Body Bias Dependence of Bias Temperature Instability (BTI) in Bulk FinFET Technology
Jiayang Zhang
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Zirui Wang
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Runsheng Wang
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Zixuan Sun
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Ru Huang
Ryo Kishida
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Kazutoshi Kobayashi
2014 ◽
Vol 91
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pp. 127-129
Hyojune Kim
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Yonghan Roh
Ryo Kishida
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Ikuo Suda
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Kazutoshi Kobayashi
R. Kishida
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K. Kobayashi
2019 ◽
Vol 11
(4)
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pp. 04018-1-04018-6
M. Mallati
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H. Bentarzi
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Tibor Grasser
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Ben Kaczer
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Thomas Aichinger
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Wolfgang Goes
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Michael Nelhiebel
Chenyue Ma
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Bo Li
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Frank He
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Xing Zhang
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Xinnan Lin
J.T. Ryan
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P.M. Lenahan
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A.T. Krishnan
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S. Krishnan
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J.P. Campbell
C.H. Liu
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M.T. Lee
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Chih-Yung Lin
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J. Chen
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K. Schruefer
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...