The Photosynthetic System in Tropical Plants Under High Irradiance and Temperature Stress

Author(s):  
G. Heinrich Krause ◽  
Klaus Winter
2007 ◽  
Vol 64 (6) ◽  
pp. 595-600 ◽  
Author(s):  
Daniela Pereira Dias ◽  
Ricardo Antonio Marenco

High irradiance may reduce the productivity of tropical plants by exacerbating photoinhibition of photosynthesis, particularly in the case of shade-adapted plants. The aim of this study was to determine the effect of cloud cover on the fluorescence characteristics and photoinhibition on saplings of manwood (Minquartia guianensis Aubl.). Three-year-old saplings were exposed to full irradiance either on clear days (10, 45 and 90 min) or under overcast conditions (120, 180, and 420 min). Changes in the population of functional photosystem II (PSII), the initial (Fo) and maximum fluorescences (Fm), and the Fv/Fm ratio (maximum potential quantum yield of PSII) were monitored after plant exposure to full irradiance and during recovery (within 48 h) at low light intensity. Although photoinhibition of PSII (Fv/Fm) was determined by the number of photons reaching the leaf surface (photon fluence), cloudiness tended to reduce the photoinhibitory effect of irradiance. Fo increased with fluence on cloudy days and was unaffected by irradiance on clear days, except for a sharp rise during the first 10 min of exposure to full sunlight. For a given photon fluence, Fm was lower on clear days. Recovery from photoinhibition was similar in both light environments. Although photon fluence is the preponderant factor determining the extent of photoinhibition, cloudiness might alleviate the photoinhibitory effect of irradiance.


Planta Medica ◽  
2011 ◽  
Vol 77 (12) ◽  
Author(s):  
M Litaudon ◽  
E Le Borgne ◽  
P Teres ◽  
B Deguin ◽  
M Lecsö Bornet ◽  
...  

2020 ◽  
Vol 53 (2) ◽  
Author(s):  
Khalil Ahmed Laghari ◽  
Abdul Jabbar Pirzada ◽  
Mahboob Ali Sial ◽  
Muhammad Athar Khan ◽  
Jamal Uddin Mangi

2020 ◽  
Vol 52 (5) ◽  
Author(s):  
De-Gong Wu ◽  
Qiu-Wen Zhan ◽  
Hai-Bing Yu ◽  
Bao-Hong Huang ◽  
Xin-Xin Cheng ◽  
...  

2018 ◽  
Author(s):  
Jungsuk Ko ◽  
Hoonchang yang ◽  
Hyungchae Jeon ◽  
Gyuyoung Nam ◽  
Youngseok Ryu ◽  
...  

Abstract The necessity of hot temperature stress is widely recognized as the initial stress methodology to maintain the stability of products from infant defects in device [1, 2]. However, hot temperature stress has a disadvantage in terms of stress uniformity because temperature variation according to stress environment such as chamber, board, and tester accelerates different stress effects per chips. In addition, this stress condition can cause serious reliability problem in the mass production environments. Therefore, the stress temperature should be lowered to minimize the temperature deviation due to the production environments. The reduction of stress temperature cause the lack of stress amount, so optimized stress voltage and time to maintain the stress condition is required. In this study, various stress voltage and time with decreasing temperature were evaluated in consideration of lifetime that unit elements such transistors and capacitors did not degrade by any stress conditions. In addition, it was confirmed that stress uniformity can be improved in the stress condition obtained by the evaluation. Furthermore, the enhanced initial failure screen ability was proven with mass evaluations.


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