Characterization of Pillared Montmorillonites with the Atomic Force Microscope (AFM)

1993 ◽  
Vol 142 (2) ◽  
pp. 337-348 ◽  
Author(s):  
M.L. Occelli ◽  
B. Drake ◽  
S.A.C. Gould
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Force ◽  
Pillared Montmorillonites

Characterization of photosystem II with the atomic-force microscope

1992 ◽  
Vol 50 (2) ◽  
pp. 1146-1147
Author(s):  
Kathleen M. Marr ◽  
Mary K. Lyon
Keyword(s):  
Photosystem Ii ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Biologically Active ◽  
Atomic Force ◽  
Freeze Etching ◽  
Image Averaging ◽  
Oxygen Evolving ◽  
Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

Anin situatomic force microscope for normal-incidence nanofocus X-ray experiments

2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
High Speed ◽  
Normal Incidence ◽  
Organic Thin Film ◽  
X Ray ◽  
Atomic Force ◽  
Synchrotron Beamlines

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.

Atomic force microscope characterization of self-assembly behaviors of cyclo[8] pyrrole on solid substrates

2017 ◽  
Vol 674 ◽  
pp. 151-156 ◽  
Author(s):  
Hai Xu ◽  
Siqi Zhao ◽  
Xiang Xiong ◽  
Jinzhi Jiang ◽  
Wei Xu ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Self Assembly ◽  
Atomic Force ◽  
Solid Substrates

scholarly journals Characterization of atomic force microscope probes at low temperatures

2003 ◽  
Vol 94 (6) ◽  
pp. 4210-4214 ◽  
Author(s):  
Alexandra Radenovic ◽  
Eva Bystrenova ◽  
Laurent Libioulle ◽  
Francesco Valle ◽  
George T. Shubeita ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Low Temperatures ◽  
Atomic Force
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