A Comparison of Hot Carrier and 50 MeV Li3+ Ion Induced Degradation in the Electrical Characteristics of Advanced 200 GHz SiGe HBT

2014 ◽  
pp. 113-116
Author(s):  
K. C. Praveen ◽  
N. Pushpa ◽  
M. N. Bharathi ◽  
John D. Cressler ◽  
A. P. Gnana Prakash
Keyword(s):  
Electrical Characteristics ◽  
Sige Hbt ◽  
Hot Carrier

Electrical characteristics and hot carrier effects in quantum well solar cells

2017 ◽  
Author(s):  
Dac-Trung Nguyen ◽  
Laurent Lombez ◽  
Francois Gibelli ◽  
Myriam Paire ◽  
Soline Boyer-Richard ◽  
...  
Keyword(s):  
Solar Cells ◽  
Quantum Well ◽  
Electrical Characteristics ◽  
Hot Carrier ◽  
Hot Carrier Effects

scholarly journals UNIFIED BIPOLAR TRANSISTOR SPICE MODEL TAKING INTO ACCOUNT THE INFLUENCE OF DIFFERENT RADIATION TYPES

2020 ◽  
Author(s):  
Konstantin Petrosyants ◽  
Maksim Kozhukhov
Keyword(s):  
Integrated Circuits ◽  
Radiation Effect ◽  
Bipolar Transistors ◽  
Bipolar Transistor ◽  
Electrical Characteristics ◽  
Spice Simulation ◽  
Sige Hbt ◽  
Spice Model ◽  
Before And After

The unified Si BT/SiGe HBT SPICE-model is presented, which allows performing SPICE simulation of integrated circuits that considering the radiation effect. The results of measurements and modeling of electrical characteristics of bipolar transistors before and after exposure to various radiation types are presented.

A hot-carrier degradation mechanism and electrical characteristics in S/sup 4/D n-MOSFET's

1997 ◽  
Vol 44 (11) ◽  
pp. 2053-2058
Author(s):  
T. Yoshitomi ◽  
M. Saito ◽  
T. Ohguro ◽  
M. Ono ◽  
H.S. Momose ◽  
...  
Keyword(s):  
Degradation Mechanism ◽  
Electrical Characteristics ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Impact of SiGe HBT hot-carrier degradation on the broadband amplifier output supply current

2019 ◽  
Author(s):  
Marine Couret ◽  
Gerhard Fischer ◽  
Iria Garcia-Lopez ◽  
Magali De Matos ◽  
Francois Marc ◽  
...  
Keyword(s):  
Sige Hbt ◽  
Hot Carrier ◽  
Amplifier Output ◽  
Broadband Amplifier ◽  
Supply Current ◽  
Hot Carrier Degradation

Voltage stress-induced hot carrier effects on SiGe HBT VCO

2005 ◽  
Vol 45 (9-11) ◽  
pp. 1402-1405
Author(s):  
Chuanzhao Yu ◽  
Enjun Xiao ◽  
J.S. Yuan
Keyword(s):  
Sige Hbt ◽  
Hot Carrier ◽  
Voltage Stress ◽  
Hot Carrier Effects
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