Buffer-Related Degradation Aspects of Single and Double-Heterostructure Quantum Well InAlN/GaN High-Electron-Mobility Transistors
2012 ◽
Vol 51
(5R)
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pp. 054102
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2011 ◽
Vol 403-408
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pp. 52-58
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2012 ◽
Vol 51
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pp. 054102
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2021 ◽
Vol 135
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pp. 106109
1995 ◽
Vol 13
(2)
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pp. 273
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2007 ◽
Vol 36
(2)
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pp. 99-104
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2021 ◽
Vol 30
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pp. 441-445
2002 ◽
Vol 46
(1)
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pp. 69-73
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