Electrical properties of Al2O3/La2O3/Al2O3 films using various tunnel oxide thicknesses for non-volatile memory device applications
2009 ◽
Vol 117
(1365)
◽
pp. 555-557
◽
Keyword(s):
2011 ◽
Vol 32
(6)
◽
pp. 528-533
◽
Keyword(s):
Keyword(s):
2007 ◽
Keyword(s):
2007 ◽
Vol 22
(8)
◽
pp. 884-889
◽
Keyword(s):
Keyword(s):
2015 ◽
Vol 146
◽
pp. 48-52
◽
Keyword(s):