Ellipsometric study of the electronic behaviors of titanium-vanadium dioxide (TixV1−xO2) films for 0 ≤ x ≤ 1 during semiconductive-to-metallic phase transition
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2007 ◽
Vol 46
(No. 5)
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pp. L113-L116
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2008 ◽
Vol 8
(3)
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pp. 1417-1421
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2014 ◽
Vol 118
(29)
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pp. 16279-16283
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2007 ◽
Vol 49
(12)
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pp. 2318-2322
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2015 ◽
Vol 3
(26)
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pp. 6771-6777
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