Electrical resistance variation of carbon-nanotube networks due to surface modification of glass substrate

2010 ◽  
Vol 207 (8) ◽  
pp. 1912-1917
Author(s):  
Eui Yun Jang ◽  
Dong Kyun Seo ◽  
Seoho Jung ◽  
Taewoo Kim ◽  
Tae June Kang ◽  
...  
2009 ◽  
Vol 42 (Supplement.) ◽  
pp. s238-s241 ◽  
Author(s):  
Amornwong Srisurichan ◽  
Adi Ilcham ◽  
Apinan Soottitantawat ◽  
Yongyuth Wanna ◽  
Noriaki Sano ◽  
...  

2015 ◽  
Vol 56 (9) ◽  
pp. 1362-1364 ◽  
Author(s):  
Jiyoun Choi ◽  
Jeongyong Choi ◽  
Sungyoul Choi ◽  
Jongphil Kim ◽  
Sunglae Cho

2013 ◽  
Vol 690-693 ◽  
pp. 499-502
Author(s):  
Jia Wang ◽  
Bao Jia Wu

An effective and convenient method about molybdenum metal thin film microcircuit was developed on diamond anvil cell(DAC) under high pressure. Alumina film was used as the protective layer and sputtered on DAC. By using this method, we studied the electrical resistance variation about nanoparticles ZnS power up to 36GPa. The reversible phase transition had been reflected clearly by the electrical resistance measurements with sample.


2007 ◽  
Vol 26-28 ◽  
pp. 569-572 ◽  
Author(s):  
Yi Zhang ◽  
Ping Liu ◽  
Bao Hong Tian ◽  
D.M. Zhao ◽  
Shu Guo Jia ◽  
...  

The effect of aging temperature and aging time on properties of Cu-3.2Ni-0.75Si-0.3Zn alloy were studied. The alloys were isochronally or isothermally aged after solution treatment. The cold rolling prior to the aging treatment was used to increase the precipitation rate .The microstructure of the alloy was studied by means of transmission electron microscope (TEM). The results show that the fine and dispersed precipitates are fully coherent with the Cu matrix and make the alloy possesses higher hardness and conductivity after the alloy was solution at 1173K and then aged at different time. The precipitates responsible for the age-hardening effect was Ni2Si.The transformation kinetics were studied by analyzing the electrical resistance variation of the solution Cu-3.2Ni-0.75Si-0.3Zn alloy in the process of aging.


Small ◽  
2008 ◽  
Vol 4 (12) ◽  
pp. 2255-2261 ◽  
Author(s):  
Eui Yun Jang ◽  
Tae June Kang ◽  
Hyeoung Wook Im ◽  
Dae Weon Kim ◽  
Yong Hyup Kim

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