LPE Growth and Luminescence of InGaAsP Lattice-Matched to (1, 0, 0) GaAs Substrates

1980 ◽  
Vol 19 (S3) ◽  
pp. 321 ◽  
Author(s):  
Seiji Mukai ◽  
Jun'ichi Shimada
1983 ◽  
Vol 31 ◽  
Author(s):  
O. Ueda ◽  
S. Isozumi ◽  
S. Komiya ◽  
T. Kusunoki ◽  
I. Umebu

ABSTRACTDefects in InGaAsP and InGaP crystals lattice-matched to (001)-oriented GaAs substrate successfully grown by liquid phase epitaxy, have been investigated by TEM and STEM/EDX. Typical defects observed by TEM are composition-modulated structures, dislocation loops, non-structural microdefects, and stacking faults.


2004 ◽  
Vol 132 (10) ◽  
pp. 707-711 ◽  
Author(s):  
L.F. Bian ◽  
D.S. Jiang ◽  
P.H. Tan ◽  
S.L. Lu ◽  
B.Q. Sun ◽  
...  

2011 ◽  
Vol 50 (12R) ◽  
pp. 125502
Author(s):  
Miki Fujita ◽  
Atsushi Kawaharazuka ◽  
Jiro Nishinaga ◽  
Klaus H. Ploog ◽  
Yoshiji Horikoshi

1995 ◽  
Vol 399 ◽  
Author(s):  
P. Fons ◽  
S. Niki ◽  
A. Yamada ◽  
A. Okada ◽  
D.J. Tweet

ABSTRACTA series of CuInSe2 thin films of varying thicknesses were grown on both GaAs(001) substrates and nominally lattice-matched In0.29Ga0.71As (001) linearly graded buffers by MBE at 450°C. Transmission electron microscopy and high resolution x-ray diffraction measurements revealed the presence of a second phase with chalcopyrite symmetry strained to the CuInSe2 thin film in-plane lattice constant for CuInSe2 films grown on GaAs substrates. Further examination confirmed that the second phase possessed chalcopyrite symmetry. No second phase was observed in films grown on nearly lattice-matched In0.29Ga0.71As (001) linearly graded buffers. Secondary ion mass spectrometry confirmed the presence of interdiffusion from of Ga from the substrate into the CuInSe2layer. It is speculated that this diffusion is related to the state of stress due to heteroepitaxial misfit.


1997 ◽  
Vol 32 (1) ◽  
pp. 69-82 ◽  
Author(s):  
V. Gottschalch ◽  
R. Franzheld ◽  
I. Pietzonka ◽  
R. Schwabe ◽  
G. Benndorf ◽  
...  

Author(s):  
Y. Hsu ◽  
T. S. Kuan ◽  
W. I. Wang

Semiconductor superlattices or epitaxial overlayers have so far been grown mostly on (100)-oriented substrates. It has long been suspected that growth on surfaces such as (m11) could produce equally good or better epitaxial layers. In this work, we have systematically tested the growth of multi- or single-layered structures, including the GaAs/AlAs, AlAs/Ge, and GaAs/Si systems, on surfaces of different orientations. The crystallinity and defect mechanisms in the layers grown on (100), (311), and (511) surfaces at different temperatures were compared. In most cases we found that (311) surfaces can produce epitaxial layers as good as on (100) surfaces.Perfect lattice-matched GaAs/AIAs superlattices were grown on (311)A-, (311)B-, and (100)-oriented GaAs substrates. Superlattices with good layer morphology were achieved on all three surfaces at 600°C. Fig. 1(a) shows an image of a typical GaAs/AIAs superlattice grown on a (311)B surface. This superlattice exhibits sharp interface abruptness as indicated by the high-order satellites observed in the diffraction pattern in Fig. 1(b).


1997 ◽  
Vol 70 (26) ◽  
pp. 3564-3566 ◽  
Author(s):  
V. Bousquet ◽  
E. Tournié ◽  
M. Laügt ◽  
P. Vennéguès ◽  
J. P. Faurie

1988 ◽  
Vol 86 (1-4) ◽  
pp. 311-317 ◽  
Author(s):  
Nobuo Matsumura ◽  
Mitsutaka Tsubokura ◽  
Junji Saraie ◽  
Yutaka Yodogawa

1989 ◽  
Vol 28 (Part 2, No. 12) ◽  
pp. L2137-L2140 ◽  
Author(s):  
Hideyuki Oniyama ◽  
Shigeki Yamaga ◽  
Akihiko Yoshikawa

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