scholarly journals Investigations on the oxidation of Zn-coated steel cables

2021 ◽  
Vol 49 (3) ◽  
pp. 587-597
Author(s):  
Gustavo Pinto ◽  
F.J.G. Silva ◽  
A. Baptista ◽  
Raul Campilho ◽  
F. Viana
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Electron Probe ◽  
Steel Wire ◽  
Coated Steel ◽  
Steel Cable ◽  
Electron Probe Micro Analyzer ◽  
Steel Cables ◽  
Automotive Component Industry ◽  
Scanning Electron

The automotive component industry has been constantly being studying to improve its performance. Bowden cables are present in opening doors, moving windows and others. In braided cables formed by galvanized wires with Zn steel exposed to the usual environmental conditions, the generation of ZnO appears, a phenomenon known as "white corrosion". The investigation consisted of mitigating the causes of the ZnO formation. Scanning electron microscopy (SEM) and Electron Probe Micro-Analyzer (EPMA) technology, allowed to detect that the generation of ZnO was induced by the presence of nucleating elements of ZnO on the surface of the steel cable before galvanizing with Zn. The S, Cl and O became visible in the interface between coating and substrate. This allowed concluding, under the coating, there were harmful products capable of triggering the ZnO nucleation reaction. So, the storage and cleaning of the steel wire before galvanizing is essential to prevent the ZnO formation.

High Resolution Scanning Electron Microscopy

1991 ◽  
Vol 49 ◽  
pp. 478-479
Author(s):  
David Joy ◽  
James Pawley
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Electron Beam ◽  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Electron Probe ◽  
Impact Point ◽  
Interaction Volume ◽  
Scanning Electron

The scanning electron microscope (SEM) builds up an image by sampling contiguous sub-volumes near the surface of the specimen. A fine electron beam selectively excites each sub-volume and then the intensity of some resulting signal is measured. The spatial resolution of images made using such a process is limited by at least three factors. Two of these determine the size of the interaction volume: the size of the electron probe and the extent to which detectable signal is excited from locations remote from the beam impact point. A third limitation emerges from the fact that the probing beam is composed of a finite number of discrete particles and therefore that the accuracy with which any detectable signal can be measured is limited by Poisson statistics applied to this number (or to the number of events actually detected if this is smaller).

scholarly journals The Influence of A Mo Addition on the Interfacial Morphologies and Corrosion Resistances of Novel Fe-Cr-B Alloys Immersed in Molten Aluminum

Materials ◽  
2019 ◽  
Vol 12 (2) ◽  
pp. 256 ◽  
Author(s):  
Zicheng Ling ◽  
Weiping Chen ◽  
Weiye Xu ◽  
Xianman Zhang ◽  
Tiwen Lu ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Electron Probe ◽  
Molten Aluminum ◽  
Dendritic Structure ◽  
H13 Steel ◽  
X Ray ◽  
Transmission Electron ◽  
The Matrix ◽  
Scanning Electron

The influence of a Mo addition on the interfacial morphologies and corrosion resistances of novel Fe-Cr-B alloys in molten aluminum at 750 °C was systematically investigated using scanning electron microscopy, X-ray diffractometer, electron probe microanalysis, and transmission electron microscopy. The results indicated that Mo could not only strengthen the matrix but also facilitate the formation of borides. Furthermore, the microstructures of Mo-rich M2B boride changed from a local eutectic net-like structure to a typical coarse dendritic structure and a blocky hypereutectic structure with increasing Mo addition. This was true of the blocky Mo-rich M2B boride, rod-like Cr-rich M2B boride and the corrosion products, which had a synergistic effect on retarding of the diffusion of molten aluminum. Notably, the corrosion resistance of the Fe-Cr-B-Mo alloy, with an 8.3 wt.% Mo addition, was 3.8 times higher than that of H13 steel.

A comparative study of the morphology, chemical composition and weathering of rhyolitic and andesitic glass

Clay Minerals ◽  
1980 ◽  
Vol 15 (2) ◽  
pp. 165-173 ◽  
Author(s):  
J. H. Kirkman ◽  
W. J. McHardy
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
New Zealand ◽  
Chemical Composition ◽  
Electron Probe ◽  
Volcanic Glass ◽  
Chemical Activity ◽  
Rapid Rate ◽  
Bonding Characteristics ◽  
Scanning Electron

AbstractThe morphology of volcanic glass particles in rhyolitic and andesitic tephra of central North Island and Taranaki areas of New Zealand has been studied by scanning electron microscopy. Electron probe analyses of the glasses are compared with those of the clays to which they weather. Loss of silica characterizes the weathering of both glasses. The rapid rate of weathering of andesitic glass is attributed to its occurrence as fine, soft microlites and extensive substitution of Al for Si in the structure. Rhyolitic glass weathers more slowly because it occurs as hard and brittle particles containing relatively little alumina. It is suggested that the structure, chemical composition and chemical activity of allophane is governed largely by the chemical composition and bonding characteristics of the parent glass.

scholarly journals Conduction Processes in Thick Film Resistors. Part I

1976 ◽  
Vol 3 (3) ◽  
pp. 131-140 ◽  
Author(s):  
M. P. Ansell
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Thick Film ◽  
Electron Probe ◽  
Electronic Conduction ◽  
Borosilicate Glasses ◽  
Electron Probe Micro Analysis ◽  
Metal Group ◽  
Micro Analysis ◽  
Scanning Electron

The structures of three families of thick film resistors have been investigated by scanning electron microscopy and electron probe micro-analysis. The two principal components of the resistive glazes, that is the conducting pigment and the glassy binder, have been identified in each case. The pigments were found to be simple or ternary oxides of the Pt transition metal group and Pd/PdO/Ag alloys. The glassy binders were based on lead borosilicate glasses.A model for the electronic conduction processes through the glass and pigments is proposed on the basis of the observed physical structures, the measured electrical properties of resistors and the properties of the component resistor materials.Part I of the total paper is concerned with identifying the phases in various Thick Film Resistors and part II considers the conduction processes that are appropriate.

Dentin in Severe Fluorosis: a Quantitative Histochemical Study

2007 ◽  
Vol 86 (9) ◽  
pp. 857-861 ◽  
Author(s):  
F. Rojas-Sánchez ◽  
M. Alaminos ◽  
A. Campos ◽  
H. Rivera ◽  
M.C. Sánchez-Quevedo
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Dental Caries ◽  
Electron Probe Microanalysis ◽  
Electron Probe ◽  
Histochemical Study ◽  
Fluoride Exposure ◽  
Quantitative Electron Probe Microanalysis ◽  
Scanning Electron

Dentin responds to different alterations in the enamel with hypermineralization, and is a biomarker of fluoride exposure. We hypothesized that severe fluorosis would lead to hypermineralization of the dentin when the enamel was severely affected. We used scanning electron microscopy and quantitative electron-probe microanalysis to compare dentin and enamel from healthy and fluorotic teeth. The dentin in fluorotic teeth was characterized by a highly mineralized sclerotic pattern, in comparison with control teeth (p < 0.001) and fluorotic enamel lesions (p < 0.001). Enamel near the lesions showed hypercalcification in comparison with dentin (p < 0.001). In response to the effects of severe fluorosis in the enamel, the dentin showed hypermineralization, as found in other enamel disorders. The hypermineralization response of the dentin in our samples suggests that the mechanism of the response should be taken into account in dental caries and other dental disorders associated with severe fluorosis.

The general principles of scanning electron microscopy

1971 ◽  
Vol 261 (837) ◽  
pp. 45-50 ◽  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Electron Probe ◽  
Photographic Plate ◽  
Electron Gun ◽  
Beam Angle ◽  
Transmission Electron ◽  
Fluorescent Screen ◽  
Electron Lens ◽  
Scanning Electron

In the transmission electron microscope, as shown in figure 1 (Nixon 1962), the electron gun at the top illuminates the specimen with the beam angle controlled by the condenser lens. The lenses below the specimen are used to magnify the image of the specimen which is viewed on the final screen at many thousand times magnification. If a second electron gun is placed below the fluorescent screen at the bottom of the column and the electron beam is projected upwards through the same lenses this second electron source will be reduced in size by the same amount that the specimen image is magnified. This effect can be observed with both electron guns on at the same time and demonstrates the reversibility of rays through electron lens systems. In this way the resolved point in the specimen image on the fluorescent screen or on the photographic plate is equal to the focused electron probe in the plane of the specimen.

A Scanning Electron Microscopy and Electron Probe X-Ray Microanalysis (SEM-EPMA) of Pink Teeth

1988 ◽  
Vol 33 (6) ◽  
pp. 12576J ◽  
Author(s):  
Noriaki Ikeda ◽  
Goutaro Watanabe ◽  
Akira Harada ◽  
Tsuneo Suzuki
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Electron Probe ◽  
X Ray ◽  
Pink Teeth ◽  
Scanning Electron

Estimation of Interdiffusivities of the Pseudo NiAl Binary Phase Formed in a Nickel-based Superalloy by Pack Cementation

2005 ◽  
Vol 20 (9) ◽  
pp. 2340-2347 ◽  
Author(s):  
H. Wei ◽  
X.F. Sun ◽  
Q. Zheng ◽  
H.R. Guan ◽  
Z.Q. Hu ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Electron Probe ◽  
Pack Cementation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Binary Phase ◽  
Nickel Based Superalloy ◽  
Transmission Electron ◽  
Scanning Electron

The pseudo NiAl binary phase was formed in a nickel-based superalloy by pack cementation. Scanning electron microscopy, transmission electron microscopy, x-ray diffraction, electron probe microanalysis, and positron annihilation technique were used to characterize the pseudo NiAl binary phase. Based on reasonable assumptions, the chemical interdiffusivities of the pseudo NiAl binary phase were then assessed by means of the modified Wagner’s method. The results showed that the chemical interdiffusivities of the pseudo NiAl binary phase were about two orders of magnitude lower than those reported by others. The analysis indicated that the change in thermodynamic properties due to the additions of the microalloying atoms originally present in a superalloy could be responsible mainly for a decrease in chemical interdiffusivities.

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