Charge Trapping Barrier and the Effect of Surface Treatment in Pentacene Thin Film Transistors

2008 ◽  
Author(s):  
T. Miyadera ◽  
S. D. Wang ◽  
T. Minari ◽  
K. Tsukagoshi
Keyword(s):  
Thin Film ◽  
Surface Treatment ◽  
Thin Film Transistors ◽  
Charge Trapping ◽  
Effect Of Surface

Effect of Surface Treatment of Gate-Insulator on Uniformity of Bottom-Gate ZnO Thin Film Transistors

2010 ◽  
Vol 13 (4) ◽  
pp. H101 ◽  
Author(s):  
Mamoru Furuta ◽  
Takashi Nakanishi ◽  
Mutsumi Kimura ◽  
Takahiro Hiramatsu ◽  
Tokiyoshi Matsuda ◽  
...  
Keyword(s):  
Thin Film ◽  
Surface Treatment ◽  
Thin Film Transistors ◽  
Gate Insulator ◽  
Zno Thin Film ◽  
Bottom Gate ◽  
Effect Of Surface

scholarly journals Dielectric Surface Treatment Effects on Organic Thin-film Transistors

2005 ◽  
Vol 15 (3) ◽  
pp. 202-208
Author(s):  
Sang Chul Lim ◽  
Seong Hyun Kim ◽  
Jung Hun Lee ◽  
Chan Hoe Ku ◽  
Dojin Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Surface Treatment ◽  
Thin Film Transistors ◽  
Treatment Effects ◽  
Dielectric Surface ◽  
Organic Thin Film Transistors ◽  
Organic Thin Film

Charge Trapping in Intergrain Regions of Pentacene Thin Film Transistors

2008 ◽  
Vol 18 (24) ◽  
pp. 3907-3913 ◽  
Author(s):  
Marta Tello ◽  
Marco Chiesa ◽  
Claudia M. Duffy ◽  
Henning Sirringhaus
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Charge Trapping

Memory Effect of Low-Temperature Processed ZnO Thin-Film Transistors Having Metallic Nanoparticles as Charge Trapping Elements

2012 ◽  
Vol 12 (2) ◽  
pp. 1344-1347
Author(s):  
Young-Su Park ◽  
Soo-Jin Kim ◽  
Si-Hoon Lyu ◽  
Byoung Hoon Lee ◽  
Myung Mo Sung ◽  
...  
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Memory Effect ◽  
Thin Film Transistors ◽  
Metallic Nanoparticles ◽  
Charge Trapping ◽  
Zno Thin Film

Charge trapping effects in amorphous silicon/silicon nitride thin film transistors

1987 ◽  
Vol 97-98 ◽  
pp. 903-906 ◽  
Author(s):  
A.R. Hepburn ◽  
C. Main ◽  
J.M. Marshall ◽  
C. van Berkel ◽  
M.J. Powell
Keyword(s):  
Thin Film ◽  
Silicon Nitride ◽  
Amorphous Silicon ◽  
Thin Film Transistors ◽  
Charge Trapping ◽  
Silicon Silicon ◽  
Trapping Effects

Efficient suppression of charge trapping in ZnO-based transparent thin film transistors with novel Al2O3∕HfO2∕Al2O3 structure

2008 ◽  
Vol 92 (19) ◽  
pp. 192104 ◽  
Author(s):  
Seongpil Chang ◽  
Yong-Won Song ◽  
Sanggyu Lee ◽  
Sang Yeol Lee ◽  
Byeong-Kwon Ju
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Charge Trapping ◽  
Efficient Suppression
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