Optimization of the polymer melt thickness distribution on a cable of large diameter

1991 ◽  
Vol 31 (16) ◽  
pp. 1165-1171 ◽  
Author(s):  
D. M. Hanssen
Keyword(s):  
Thickness Distribution ◽  
Large Diameter ◽  
Polymer Melt

scholarly journals Towards Scalable Large-Area Pulsed Laser Deposition

Materials ◽  
2021 ◽  
Vol 14 (17) ◽  
pp. 4854
Author(s):  
Zakhar Vakulov ◽  
Daniil Khakhulin ◽  
Evgeny Zamburg ◽  
Alexander Mikhaylichenko ◽  
Vladimir A. Smirnov ◽  
...  
Keyword(s):  
Film Thickness ◽  
Pulsed Laser Deposition ◽  
Thickness Distribution ◽  
Large Diameter ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Uniform Thickness ◽  
Technological Parameters ◽  
Distribution Profile ◽  
Thickness Uniformity

One of the significant limitations of the pulsed laser deposition method in the mass-production-technologies of micro- and nanoelectronic and molecular device electronic fabrication is the issue of ensuring deposition of films with uniform thickness on substrates with large diameter (more than 100 mm) since the area of the laser spot (1–5 mm2) on the surface of the ablated target is incommensurably smaller than the substrate area. This paper reports the methodology that allows to calculate the distribution profile of the film thickness over the surface substrate with a large diameter, taking into account the construction and technological parameters of the pulsed laser deposition equipment. Experimental verification of the proposed methodology showed that the discrepancy with the experiment does not exceed 8%. The modeling of various technological parameters influence on the thickness uniformity has been carried out. Based on the modeling results, recommendations and parameters are proposed for manufacturing uniform thickness films. The results allow for increasing the film thickness uniformity with the thickness distribution < 5% accounts for ~ 31% of 300 mm diameter substrate.

The Optimization of an Integrated Strut OGV Configuration

2014 ◽  
Author(s):  
Yadong Xie ◽  
Xiaohe Yang ◽  
Jianguo Ding ◽  
Xiaofeng Liu ◽  
Jinzhang Feng
Keyword(s):  
Guide Vane ◽  
Thickness Distribution ◽  
Large Diameter ◽  
Axial Direction ◽  
Maximum Diameter ◽  
Axial Distance ◽  
Recovery Coefficient ◽  
Maximum Thickness ◽  
Circumferential Distribution

In a core-mounted high-bypass ratio aero engine the bypass strut is designed to support the intermediate casing and to go the RDF (radial drive shaft) of a large diameter. Therefore the maximum thickness of the strut and maximum thickness distribution along the chord are restricted by the maximum diameter of the RDF. In order to enhance the total pressure recovery coefficient as well as reducing the backpressure circumferential variation, in this paper we describe the optimization of a datum configuration of the circumferential integrated strut OGV (Outlet Guide Vane). The datum configuration was designed based on an original configuration in which OGV and struts are separated axially. In the datum configuration, OGV is moved down-stream to be combined with the struts. The combined strut not only supports the casing as discussed above but also plays the role of turning the flow from the upstream fan to the axial direction. At the same time, the maximum thickness of the strut is about 8 times thicker than that of the OGV. The datum configuration will reduce noise because of larger axial distance between fan and OGVs as well as reducing weight because of fewer struts used in datum configuration. A re-staggering of OGV with sweep and dihedral both at the tip and hub will be used to optimize this datum configuration. Both datum configuration and optimized configuration will be compared with respected to the pressure loss included in the OGV and struts and the backpressure circumferential distribution variation.

Photographic Equidensitometry of High Voltage Electron Images of Thick Noncrystalline Materials

1972 ◽  
Vol 30 ◽  
pp. 594-595
Author(s):  
Keinosuke Kobayashi
Keyword(s):  
High Voltage ◽  
Linear Response ◽  
Thickness Distribution ◽  
Contour Map ◽  
Mass Thickness ◽  
Voltage Electron ◽  
High Voltage Electron ◽  
Homogeneous Particle ◽  
Photographic Emulsions ◽  
Logarithmic Relation

Equidensitometry as developed by E. Lau and W. Krug has been little used in the analysis of ordinary electron photomicrographs, yet its application to the high voltage electron images proves merits of this procedure. Proper sets (families) of equidensities as shown in the next page are able to reveal the contour map of mass thickness distribution in thick noncrystalline specimens. The change in density of the electron micrograph is directly related to the mass thickness of corresponding area in the specimen, because of the linear response of photographic emulsions to electrons and the logarithmic relation between electron opacity and mass thickness of amorphous object.This linearity is verified by equidensitometry of a spherical solid object as shown in Fig. 1a. The object is a large (1 μ) homogeneous particle of polystyrene. Fig. 1b is a composite print of three equidensities of the 1st order prepared from Fig. 1a.

Polymer Morphology Revealed by Staining Techniques

1981 ◽  
Vol 39 ◽  
pp. 340-341
Author(s):  
A. C. Reimschuessel ◽  
V. Kramer
Keyword(s):  
Polymer Melt ◽  
Nylon 6 ◽  
Morphological Features ◽  
Negative Staining ◽  
Polymer Morphology ◽  
Crystallizable Polymer ◽  
Staining Techniques ◽  
Long Chain

Staining techniques can be used for either the identification of different polymers or for the differentiation of specific morphological domains within a given polymer. To reveal morphological features in nylon 6, we choose a technique based upon diffusion of the staining agent into accessible regions of the polymer.When a crystallizable polymer - such as nylon 6 - is cooled from the melt, lamellae form by chainfolding of the crystallizing long chain macromolecules. The regions between adjacent lamellae represent the less ordered amorphous domains into which stain can diffuse. In this process the lamellae will be “outlined” by the dense stain, giving rise to contrast comparable to that obtained by “negative” staining techniques.If the cooling of the polymer melt proceeds relatively slowly - as in molding operations - the lamellae are usually arranged in a radial manner. This morphology is referred to as spherulitic.

Development of a digital SEM

1991 ◽  
Vol 49 ◽  
pp. 358-359
Author(s):  
A. Yamada ◽  
A. Shibano ◽  
K. Harasawa ◽  
T. Kobayashi ◽  
H. Fukuda ◽  
...  
Keyword(s):  
Large Diameter ◽  
Objective Lens ◽  
Large Specimen ◽  
Backscattered Electrons ◽  
Digital Scanning ◽  
Junction Type ◽  
High Resolution Images ◽  
Working Distance ◽  
Type Detector ◽  
Short Working

A newly developed digital scanning electron microscope, the JSM-6300, has the following features: Equipped with a narrower conical objective lens (OL), it allows high resolution images to be obtained easily at a short working distance (WD) and a large specimen tilt angle. In addition, it is provided with automatic functions and digital image processing functions for ease of operation.Conical C-F lens: The newly developed conical C-F objective lens, having low aberration characteristics over a wide WD range, allows a large-diameter (3-inch) specimen to be tilted up to 60° at short WD, and provides images with low magnifications starting at 10*. On the bottom of the lens, a p n junction type detector is provided to detect backscattered electrons (BE) from the specimen. As the narrower conical 0L increases the secondary electron (SE) detector's field intensity on the specimen surface, high SE image quality is obtained.

CALCULATION OF STAGES OF THE TECHNOLOGICAL PROCESS OF MANUFACTURE OF PPD DETECTORS USING COMPUTER MATHEMATICAL MODELING AND PRODUCTION OF ALPHA RADIOMETER ON THEIR BASIS

2020 ◽  
Vol 7 (2) ◽  
pp. 21-28
Author(s):  
SALI RADZHAPOV ◽  
◽  
RUSTAM RAKHIMOV ◽  
BEGJAN RADZHAPOV ◽  
MARS ZUFAROV
Keyword(s):  
Mathematical Modeling ◽  
Technological Process ◽  
Block Diagram ◽  
Large Diameter ◽  
Silicon Detector ◽  
Digital Processing ◽  
Main Element ◽  
Alpha Radiation ◽  
Initial Silicon ◽  
Natural Isotopes

The article describes the developed radiometer for Express measurement of alpha radiation of radioactive elements based on a large-diameter silicon detector. The main element of the PPD detector is made using computer mathematical modeling of all stages of the technological process of manufacturing detectors, taking into account at each stage the degree of influence of the properties of the initial silicon on the electrophysical and radiometric characteristics of the detector. Detectors are manufactured for certain types of devices. The developed radiometer is designed to measure alpha radiation of natural isotopes (238U, 234U, 232Th, 226Ra, 222Rn, 218Po, 214Bi, etc.) in various environments. It also shows the principle of operation of the device, provides a block diagram of the measuring complex, describes the electronic components of the radiometer, as well as the block diagram. Signal transformations (spectrum transfer, filtering, accumulation) are implemented programmatically on the basis of a digital processing module. The device can detect the presence of specific elements in various environments, as well as protect people from the harmful effects of adverse radiation and can be used both in the field and stationary.

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