scholarly journals Spatially resolved sorption of Cm(III) on crystalline rock: influence of surface roughness and mineralogy

2021 ◽  
Author(s):  
Maximilian Demnitz ◽  
Konrad Molodtsov ◽  
Stefan Schymura ◽  
Ariette Schierz ◽  
Katharina Müller ◽  
...  
2021 ◽  
Vol 1 ◽  
pp. 145-147
Author(s):  
Maximilian Demnitz ◽  
Konrad Molodtsov ◽  
Stefan Schymura ◽  
Ariette Schierz ◽  
Katharina Müller ◽  
...  

Abstract. Many countries will use deep geological repositories to dispose of highly active nuclear waste. Crystalline rock is a potential host rock because of its strong geotechnical stability, low permeability and low solubility; however, its inherent mineralogy is heterogeneous, consisting of a wide set of minerals in varying amounts. Therefore, there is a need for using sophisticated techniques that allow spatial resolution to characterize the nanostructure of such crystalline rock surfaces and the speciation of the actinides therein. As a representative for trivalent actinides, such as Am(III), Np(III), and Pu(III), which are expected to be present due to the reducing conditions encountered in a deep geological repository, we have chosen the actinide Cm(III). Cm(III) possesses excellent luminescence properties, which allows us to not only examine the sorption uptake but also the speciation of Cm(III) on the surface. We combined spatially resolved investigation techniques, such as vertical scanning interferometry, calibrated autoradiography, and Raman microscopy coupled to micro-focus time-resolved laser-induced luminescence spectroscopy (µTRLFS) (Molodtsov et al., 2019). Thus, we were able to correlate mineralogy, surface roughness, and grain boundary effects with radionuclide speciation, allowing us to identify important radionuclide retention processes and parameters (see Fig. 1). Investigations focused on granite from Eibenstock (Germany) and migmatised gneiss from Bukov (Czech Republic). Cm(III) sorption on the rock's constituting minerals – primarily feldspar, mica and quartz – was analyzed quantitatively and qualitatively. We observed that Cm(III) sorption uptake and speciation depends not only on the mineral phase but also the surface roughness (Demnitz et al., 2021). An increasing surface roughness leads to higher sorption uptake and a stronger coordination of the sorbed Cm(III). On the same mineral grains sorption differed significantly depending if an area exhibits a low or high surface roughness. In the case that one mineral phase dominates the sorption process, sorption of Cm(III) on other mineral phases will only occur at strong binding sites, typically where surface roughness is high. Areas of feldspar and quartz with high surface roughness additionally showed the formation of sorption species with particularly high sorption strength that could either be interpreted as Cm(III) incorporation species or ternary complexes on the mineral surface (Demnitz et al., 2021). We conclude that in addition to mineral composition, surface roughness needs to be adequately considered to describe interfacial speciation of contaminants and respective retention patterns for the safety assessments of nuclear waste repositories.


2022 ◽  
Vol 423 ◽  
pp. 127006
Author(s):  
M. Demnitz ◽  
K. Molodtsov ◽  
S. Schymura ◽  
A. Schierz ◽  
K. Müller ◽  
...  

2020 ◽  
Vol 500 (3) ◽  
pp. 3178-3193
Author(s):  
K A Otto ◽  
K-D Matz ◽  
S E Schröder ◽  
R Parekh ◽  
K Krohn ◽  
...  

ABSTRACT Alteration processes on asteroid and comet surfaces, such as thermal fracturing, (micrometeorite) impacts or volatile outgassing, are complex mechanisms that form diverse surface morphologies and roughness on various scales. These mechanisms and their interaction may differ on the surfaces of different bodies. Asteroid Ryugu and comet 67P/Churyumov–Gerasimenko, both, have been visited by landers that imaged the surfaces in high spatial resolution. We investigate the surface morphology and roughness of Ryugu and 67P/Churyumov–Gerasimenko based on high-resolution in situ images of 0.2 and 0.8 mm pixel resolution over an approximately 25 and 80 cm wide scene, respectively. To maintain comparability and reproducibility, we introduce a method to extract surface roughness descriptors (fractal dimension, Hurst exponent, joint roughness coefficient, root-mean-square slope, hemispherical crater density, small-scale roughness parameter, and Hapke mean slope angle) from in situ planetary images illuminated by LEDs. We validate our method and choose adequate parameters for an analysis of the roughness of the surfaces. We also derive the roughness descriptors from 3D shape models of Ryugu and orbiter camera images and show that the higher spatially resolved images result in a higher roughness. We find that 67P/Churyumov–Gerasimenko is up to 6 per cent rougher than Ryugu depending on the descriptor used and attribute this difference to the different intrinsic properties of the materials imaged and the erosive processes altering them. On 67P/Churyumov–Gerasimenko sublimation appears to be the main cause for roughness, while on Ryugu micrometeoroid bombardment as well as thermal fatigue and solar weathering may play a significant role in shaping the surface.


Author(s):  
David C. Joy

Electron channeling patterns (ECP) were first found by Coates (1967) while observing a large bulk, single crystal of silicon in a scanning electron microscope. The geometric pattern visible was shown to be produced as a result of the changes in the angle of incidence, between the beam and the specimen surface normal, which occur when the sample is examined at low magnification (Booker, Shaw, Whelan and Hirsch 1967).A conventional electron diffraction pattern consists of an angularly resolved intensity distribution in space which may be directly viewed on a fluorescent screen or recorded on a photographic plate. An ECP, on the other hand, is produced as the result of changes in the signal collected by a suitable electron detector as the incidence angle is varied. If an integrating detector is used, or if the beam traverses the surface at a fixed angle, then no channeling contrast will be observed. The ECP is thus a time resolved electron diffraction effect. It can therefore be related to spatially resolved diffraction phenomena by an application of the concepts of reciprocity (Cowley 1969).


Author(s):  
Steven M. Le Vine ◽  
David L. Wetzel

In situ FT-IR microspectroscopy has allowed spatially resolved interrogation of different parts of brain tissue. In previous work the spectrrscopic features of normal barin tissue were characterized. The white matter, gray matter and basal ganglia were mapped from appropriate peak area measurements from spectra obtained in a grid pattern. Bands prevalent in white matter were mostly associated with the lipid. These included 2927 and 1469 cm-1 due to CH2 as well as carbonyl at 1740 cm-1. Also 1235 and 1085 cm-1 due to phospholipid and galactocerebroside, respectively (Figs 1and2). Localized chemical changes in the white matter as a result of white matter diseases have been studied. This involved the documentation of localized chemical evidence of demyelination in shiverer mice in which the spectra of white matter lacked the marked contrast between it and gray matter exhibited in the white matter of normal mice (Fig. 3).The twitcher mouse, a model of Krabbe’s desease, was also studied. The purpose in this case was to look for a localized build-up of psychosine in the white matter caused by deficiencies in the enzyme responsible for its breakdown under normal conditions.


Author(s):  
David L. Wetzel ◽  
John A. Reffner ◽  
Gwyn P. Williams

Synchrotron radiation is 100 to 1000 times brighter than a thermal source such as a globar. It is not accompanied with thermal noise and it is highly directional and nondivergent. For these reasons, it is well suited for ultra-spatially resolved FT-IR microspectroscopy. In efforts to attain good spatial resolution in FT-IR microspectroscopy with a thermal source, a considerable fraction of the infrared beam focused onto the specimen is lost when projected remote apertures are used to achieve a small spot size. This is the case because of divergence in the beam from that source. Also the brightness is limited and it is necessary to compromise on the signal-to-noise or to expect a long acquisition time from coadding many scans. A synchrotron powered FT-IR Microspectrometer does not suffer from this effect. Since most of the unaperatured beam’s energy makes it through even a 12 × 12 μm aperture, that is a starting place for aperture dimension reduction.


Author(s):  
A. M. Bradshaw

X-ray photoelectron spectroscopy (XPS or ESCA) was not developed by Siegbahn and co-workers as a surface analytical technique, but rather as a general probe of electronic structure and chemical reactivity. The method is based on the phenomenon of photoionisation: The absorption of monochromatic radiation in the target material (free atoms, molecules, solids or liquids) causes electrons to be injected into the vacuum continuum. Pseudo-monochromatic laboratory light sources (e.g. AlKα) have mostly been used hitherto for this excitation; in recent years synchrotron radiation has become increasingly important. A kinetic energy analysis of the so-called photoelectrons gives rise to a spectrum which consists of a series of lines corresponding to each discrete core and valence level of the system. The measured binding energy, EB, given by EB = hv−EK, where EK is the kineticenergy relative to the vacuum level, may be equated with the orbital energy derived from a Hartree-Fock SCF calculation of the system under consideration (Koopmans theorem).


Author(s):  
G. Remond ◽  
R.H. Packwood ◽  
C. Gilles ◽  
S. Chryssoulis

Merits and limitations of layered and ion implanted specimens as possible reference materials to calibrate spatially resolved analytical techniques are discussed and illustrated for the case of gold analysis in minerals by means of x-ray spectrometry with the EPMA. To overcome the random heterogeneities of minerals, thin film deposition and ion implantation may offer an original approach to the manufacture of controlled concentration/ distribution reference materials for quantification of trace elements with the same matrix as the unknown.In order to evaluate the accuracy of data obtained by EPMA we have compared measured and calculated x-ray intensities for homogeneous and heterogeneous specimens. Au Lα and Au Mα x-ray intensities were recorded at various electron beam energies, and hence at various sampling depths, for gold coated and gold implanted specimens. X-ray intensity calculations are based on the use of analytical expressions for both the depth ionization Φ (ρz) and the depth concentration C (ρz) distributions respectively.


Author(s):  
S.J. Splinter ◽  
J. Bruley ◽  
P.E. Batson ◽  
D.A. Smith ◽  
R. Rosenberg

It has long been known that the addition of Cu to Al interconnects improves the resistance to electromigration failure. It is generally accepted that this improvement is the result of Cu segregation to Al grain boundaries. The exact mechanism by which segregated Cu increases service lifetime is not understood, although it has been suggested that the formation of thin layers of θ-CuA12 (or some metastable substoichiometric precursor, θ’ or θ”) at the boundaries may be necessary. This paper reports measurements of the local electronic structure of Cu atoms segregated to Al grain boundaries using spatially resolved EELS in a UHV STEM. It is shown that segregated Cu exists in a chemical environment similar to that of Cu atoms in bulk θ-phase precipitates.Films of 100 nm thickness and nominal composition Al-2.5wt%Cu were deposited by sputtering from alloy targets onto NaCl substrates. The samples were solution heat treated at 748K for 30 min and aged at 523K for 4 h to promote equilibrium grain boundary segregation. EELS measurements were made using a Gatan 666 PEELS spectrometer interfaced to a VG HB501 STEM operating at 100 keV. The probe size was estimated to be 1 nm FWHM. Grain boundaries with the narrowest projected width were chosen for analysis. EDX measurements of Cu segregation were made using a VG HB603 STEM.


Author(s):  
I. H. Musselman ◽  
R.-T. Chen ◽  
P. E. Russell

Scanning tunneling microscopy (STM) has been used to characterize the surface roughness of nonlinear optical (NLO) polymers. A review of STM of polymer surfaces is included in this volume. The NLO polymers are instrumental in the development of electrooptical waveguide devices, the most fundamental of which is the modulator. The most common modulator design is the Mach Zehnder interferometer, in which the input light is split into two legs and then recombined into a common output within the two dimensional waveguide. A π phase retardation, resulting in total light extinction at the output of the interferometer, can be achieved by changing the refractive index of one leg with respect to the other using the electrooptic effect. For best device performance, it is essential that the NLO polymer exhibit minimal surface roughness in order to reduce light scattering. Scanning tunneling microscopy, with its high lateral and vertical resolution, is capable of quantifying the NLO polymer surface roughness induced by processing. Results are presented below in which STM was used to measure the surface roughness of films produced by spin-coating NLO-active polymers onto silicon substrates.


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