scholarly journals Density-based Clustering using Automatic Density Peak Detection

Author(s):  
Huanqian Yan ◽  
Yonggang Lu ◽  
Heng Ma
Author(s):  
Xiaoyu Qin ◽  
Kai Ming Ting ◽  
Ye Zhu ◽  
Vincent CS Lee

A recent proposal of data dependent similarity called Isolation Kernel/Similarity has enabled SVM to produce better classification accuracy. We identify shortcomings of using a tree method to implement Isolation Similarity; and propose a nearest neighbour method instead. We formally prove the characteristic of Isolation Similarity with the use of the proposed method. The impact of Isolation Similarity on densitybased clustering is studied here. We show for the first time that the clustering performance of the classic density-based clustering algorithm DBSCAN can be significantly uplifted to surpass that of the recent density-peak clustering algorithm DP. This is achieved by simply replacing the distance measure with the proposed nearest-neighbour-induced Isolation Similarity in DBSCAN, leaving the rest of the procedure unchanged. A new type of clusters called mass-connected clusters is formally defined. We show that DBSCAN, which detects density-connected clusters, becomes one which detects mass-connected clusters, when the distance measure is replaced with the proposed similarity. We also provide the condition under which mass-connected clusters can be detected, while density-connected clusters cannot.


Symmetry ◽  
2019 ◽  
Vol 11 (7) ◽  
pp. 859 ◽  
Author(s):  
Lin

The Density Peak Clustering (DPC) algorithm is a new density-based clustering method. It spends most of its execution time on calculating the local density and the separation distance for each data point in a dataset. The purpose of this study is to accelerate its computation. On average, the DPC algorithm scans half of the dataset to calculate the separation distance of each data point. We propose an approach to calculate the separation distance of a data point by scanning only the neighbors of the data point. Additionally, the purpose of the separation distance is to assist in choosing the density peaks, which are the data points with both high local density and high separation distance. We propose an approach to identify non-peak data points at an early stage to avoid calculating their separation distances. Our experimental results show that most of the data points in a dataset can benefit from the proposed approaches to accelerate the DPC algorithm.


2015 ◽  
Vol 26 (6) ◽  
pp. 2800-2811 ◽  
Author(s):  
Xiao-Feng Wang ◽  
Yifan Xu

Common limitations of clustering methods include the slow algorithm convergence, the instability of the pre-specification on a number of intrinsic parameters, and the lack of robustness to outliers. A recent clustering approach proposed a fast search algorithm of cluster centers based on their local densities. However, the selection of the key intrinsic parameters in the algorithm was not systematically investigated. It is relatively difficult to estimate the “optimal” parameters since the original definition of the local density in the algorithm is based on a truncated counting measure. In this paper, we propose a clustering procedure with adaptive density peak detection, where the local density is estimated through the nonparametric multivariate kernel estimation. The model parameter is then able to be calculated from the equations with statistical theoretical justification. We also develop an automatic cluster centroid selection method through maximizing an average silhouette index. The advantage and flexibility of the proposed method are demonstrated through simulation studies and the analysis of a few benchmark gene expression data sets. The method only needs to perform in one single step without any iteration and thus is fast and has a great potential to apply on big data analysis. A user-friendly R package ADPclust is developed for public use.


Author(s):  
D. Vallett ◽  
J. Gaudestad ◽  
C. Richardson

Abstract Magnetic current imaging (MCI) using superconducting quantum interference device (SQUID) and giant-magnetoresistive (GMR) sensors is an effective method for localizing defects and current paths [1]. The spatial resolution (and sensitivity) of MCI is improved significantly when the sensor is as close as possible to the current paths and associated magnetic fields of interest. This is accomplished in part by nondestructive removal of any intervening passive layers (e.g. silicon) in the sample. This paper will present a die backside contour-milling process resulting in an edge-to-edge remaining silicon thickness (RST) of < 5 microns, followed by a backside GMR-based MCI measurement performed directly on the ultra-thin silicon surface. The dramatic improvement in resolving current paths in an ESD protect circuit is shown as is nanometer scale resolution of a current density peak due to a power supply shortcircuit defect at the edge of a flip-chip packaged die.


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