frequency stabilized laser
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2022 ◽  
Vol 20 (3) ◽  
pp. 451-457
Author(s):  
Nicolas Manrique Nieto ◽  
Carlos Francisco Rodriguez ◽  
Mayerlin Nunez Portela

2022 ◽  
Vol 145 ◽  
pp. 107498
Author(s):  
Xinqian Guo ◽  
Linbo Zhang ◽  
Jun Liu ◽  
Long Chen ◽  
Le Fan ◽  
...  

2021 ◽  
pp. 327-332
Author(s):  
F. Pankov 1 ◽  
D. Norden ◽  
N. Pankov ◽  
P. Pigulevskiy ◽  
A. Feshchenko ◽  
...  

Historically, the first laser-deformograph was developed by group of Geophysical Observatory of the Tavria National University named after I. Vernadsky (formerly Simferopol State University named after M.V. Frunze) and started to work in 1981. This laser complex allowed to carry out the measurements of the Earth’s long time deformation. The measuring volume of the observatory was located in an adit (depth of about 20 meters), which connects the right rangefinder post with the main battery structure and has a series of sealed baffles (doors, hatches) that isolate it from external influences. In the capacity of the main tools for studying oscillatory processes in the environment, the Geophysical Observatory used two-beam laser interferometers of the Michelson type with spaced beams, which have very high metrological characteristics and use the wavelength of a frequency-stabilized laser as a reference. Engineering support of the interferometric complexes’ functioning in the Geophysical Observatory was carried out by: F.N. Pankov, A.V. Buklersky, V.I. Tokarev [5].


2021 ◽  
Vol 127 (9) ◽  
Author(s):  
Jianyong Ding ◽  
Guangli Yu ◽  
Dunxi You ◽  
Yong Qian ◽  
Chunqi Fang ◽  
...  

2021 ◽  
pp. 2140011
Author(s):  
Shi Li ◽  
Wei Li ◽  
Sitian Gao ◽  
Xiaodong Hu

In this study, a tracing method for a scanning electron microscope was developed based on a heterodyne interferometer, which can directly trace the measured values to the laser wavelength and then to the internationally defined meter length reference. In this method, a sample scanning motion is introduced, and the measuring mirror of the interferometer is fixed on the sample stage. The movement and displacement of the sample stage is recorded by the laser interferometer displacement measurement system, which synchronously collects the secondary electrons or backscattered electron signals excited on the sample surface. The feature size of the sample is measured, and the value can be traced directly to the international unit of length using the frequency-stabilized laser reference, which proves that the proposed method is an absolute measurement method. This study analyzed the specific technology implementation methods and experimental results, including positioning control of the displacement system and its measurement and control during the measurement process. Measurement uncertainty budgets are also discussed. Experimental measurements were carried out and their accuracy was verified. Results showed that this method could effectively obtain the performance parameters of the feature size intuitively and significantly improve the measurement accuracy.


2021 ◽  
Vol 136 ◽  
pp. 106777
Author(s):  
Jun Liu ◽  
Tao Liu ◽  
Long Chen ◽  
Linbo Zhang ◽  
Guanjun Xu ◽  
...  

2020 ◽  
Vol 91 (1) ◽  
pp. 013001 ◽  
Author(s):  
Fenglei Zhang ◽  
Kui Liu ◽  
Zongyang Li ◽  
Feihu Cheng ◽  
Xiaohua Feng ◽  
...  

Author(s):  
J. Barbarat ◽  
J. Gillot ◽  
H. Alvarez-Martinez ◽  
M. Lours ◽  
D. Holleville ◽  
...  

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