rotation of crystals at grain boundaries as the most likely explanation.

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Application of Electron Backscatter Diffraction for Crystallographic Characterization of Tin Whiskers

Microscopy and Microanalysis ◽

10.1017/s143192761200044x ◽

2012 ◽

Vol 18 (4) ◽

pp. 876-884 ◽

Cited By ~ 3

Author(s):

Joseph R. Michael ◽

Bonnie B. McKenzie ◽

Donald F. Susan

Keyword(s):

Electron Backscatter Diffraction ◽

Growth Direction ◽

Tin Whiskers ◽

Physical Growth ◽

Final Choice ◽

Advantages And Disadvantages ◽

Electron Backscatter ◽

Backscatter Diffraction

AbstractUnderstanding the growth of whiskers or high aspect ratio features on substrates can be aided when the crystallography of the feature is known. This study has evaluated three methods that utilize electron backscatter diffraction (EBSD) for the determination of the crystallographic growth direction of an individual whisker. EBSD has traditionally been a technique applied to planar, polished samples, and thus the use of EBSD for out-of-surface features is somewhat more difficult and requires additional steps. One of the methods requires the whiskers to be removed from the substrate resulting in the loss of valuable physical growth relationships between the whisker and the substrate. The other two techniques do not suffer this disadvantage and provide the physical growth information as well as the crystallographic growth directions. The final choice of method depends on the information required. The accuracy and the advantages and disadvantages of each method are discussed.

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Reliability of high-resolution electron backscatter diffraction determination of strain and rotation variations using phase-only and cross correlation

Crystal Research and Technology ◽

10.1002/crat.201300217 ◽

2014 ◽

Vol 49 (4) ◽

pp. 195-203 ◽

Cited By ~ 2

Author(s):

T. Riedl ◽

H. Wendrock

Keyword(s):

High Resolution ◽

Cross Correlation ◽

Electron Backscatter Diffraction ◽

Diffraction Determination ◽

Resolution Electron ◽

Electron Backscatter ◽

Backscatter Diffraction

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Inherited Fabric in an Omphacite Symplectite: Reconstruction of Plastic Deformation under Ultra-High Pressure Conditions

Microscopy and Microanalysis ◽

10.1017/s1431927613001451 ◽

2013 ◽

Vol 19 (4) ◽

pp. 942-949 ◽

Cited By ~ 3

Author(s):

Florian Heidelbach ◽

Michael P. Terry

Keyword(s):

Orientation Relationship ◽

Electron Backscatter Diffraction ◽

Pure Shear ◽

Additional Component ◽

Western Gneiss Region ◽

Crystallographic Preferred Orientation ◽

Ultra High Pressure ◽

Shear Component ◽

Electron Backscatter ◽

Backscatter Diffraction

AbstractWe investigated an eclogitic gneiss from the Western Gneiss Region in Norway, which underwent subduction as part of Baltica lithosphere beneath Laurentia during the Scandian orogeny. Petrologic data indicate that the eclogite was deformed plastically at about 4 GPa and 800°C producing a strong macroscopic foliation and lineation. Whereas garnet remained largely stable during the retrograde uplift, omphacite was transformed statically into a symplectite consisting of lamellar diopside and plagioclase with more equant grains of hornblende and orthopyroxene. Measurements of the crystallographic preferred orientation with electron backscatter diffraction show that diopside and hornblende, as well as orthopyroxene, have a systematic orientation relationship with the macroscopic fabric, as well as the (presumed) orientation of the host omphacite. The orientation relationship between the chain silicates is very sharp with the crystallographic forms {100}, {010}, and ⟨001⟩ being parallel. Their bulk texture shows a maximum of ⟨001⟩ parallel to the lineation and girdles of {010} and {110} perpendicular to the lineation with maxima subparallel to the foliation corresponding to an L-type texture of the original omphacite and indicating constrictional strain with an additional component of pure shear/simple shear component.

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