Effect of nano-grain on the memory characteristics of high-κ HfAlO charge trapping layers for nano-scale non-volatile memory device applications
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2007 ◽
Vol 22
(8)
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pp. 884-889
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2011 ◽
Vol 32
(6)
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pp. 528-533
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Vol 117
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pp. 555-557
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2020 ◽
Vol 9
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pp. 075004